test reflex

test reflex, Total:40 items.

The international standard classification for "test reflex" includes: Testing of metals , Road transport , Colours and measurement of light , Road engineering in general .

The Chinese standard classification for "test reflex" includes: Technical Management , Technical management , Metal physical property test method , Traffic safety detecting equipment , Electron beam tube , Highway engineering .

Professional Standard - Electron

SJ 371-1973 Measurement of anti-overloading performance of reflex klystronss
SJ 20549-1995 Test methods for optical time domain reflectometers
SJ 375-1973 Measurement of of pulse modulation characteristic of reflex klystrons
SJ 366-1973 Measurement of interelectrode leakage current of reflex klystrons
SJ 373-1973 Measurement of frequency pulling of reflex klystrons
SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
SJ 379-1973 Measurement of frequency drift of reflex klystrons
SJ 370-1973 Measurement of electronic tuning range of reflex klystrons
SJ 382-1973 Measurement of frequency resettability of reflex klystrons
SJ 367-1973 Measurement of output power of reflex klystrons
SJ 376-1973 Measuremnt of electronic tuning hysteresis of reflex klystrons
SJ 372-1973 Measurement of electronic tuning slope of reflex klystrons
SJ 363-1973 Measurement of reflector total current, reflector ion current and reflector leakage current of reflex klystrons
SJ 364-1973 Measurement of cathode current of reflex klystrons
SJ 369-1973 Measurement of oscillation frequency of reflex klystrons
SJ 374-1973 Measurement of load characteristic of reflex klystrons
SJ 368-1973 Measurement of power ripple ratio of reflex klystrons
SJ 377-1973 Measurement of frequency drift coefficient of reflex klystrons
SJ 378-1973 Measurement of oscillation stability time of reflex klystron
SJ 362-1973 Measurement conditions for reflex klystrons
SJ 381-1973 Measurement of frequency temperature coefficient of reflex klystrons

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 13170.1-1991 Test charts of reflection for television. Multiple test chart
GB/T 42905-2023 Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method
GB/T 26377-2010 Retroreflectometer

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method

Professional Standard - Post and Telecommunication

YD/T 797-1996 Technical conditions of optical time domain reflectoscopes

交通运输部

JT/T 692.1-2022 Test method for colorimetric properties of retroreflective material - Part 1: Nighttime color of retroreflectors

Professional Standard - Traffic

JT/T 691-2007 Test method for coefficient of retroreflected luminance of horizontal coatings

CZ-CSN

CSN 56 0176 Cast.6-1978 Testing methods for starch. determination of reflection factor

American Society for Testing and Materials (ASTM)

ASTM RR-E12-1001 2006 E1349- Test Method for Reflectance Factor and Color by Spectrophotometry Using Bidirectional (45°:0° or 0°:45°) Geometry
ASTM E810-03 Standard Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry
ASTM E810-94(2000) Standard Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry
ASTM E810-03(2008) Standard Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry
ASTM E810-03(2013) Standard Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry
ASTM E810-01 Standard Test Method for Coefficient of Retroreflection of Retroreflective Sheeting Utilizing the Coplanar Geometry

German Institute for Standardization

DIN 53145-2:2012-03 Testing of paper and board - Basic parameters for determination of reflectance factor - Part 2: Measurements made on fluorescent specimens
DIN 53145-1:2012-03 Testing of paper and board - Basic parameters for determination of reflectance factor - Part 1: Measurements made on non-fluorescent specimens

SCC

DIN 53145-2 E:2011 Draft Document - Testing of paper and board - Basic parameters for determination of reflectance factor - Part 2: Measurements made on fluorescent specimens
DIN 53145-1 E:2011 Draft Document - Testing of paper and board - Basic parameters for determination of reflectance factor - Part 1: Measurements made on non-fluorescent specimens

YU-JUS

JUS N.N6.178-1978 Radiocommunications. Wired distribution s) stems. Methods of measurements. Echoes.

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