Phase Contrast Interference Microscopy
Phase Contrast Interference Microscopy, Total:6 items.
The international standard classification for "Phase Contrast Interference Microscopy" includes: .
The Chinese standard classification for "Phase Contrast Interference Microscopy" includes: Metallographic testing method , Length Measurement , Magnifier and microscope .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14145-1993 Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG 77-1983 Verification Regulation of Interference Microscope
- JJG 77-2006 Verification Regulation of Interference Microscopes
Professional Standard - Machinery
- JB/T 7398.11-1994 Microscope - Phase Contrast Device
Association of German Mechanical Engineers
- VDI/VDE 2655 BLATT 1.3-2020 Optical measurement technology on microtopographies - calibration of area-measuring interferometers and interference microscopes for shape measurement
- VDI/VDE 2655 BLATT 1.3-2018 Optical measurement of microtopography - Calibration of interference microscopes for form measurement
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