Directional scattering film
Directional scattering film, Total:70 items.
The international standard classification for "Directional scattering film" includes: Geology. Meteorology. Hydrology , Materials for aerospace construction , Physicochemical methods of analysis , Acoustics in building. Sound insulation. .
The Chinese standard classification for "Directional scattering film" includes: Meteorology , Basic standards for aviation and aerospace materials , Basic standards and general methods , Physics and Mechanics , Architectural physics .
Group Standards of the People's Republic of China
- T/CSTM 00922-2024 Determination of grain orientation of electrical steel strip ( sheet )for power transformer—Electron backscatter diffraction (EBSD) method
Professional Standard - Meteorology
- QX/T 698-2023 Forward scattering visibility meter
Military Standard of the People's Republic of China-General Armament Department
- GJB 6298-2008 General specification for forward scatter visibility meter
中国气象局
- QX/T 536-2020 Test method for foreword scattering visibility meter
Professional Standard - Aviation
- HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 21228.2-2023 Acoustics—Sound-scattering properties of surfaces—Part 2:Measurement of the directional diffusion coefficient in a free field
- GB/T 11297.2-1989 Test method for side direction scattering coefficient of laser rods
- GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
Professional Standard - Electron
- SJ 2432.3-1984 Single align tooth bonding sheet
- SJ 2435.3-1984 Bidirectional align bonding sheet
Professional Standard - Nuclear Industry
- EJ/T 848-1994 Gamma directional radiation instrument
- EJ/T 848-2018 Gamma directional radiation instrument
未注明发布机构
- ASTM RR-E12-2000 2020 E0810-Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry
Korean Agency for Technology and Standards (KATS)
- KS A 4508-1980(2000) TESTING METHOD OF SCATTERING-RATIO OF LOW-BACKSCATTERING MATERIALS
- KS F ISO 17497-2-2017(2022) Acoustics - Sound scattering properties of surfaces - Part 2 : Measurement of the directional diffusion coefficient in a free field
- KS F ISO 17497-2-2022 Acoustics - Sound scattering properties of surfaces - Part 2 : Measurement of the directional diffusion coefficient in a free field
- KS F ISO 17497-2:2017 Acoustics - Sound scattering properties of surfaces - Part 2 : Measurement of the directional diffusion coefficient in a free field
- KS D ISO 3543:2002 Metallic and non-metallic coatings-Measurement of thickness-Beta backscatter method
Japanese Industrial Standards Committee (JISC)
- JIS Z 4816:1975 Back scattering X-ray reducing paints
- JIS Z 4818:1984 Reducing materials for back scattering X-rays
SCC
- DANSK DS/IEC/TR 62316:2007 Guidance for the interpretation of OTDR backscattering traces
- BS PD IEC TR 62316:2003 Guidance for the interpretation of OTDR backscattering traces
- BS PD IEC/TR 62316:2007 Guidance for the interpretation of OTDR backscattering traces
- JIS R 7240:2018 Determination of thermal diffusivity for heat dissipation graphite sheet by a laser spot periodic heating radiation thermometry method
- 06/30144704 DC IEC TR 62316. Guidance for the interpretation of OTDR backscattering traces
- DANSK DS/ISO 17497-2:2012 Acoustics - Sound-scattering properties of surfaces - Part 2: Measurement of the directional diffusion coefficient in a free field
- BS PD IEC/TR 62316:2017 Guidance for the interpretation of OTDR backscattering traces for single-mode fibres
- DANSK DS/IEC TR 62316:2017 Guidance for the interpretation of OTDR backscattering traces for single-mode fibres
- 11/30229157 DC BS ISO 17497-2. Acoustics. Sound-scattering properties of surfaces. Part 2. Measurement of the directional diffusion coefficient in a free field
- DANSK DS/EN ISO 3543:2001 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
- BS EN ISO 3543:1995 Metallic and non-metallic coatings. Measurement of thickness. Beta backscatter method
Association Francaise de Normalisation
- NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
- NF A91-115:1995 Metallic and non-metallic coatings. Measurement of thickness. Beta backscatter method.
- NF EN ISO 3543:2001 Metallic and non-metallic coatings - Thickness measurement - Beta backscatter method
Danish Standards Foundation
- DS/IEC/TR 62316:2007 Guidance for the interpretation of OTDR backscattering traces
International Electrotechnical Commission (IEC)
- IEC TR 62316:2007 Guidance for the interpretation of OTDR backscattering traces
- IEC TR 62316:2017 Guidance for the interpretation of OTDR backscattering traces for single-mode fibres
GSO
- OS GSO IEC/TR 62316:2014 Guidance for the interpretation of OTDR backscattering traces
- GSO IEC/TR 62316:2014 Guidance for the interpretation of OTDR backscattering traces
- BH GSO ISO 17497-2:2016 Acoustics -- Sound-scattering properties of surfaces -- Part 2: Measurement of the directional diffusion coefficient in a free field
- GSO ISO 17497-2:2013 Acoustics -- Sound-scattering properties of surfaces -- Part 2: Measurement of the directional diffusion coefficient in a free field
- GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
- GSO ISO 3543:2013 Metallic and non-metallic coatings -- Measurement of thickness -- Beta backscatter method
American Society for Testing and Materials (ASTM)
- ASTM B567-98(2003) Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
- ASTM B567-98 Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
- ASTM B567-98(2009a) Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
- ASTM B567-98(2014) Standard Test Method for
Measurement of Coating Thickness by the Beta Backscatter Method - ASTM B567-98(2021) Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
International Organization for Standardization (ISO)
- ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- ISO 3543:1981 Metallic and non-metallic coatings; Measurement of thickness; Beta backscatter method
- ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
- ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ZA-SANS
- SANS 62316:2007 Guidance for the interpretation of OTDR backscattering traces
British Standards Institution (BSI)
- BS ISO 17497-2:2012 Acoustics. Sound-scattering properties of surfaces. Measurement of the directional diffusion coefficient in a free field
- PD IEC/TR 62316:2017 Guidance for the interpretation of OTDR backscattering traces for single-mode fibres
- BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
- BS EN ISO 3543:2001(2006) Metallic and non - metallic coatings — Measurement of thickness — Beta backscatter method
RU-GOST R
- GOST R ISO 17497-2-2014 Acoustics. Sound-scattering properties of surfaces. Part 2. Measurement of the directional diffusion coefficient in a free field
German Institute for Standardization
- DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN 50433-3:1982 Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering
- DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
- DIN EN ISO 3543:2001 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method (ISO 3543:2000); German version EN ISO 3543:2000
European Committee for Standardization (CEN)
- EN ISO 3543:1994 Metallic and Non-Metallic Coatings - Measurement of Thickness - Beta Backscatter Method (ISO 3543 : 1981)
BE-NBN
- NBN EN ISO 3543:1995 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method (ISO 3543:1981)
Society of Motion Picture and Television Engineers (SMPTE)
- SMPTE 117M-2001 Motion-Picture Film - Photographic Audio Record - Spectral Diffuse Density
ES-UNE
- UNE-EN ISO 3543:2001/AC:2007 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method (ISO 3543:2000/Cor.1:2003)
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