Elemental analysis spectrometer

Elemental analysis spectrometer, Total:79 items.

The international standard classification for "Elemental analysis spectrometer" includes: Chemical analysis of metals , Chemical analysis , Aluminium and aluminium alloys , Other standards related to optics and optical measurements .

The Chinese standard classification for "Elemental analysis spectrometer" includes: Precious metals and its alloy analysis method , Material composition analysis instrument and environment detection instrument in general , Basic standards and general methods , Metallurgy material and auxiliary material in general , Electron optics and other physical optics instrument .

工业和信息化部/国家能源局

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer

Taiwan Provincial Standard of the People's Republic of China

CNS 14341-1999 Optical spectrum analyzer

Professional Standard - Non-ferrous Metal

YS/T 364-1994 Emission Spectral Analysis of Impurity Elements in Pure Iridium
YS/T 365-1994 Emission Spectrum Analysis of Impurity Elements in High Purity Platinum
YS/T 362-1994 Emission spectrum analysis of impurity elements in pure palladium
YS/T 363-1994 Emission spectrum analysis of impurity elements in pure rhodium
YS/T 361-2006 Determination of trace impurities in purity platinium by atomic emission spectrometric
YS/T 364-2006 Determination of trace impurities in purity iridium by atomic emission spectrometric
YS/T 362-2006 Determination of trace impurities in purity palladium by atomic emission spectrometric
YS/T 365-2006 Determination of trace impurities in high purity platinum by atomic emission sspectrometric
YS/T 361-1994 Emission Spectral Analysis of Impurity Elements in Pure Platinum
YS/T 363-2006 Determination of trace impurities in purity rhodium by atomic emission spectrometric

Professional Standard - Education

JY/T 0580-2020 General rules of analytical methods for elemental analyzer
JY/T 017-1996 General Rules for Elemental Analyzer

National Metrological Technical Specifications of the People's Republic of China

JJF 1321-2011 Calibration Specification for Elemental Analyzers

Group Standards of the People's Republic of China

T/SCS 000022-2024 Molybdenum alloys – Analysis of trace elements – Glow discharge mass spectrometry method

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33236-2016 Polycrystalline silicon―Determination of trace elements―Glow discharge mass spectrometry method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis

工业和信息化部

YS/T 1033-2015 Determination of element contents in dry barrier―X-ray fluorescence spectrometric method

Professional Standard - Machinery

JB/T 11145-2011 X-ray fluorescence spectrometer

Association Francaise de Normalisation

NF A06-902*NF EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry.
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF C93-845:2006 Calibration of optical spectrum analyzers.
NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire

Korean Agency for Technology and Standards (KATS)

KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER

SCC

BS EN 61290-1-1:1998 Optical spectrum analyzer
NS-EN 12938:1999 Methods for the analysis of pewter — Determination of alloying and impurity element contents by atomic spectrometry
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
CEI EN 62129:2006 Calibration of optical spectrum analyzers
DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

Japanese Industrial Standards Committee (JISC)

JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis

International Organization for Standardization (ISO)

ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO/DIS 5533 Textiles — Quantification of carbon fibre constituent element — Elemental analyser method
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 5533:2023 Textiles — Quantification of carbon fibre constituent element — Elemental analyser method
ISO/FDIS 5533:2023 Textiles — Quantification of carbon fibre constituent element — Elemental analyser method
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis

British Standards Institution (BSI)

BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 5533:2023 Textiles. Quantification of carbon fibre constituent element. Elemental analyser method
BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers

Spanish Association for Standardization (UNE)

UNE-EN 12938:1999 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers

RU-GOST R

GOST 19877-1982 Dissolving pulp. Spectral method for determining of elements in pulp

Lithuanian Standards Office

LST EN 12938-2000/AC-2003 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
LST EN 12938-2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry

Danish Standards Foundation

DS/EN 12938:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
DS/EN 12938/AC:2001 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers

GSO

GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis

International Electrotechnical Commission (IEC)

IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers

YU-JUS

JUS C.A1.360-1977 Methods for chemical analysis of zine and zine alloys. Determination of group of elements - spectrographic analysis

American Society for Testing and Materials (ASTM)

ASTM E1621-13 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry

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