scanning electron microscope

scanning electron microscope, Total:9 items.

The international standard classification for "scanning electron microscope" includes: .

The Chinese standard classification for "scanning electron microscope" includes: .

Korean Agency for Technology and Standards (KATS)

• KS I 0051-2019 General rules for scanning electron microscopy
• KS M 0044-1999 General rules for scanning electron microscopy
• KS I 0051-1999(2019) General rules for scanning electron microscopy

American Society for Testing and Materials (ASTM)

• ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
• ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

International Organization for Standardization (ISO)

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

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