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Database: 365,228(8 Aug 2026)

Chip-like Efficiency

Chip-like Efficiency, Total:100 items.

The international standard classification for "Chip-like Efficiency" includes: Integrated circuits. Microelectronics , Motion picture films. Cartridges , Laboratory medicine , Biology. Botany. Zoology .

The Chinese standard classification for "Chip-like Efficiency" includes: Semiconductor integrated circuit , Photosensitive material , Daily-use hardware , Medical apparatus and devices in general , Environmental Condition and General Test Method .


Group Standards of the People's Republic of China

  • T/QGCML 2041-2023 878 nm high power semiconductor laser chip
  • T/ZJDJ 010-2023 High efficiency asynchronous motor Stator and rotor cores
  • T/ZZB 1840-2020 High-performance spider included thin dynamic speaker unit
  • T/SBX 021-2019 Operation rules for automatic scribing and splitting of laser chips
  • T/CIE 071-2020 Evaluation of industrial high-reliability integrated circuits―Part 6:Bluetooth IC
  • T/CSAE 222-2021 Battery electric passenger vehicle automotive grade integrated circuit general requirements

Guangdong Provincial Standard of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 6848-1986 Dimensions of the cores for motion-picture film rolls

Professional Standard - Medicine

Professional Standard - Light Industry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 38490-2021 Determination of high-throughput adaptive evolution for microorganisms—Microfluidic chip method

未注明发布机构

  • JEDEC JESD49B.01-2023 Procurement Standard for Semiconductor Die Products Including Known Good Die (KGD)

Defense Logistics Agency

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

SCC

IPC - Association Connecting Electronics Industries

Indonesia Standards

Association Francaise de Normalisation

  • NF X44-014-5:2010 High efficiency air filters (EPA, HEPA and ULPA) - Part 5 : determining the efficiency of filter elements.

RU-GOST R

  • GOST R EN 1822-5-2014 High efficiency air filters EPA, HEPA and ULPA. Part 5. Determining the efficiency of filter elements

CENELEC - European Committee for Electrotechnical Standardization

  • ES 59008-5-1-2001 Data Requirements for Semiconductor Die Part 5-1: Particular Requirements and Recommendations for Die Types - Bare Die
  • ES 59008-5-3-2001 Data Requirements for Semiconductor Die - Part 5-3: Particular Requirements and Recommendations for Die Types - Minimally-Packaged Die

HU-MSZT

  • MSZ 14593/4-1979 Dissolving cores for road vehicles, tablet dissolving cores (dissolving tablets)

Danish Standards Foundation

  • DS/ES 59008-5-1:2001 Data requirements for semiconductor die - Part 5-1: Particular requirements and recommendations for die types - Bare die

German Institute for Standardization

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

U.S. Military Regulations and Norms

  • ARMY MIL-PRF-55365 G (3)-2010 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
  • ARMY MIL-PRF-55365 H NOTICE 1-2011 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
  • ARMY MIL-PRF-55365 H (1)-2012 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
  • ARMY MIL-PRF-55365 H NOTICE 2-2012 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR
  • ARMY MIL-PRF-55365 H-2011 CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR

IEC - International Electrotechnical Commission

  • PAS 62084-1998 Implementation of Flip Chip and Chip Scale Technology (Edition 1.0; No Replacement)

Korean Agency for Technology and Standards (KATS)

American National Standards Institute (ANSI)

TIA - Telecommunications Industry Association

  • J-STD-028-1999 Performance Standard for Construction of Flip Chip and Chip Scale Bumps (IPC/EIA J-STD-028)