Precursor Ions in Quadrupole Mass Spectrometry
Precursor Ions in Quadrupole Mass Spectrometry, Total:37 items.
The international standard classification for "Precursor Ions in Quadrupole Mass Spectrometry" includes: Chemical laboratories. Laboratory equipment , Other standards related to analytical chemistry , Chemical analysis of metals , Chemical reagents , Chemical analysis .
The Chinese standard classification for "Precursor Ions in Quadrupole Mass Spectrometry" includes: Electrochemical, thermochemistry and optical profile type analyzer , Material composition analysis instrument and environment detection instrument in general , Semimetal and semiconductor material analysis method , Chemical Measurement , Hygiene, safety and labor protection , Special electronic technology material .
Group Standards of the People's Republic of China
- T/NAIA 0160-2022 Determination of total sulfur dioxide in wine by triple quadrupole inductively coupled plasma mass spectrometry
- T/SDSES 006-2024 Water quality-Determination of 4 organic pesticides including atrazine by Ultra performance liquid chromatography-triple quadrupole mass spectrometry
- T/CIMA 0023-2020 Technical requirements for vehicle-mounted inductively coupled plasma quadrupole mass spectrometer
- T/GXAF 0012-2023 Determination of Artemisinin in Artemisia annua by Liquid Chromatography-Triple Quadrupole Mass Spectrometry
- T/ZJATA 0023-2024 Determination of perchlorate in water Ion chromatography-mass spectrometry/mass spectrometry
- T/CNIA 0061-2020 Determination of Impurity Content in Silicon Tetrachloride for Silicon Epitaxy by Inductively Coupled Plasma Mass Spectrometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37837-2019 General rules for quadrupole inductively coupled plasma mass spectrometry
- GB/T 37049-2018 Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35925-2018 Determination of impurity fluorine ion in water soluble chemicals—Ion chromatography method
- GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer
Professional Standard - Agriculture
- GB/T 43966-2024 General rules for high performance liquid chromatography-quadrupole inductively coupled plasma-mass spectrometry
- SN/T 5493-2023 Determination of 29 fentanyl analogs in solid and liquid samplesLiquid chromatography-quadrupole time of flight mass spectrometry
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4468-2023 Determination of 11 Pesticide Residues in Human Serum by Gas Chromatography-Triple Quadrupole Mass Spectrometry
Hubei Provincial Standard of the People's Republic of China
- DB42/T 1916-2022 Determination of Pyrethroid Pesticides in Aquatic Products by Gas Chromatography Triple Quadrupole Mass Spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 11446.7-2013 Test Method for Trace Anion in Electronic Grade Water by Ion Chromatography
- GB/T 11446.7-1997 Test method for trace chloride, nitrate, phosphate, sulfate in electronic grade water by ion-chromatography
国家能源局
- SY/T 7361-2017 Quadrupole mass spectrometry for rare gas separation and component content analysis
Professional Standard - Environmental Protection
- HJ 827-2017 Water quality - Determination of carbamates pesticides by Ultra performance liquid chromatography-triple quadrupole mass spectrometry
Professional Standard - Commodity Inspection
- SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method
Qinghai Provincial Standard of the People's Republic of China
- DB63/T 1611-2017 Determination of Impurity Content in Silicon Tetrachloride as Raw Material of Optical Fiber Preform by Inductively Coupled Plasma Mass Spectrometry
American Society for Testing and Materials (ASTM)
- ASTM E1504-92(1996) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
- ASTM E1504-92(2001) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
- ASTM E1504-06 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
- ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
- ASTM C1474-00(2011) Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
- ASTM C1474-00 Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
- ASTM C1474-00(2006)e1 Standard Test Method for Analysis of Isotopic Composition of Uranium in Nuclear-Grade Fuel Material by Quadrupole Inductively Coupled Plasma-Mass Spectrometry
British Standards Institution (BSI)
- BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
Association Francaise de Normalisation
- NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.
International Organization for Standardization (ISO)
- ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
- ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
- ISO 18114:2021 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
- ISO 18114:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
Korean Agency for Technology and Standards (KATS)
- KS D ISO 18114:2005 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of relative sensitivity factors from ion-implanted reference materials
Japanese Industrial Standards Committee (JISC)
- JIS K 0163:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
- JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
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