electron diffraction
electron diffraction, Total:16 items.
The international standard classification for "electron diffraction" includes: Physicochemical methods of analysis .
The Chinese standard classification for "electron diffraction" includes: Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
Professional Standard - Commodity Inspection
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export-Part 1:X-ray diffraction and scan electron microscopy method
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
GSO
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
International Organization for Standardization (ISO)
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
United States Navy
- NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION
electron microscope,TEM electron diffraction,Electron Diffraction and Electron Microscopy,electron diffraction,Electron microscope analysis,electron diffraction,TEM electron diffraction,selected area electron diffraction,Electron Diffraction for Transmission Electron Microscopy,TEM and electron diffraction,TEM electron diffraction,SEM,electron diffraction electron microscope,TEM-Electron Diffraction,TEM Electron Diffraction Analysis,Electron Diffraction and Transmission Electron Microscopy,Transmission Electron Microscopy and Electron Diffraction,electron diffraction TEM,electron diffraction TEM,SEED
