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Database: 365,228(8 Aug 2026)
  1. HOME
  2. Standards for Probe Contact Profiler

Probe Contact Profiler

Probe Contact Profiler, Total:53 items.

The international standard classification for "Probe Contact Profiler" includes: Measuring instruments .

The Chinese standard classification for "Probe Contact Profiler" includes: Measuring tool and instrument , Basic standards and general methods .

Professional Standard - Machinery

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 19600-2004 Gemetrical Product Specifications（GPS）- Surface texture - Profile method - Calibration of contact(stylus)instruments

TR-TSE

  • TS 2495-1977 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS BY THE PROF?LE METHOD - CONTACT (STYLUS) INSTRUMENTS OF CONSECUTIVE PROF?LE TRANSFORMATION - CONTACT PROF?LE METERS. SYSTEM M
  • TS 930-1976 INSTRUMENTS FOR THE MEASUREMENT OF SURFACE BY THE POFILE METHOD CONTACT (STYLUS) INSTRUMENTS OF PROGRESSIVE PROF?LE TRANSFORMATION PROF?LE RECORDING INSTRUMENTS

Ente Nazionale Italiano di Unificazione

  • UNI ISO 1880:1991 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments.
  • UNI EN 1071-1:2003 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of coating thickness by contact probe filometer
  • UNI EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
  • UNI EN ISO 3274:1998 Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
  • UNI ENV SPERIMENTALE 1071-1:1994 Advanced technical ceramics. Methods of test for ceramic coatings. Determination of coating thickness by contact probe profilometer.
  • UNI EN ISO 12179:2001 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments.

CZ-CSN

  • CSN ISO 3274:1994 Instruments for the measurement of surface roughness by the profile method.Contact(stylus)instruments of consecutive profile transformation.Contact profile meters,system M
  • CSN ISO 1880:1993 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments

YU-JUS

  • JUS M.A1.034-1980 Instruments for the measurement of surface roughness by tne profil method-contact (stylus) instrument* of profile transformation - Profile reoording instruments

International Organization for Standardization (ISO)

  • ISO 3274:1975 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of consecutive profile transformation; Contact profile meters, system M
  • ISO 1880:1979 Instruments for the measurement of surface roughness by the profile method; Contact (stylus) instruments of progressive profile transformation; Profile recording instruments
  • ISO 1880:1974 Title missing - Legacy paper document
  • ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments
  • ISO 18452:2005 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

RO-ASRO

  • STAS SR ISO 3274:1995 Instruments for the measurements of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M

Danish Standards Foundation

  • DS/ISO 3274:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of consecutive profile transformation. Contact profile meters, system M
  • DS/ISO 1880:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of progressive profile transformation. Profile recording instruments
  • DANSK DS/EN ISO 12179:2000 Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments
  • DANSK DS/ISO 12179:2022 Geometrical product specifications (GPS) – Surface texture: Profile method – Calibration of contact (stylus) instruments
  • DANSK DS/EN ISO 3274:1998 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments

Association of German Mechanical Engineers

  • VDI/VDE 2602-1978 Roughness measurement with electric contact (stylus) profile meters
  • VDI/VDE 2602-1983 Roughness measurement with electrical stylus devices
  • VDI VDE 2602 Blatt 2-2018 Roughness measurement using contact (stylus) instruments (Profile method) Set-up, measurement conditions, procedure

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 12179:2023 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • UNE-EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005) (Endorsed by AENOR in June of 2016.)
  • AENOR UNE-EN ISO 12179:2001 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000)

British Standards Institution (BSI)

  • BS EN ISO 12179:2022 Geometrical product specifications (GPS). Surface texture: Profile method. Calibration of contact (stylus) instruments
  • 25/30471756 DC BS EN ISO 12179 Geometrical product specifications (GPS) - Surface texture: Profile -Calibration of contact (stylus) instruments
  • BS EN ISO 3274:1998(1999) Geometric Product Specifications (GPS) — Surface texture : Profile method — Nominal characteristics of contact (stylus) instruments —
  • BS EN ISO 12179:2001 Geometrical product specifications (GPS). Surface texture. Profile method. Calibration of contact (stylus) instruments
  • BS EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer
  • BS DD ENV 1071-1:1994 Advanced technical ceramics. Methods of test for ceramic coatings-Determination of coating thickness by contact probe profilometer

Korean Agency for Technology and Standards (KATS)

  • KS B ISO 12179-2019 Geometrical Product Specifications(GPS) — Surface texture: Profile method — Calibration of contact(stylus) instruments
  • KS B ISO 12179:2004 Geometrical Product Specifications(GPS)-Surface texture:Profile method-Calibration of contact(stylus) instruments
  • KS B ISO 12179:2014 Geometrical Product Specifications(GPS) — Surface texture: Profile method — Calibration of contact(stylus) instruments

GCC Standardization Organization

  • GSO ISO 12179:2024 Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments

Bureau of Indian Standards

  • IS 15759-2023 Geometrical Product Specifications (GPS) - Surface Texture — Profile Method - Calibration of Contact (Stylus) Instruments
  • IS 15261-2002 Geometrical Product Specifications (GPS) - Surface Texture : Profile Method - Nominal Characteristics of Contact (Stylus) Instruments

German Institute for Standardization

  • DIN EN ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2000); German version EN ISO 12179:2000
  • DIN EN ISO 18452:2016-09 Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005); German version EN ISO 18452:2016
  • DIN EN ISO 12179:2023 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)

Standards Norway

  • NS-EN ISO 18452:2016 Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)
  • NS-EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • NS-EN ISO 12179:2000 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments (ISO 12179:2000)

Swedish Institute for Standards

  • SS-EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • SS-EN ISO 3274:1998 Geometrical product specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments (ISO 3274:1996)

Association Francaise de Normalisation

  • NF EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface conditions: profile method - Calibration of contact instruments (probe)

European Committee for Standardization (CEN)

  • EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
  • EN ISO 12179:2000 Geometrical Product Specifications (GPS) - Surface Texture: Profile Method - Calibration of Contact (Stylus) Instruments

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