In the diffraction spectrum

In the diffraction spectrum, Total:74 items.

The international standard classification for "In the diffraction spectrum" includes: Particle size analysis. sieving , Optical measuring instruments .

The Chinese standard classification for "In the diffraction spectrum" includes: Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Electron optics and other physical optics instrument .

Professional Standard - Commodity Inspection

SN/T 3131-2012 Determination of asbestos in bicycle brake rubbers-Polarized light microscope and X-ray diffraction method
SN/T 3231-2012 Determination of asbestos in talcum―Polarized light microscope and X-ray diffraction method

Professional Standard - Agriculture

SN/T 5499-2023 Determination of talc content in minerals by full spectrum fittingX-ray diffraction method
784兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
GB/T 19077-2016 Particle size analysis―Laser diffraction methods
GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements

National Metrological Technical Specifications of the People's Republic of China

JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction

Professional Standard - Machinery

JB/T 8239.1-1999 Basic parameters for diffraction grating
JB/T 8239.2-1999 Specification for diffraction grating

未注明发布机构

DIN EN ISO 15902 E:2019-10 Optics and Photonics Diffractive Optics Glossary (Draft)
DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods

Professional Standard - Electricity

DL/T 1151.22-2012 Analytical Methods of Scale and Corrosion Products in Power Plants - Part 22: Standard Test Methods of X-ray Fluorescence Spectrometry and X-ray Diffraction

Group Standards of the People's Republic of China

T/YXNX 004-2021 Determination of mullite phase in aluminum-silicon refractories -Full spectrum fitting method for X-ray diffraction

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter

SCC

VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
DANSK DS/EN ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary (ISO 15902:2019)
NS-EN ISO 15902:2020 Optics and photonics — Diffractive optics — Vocabulary (ISO 15902:2019)

German Institute for Standardization

DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)

Korean Agency for Technology and Standards (KATS)

KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
KS B ISO 15902:2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods

British Standards Institution (BSI)

PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities

ES-UNE

UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)

GSO

BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
OS GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
BH GSO IEC 61976:2016 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
ISO/TS 5973:2024 Laser diffraction measurements — Good practice

Association Francaise de Normalisation

NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.

Danish Standards Foundation

DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods

European Committee for Standardization (CEN)

EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)

International Organization for Standardization (ISO)

ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
ISO 15902:2019 Optics and photonics — Diffractive optics — Vocabulary
ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
ISO 13320:2020 Particle size analysis — Laser diffraction methods
ISO 13320:2009 Particle size analysis - Laser diffraction methods
ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements

CEN - European Committee for Standardization

EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

KR-KS

KS B ISO 15902-2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary
KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods

Japanese Industrial Standards Committee (JISC)

JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS Z 8825:2013 Particle size analysis.Laser diffraction methods

American Society for Testing and Materials (ASTM)

ASTM E2872-14(2024) Standard Guide for Determining Cross-Section Averaged Characteristics of a Spray Using Laser-Diffraction Instruments in a Wind Tunnel Apparatus
ASTM E2872-14(2019) Standard Guide for Determining Cross-Section Averaged Characteristics of a Spray Using Laser-Diffraction Instruments in a Wind Tunnel Apparatus
ASTM E520-08(2015)e1 Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry

American National Standards Institute （ANSI)

ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment

AENOR

UNE-EN ISO 15902:2007 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004)

GOSTR

GOST R 58565-2019 Optics and photonics. Diffractive optics. Terms and definitions

RU-GOST R

GOST 8.197-2013 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance, spectral radiant power, spectral irradiance, spectral radiant intensity, power and radiant intensity in spectral range