Transistor reliability
Transistor reliability, Total:112 items.
The international standard classification for "Transistor reliability" includes: Space systems and operations .
The Chinese standard classification for "Transistor reliability" includes: Computer application .
Professional Standard - Aerospace
- QJ 2345-1992 Software reliability and maintainability management
- QJ 1512-1988 Reliability Verification Test Method for Silicon Low Power NPN Transistor
Professional Standard - Electron
- SJ/T 11403-2009 Laser diode modules used for telecommunication - Reliability assessment
Taiwan Provincial Standard of the People's Republic of China
- CNS 13649-1996 Reliability Testing for Laser Diode(for Communication)
- CNS 13655-1996 Reliability Testing for Photodiode(for Communication)
- CNS 13652-1996 Reliability Testing for Light Emitting Diode(for Communication)
Korean Agency for Technology and Standards (KATS)
- KS C 5208-2002 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (LOW CURRENT)
- KS C 5206-1980 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (LOW CURRENT)
- KS C 5206-1980(2000) RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (LOW CURRENT)
- KS C 5209-1980(2000) RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
- KS C 5206-2002 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (LOW CURRENT)
- KS C 5209-1980 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
- KS C 5205-1980(2000) RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
- KS C 5209-2002 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
- KS C 5203-1980(2000) RELIABILITY ASSURED SMALL SIGNAL DIODES
- KS C 5207-2002 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
- KS C 5203-1980 RELIABILITY ASSURED SMALL SIGNAL DIODES
- KS C 5203-2002 RELIABILITY ASSURED SMALL SIGNAL DIODES
- KS C 5213-1981(1997) RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
- KS C 5213-1981 RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
- KS C 5207-1980(2000) RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
- KS C 5205-2002 RELIABILITY ASSURED VOLTAGE REGULATOR DIODES AND VOLTAGE REFERENCE DIODES
- KS C 5207-1980 RELIABILITY ASSURED REVERSE BLOCKING TRIODE THYRISTORS (HIGH AND MEDIUM CURRENT)
- KS C 5204-1980 RELIABILITY ASSURED LOW CURRENT RECTIFIER DIODES
- KS C 5204-1980(2000) RELIABILITY ASSURED LOW CURRENT RECTIFIER DIODES
- KS C 5217-1983(1998) RELIABILITY ASSURED RECTIFIER DIODES (MEDIUM AND HIGH CURRENT)
- KS C 5213-2002 RELIABILITY ASSURED LOW CURRENT SWITCHING DIODES
- KS C 5204-2002 RELIABILITY ASSURED LOW CURRENT RECTIFIER DIODES
- KS A IEC 60300-1-2019 Dependability management — Part 1: Dependability management systems
- KS A IEC 60300-2-2020 Dependability management-Part 2:Guidelines for dependability management
- KS A IEC 60300-1:2014 Dependability management — Part 1: Dependability management systems
- KS A IEC 60300-1:2004 Dependability management -Part 1 Dependability management systems
- KS C 5217-1983 RELIABILITY ASSURED RECTIFIER DIODES (MEDIUM AND HIGH CURRENT)
- KS A IEC 60300-1-2014(2019) Dependability management — Part 1: Dependability management systems
- KS C 5217-2002 RELIABILITY ASSURED RECTIFIER DIODES (MEDIUM AND HIGH CURRENT)
- KS A IEC 60300-2:2005 Dependability management-Part 2:Guidelines for dependability management
- KS C 5208-1980(2000) RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (LOW CURRENT)
- KS C 5208-1980 RELIABILITY ASSURED BI-DIRECTIONAL TRIODE THYRISTORS (LOW CURRENT)
- KS C 7112-2007 Organic light emitting diode(OLED) displays-Environmental reliability test methods
Japanese Industrial Standards Committee (JISC)
- JIS C 7233:1978 Reliability assured bi-directional triode thyristors (low current)
- JIS C 7234:1978 Reliability assured bi-directional triode thyristors (high and medium current)
- JIS C 7231:1978 Reliability assured reverse blocking triode thyristors (low current)
- JIS C 7223:1978 Reliability assured voltage regulator diodes and voltage reference diodes
- JIS C 7232:1978 Reliability assured reverse blocking triode thyristors (high and medium current)
- JIS C 7221:1978 Reliability assured small signal diodes
- JIS C 7224:1980 Reliability assured low current switching diodes
- JIS C 7222:1978 Reliability assured low current rectifier diodes
- JIS C 5750-2:2010 Dependability management -- Part 2: Guidelines for dependability management
- JIS C 5750-1:2010 Dependability management -- Part 1: Dependability management systems
- JIS C 5750-1:2000 Dependability management -- Part 1: Dependability programme management
- JIS C 7225:1982 Reliability assured rectifier diodes (medium and high current)
British Standards Institution (BSI)
- BS EN IEC 60300-1:2024 Dependability management - Managing dependability
- BS EN 60300-2:2004 Dependability management - Guidelines for dependability management
- BS EN 60300-1:2003 Dependability management - Dependability management systems
- BS EN 60300-3-15:2009 Dependability management - Application guide - Engineering of system dependability
- BS EN 60300-3-15:2010 Dependability management. Application guide. Engineering of system dependability
- BS EN IEC 60300-3-4:2022 Dependability management. Application guide. Specification of dependability requirements
- BS IEC 60300-3-6:1997 Dependability management. Application guide - Software aspects of dependability
- BS EN 60300-3-2:2005 Dependability management - Application guide - Collection of dependability data from the field
ECSS - European Cooperation for Space Standardization
- Q-ST-30C-2009 Dependability (Third Issue)
Standard Association of Australia (SAA)
- AS IEC 60300.1:2004 Dependability management - Dependability management systems
- AS IEC 60300.2:2005 Dependability management - Guidance for dependability programme management
- AS IEC 60300.3.15:2011 Reliability Management Application Guide System Reliability Engineering
- AS IEC 60300 (Set):2005 Dependability Management Set
SE-SIS
- SIS SS IEC 300:1989 Dependability — Reliability and maintainability management
GOSTR
- GOST R 27.015-2019 Dependability in technics. Dependability management. Guide for engineering of system dependability
- GOST R 27.014-2019 Dependability in technics. Dependability management. Guidance on system dependability specifications
- GOST R 27.301-2011 Dependability in technics. Dependability management. Analysis techniques for reliability. General principles
Danish Standards Foundation
- DS/EN 60300-1:2003 Dependability management - Part 1: Dependability management systems
- DS/EN 60300-2:2004 Dependability management - Part 2: Guidance for dependability management
Association Francaise de Normalisation
- NF C20-300-1:1994 Dependability management. Part 1 : dependability programme management.
- NF C20-300-1:2004 Dependability management - Part 1 : dependability management systems.
SCC
- CEI EN 60300-2:2009 Dependability management Part 2: Guidance for dependability management
- AENOR UNE-EN 60300-1:2004 Reliability management. Part 1: Reliability management systems.
- AENOR UNE-EN 60300-2:2006 Reliability management. Part 2: Guide to reliability management.
- UNE-EN 60300-1:1996 DEPENDABILITY MANAGEMENT. PART 1: DEPENDABILITY PROGRAMME MANAGEMENT.
- UNE-EN 60300-1:2004 Dependability management - Part 1: Dependability management systems
- DANSK DS/EN 60300-2:2004 Dependability management - Part 2: Guidance for dependability management
- UNE-EN 60300-2:2006 Dependability management -- Part 2: Guidelines for dependability management
- VDI 4003-2007 Reliability management
- VDI 4003-2007 Reliability management
- MIL MIL-PRF-55365/11C-2011 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Styles CWR19 and CWR29
- MIL MIL-PRF-55365/8H-2011 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Style CWR11 (Metric)
- MIL MIL-PRF-55365/8J-2014 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Style CWR11 (Metric)
- MIL MIL-PRF-55365/11D-2014 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability and High Reliability, Styles CWR19 and CWR29
- MIL MIL-PRF-55365/4H-2011 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability, and High Reliability Styles CWR06 and CWR09
- MIL MIL-PRF-55365/4J-2014 Capacitors, Chip, Fixed, Tantalum, Polarized Established Reliability, Non-Established Reliability, and High Reliability Styles CWR06 and CWR09
- MIL MIL-HDBK-189C-2011 Reliability Growth Management
- CSA Q632-1990 Reliability and Maintainability Management Guidelines
European Committee for Standardization (CEN)
- EN 60300-1:2003 Dependability management — Part 1: Dependability management systems
German Institute for Standardization
- DIN EN 60300-1:2004 Dependability management - Part 1: Dependability management systems (IEC 60300-1:2003); German version EN 60300-1:2003
- DIN EN 60300-2:2004 Dependability management - Part 2: Guidelines for dependability management (IEC 60300-2:2004); German version EN 60300-2:2004
- DIN EN IEC 60300-1:2021-06 Dependability management - Part 1: Enabling dependability (IEC 56/1886/CD:2020); Text in German and English / Note: Date of issue 2021-05-14*Intended as replacement for DIN EN 60300-1 (2015-01).
RU-GOST R
- GOST R 27.606-2013 Dependability in technics. Dependability management. Reliability centred maintenance
- GOST R 27.003-2011 Dependability in technics. Dependability management. Guide to the assignment of dependability technical requirements
- GOST R 27.001-2009 Dependability in technics. Dependability management system. Basic principles
- GOST R 27.601-2011 Dependability in technics. Dependability management. Maintenance and maintenance support
- GOST R IEC 60300-3-3-2021 Dependability in technics. Dependability management. Life cycle costing
European Committee for Electrotechnical Standardization(CENELEC)
- EN 60300-1:2014 Dependability management - Part 1: Guidance for management and application
International Electrotechnical Commission (IEC)
- IEC 60300-1:2003 Dependability management - Part 1: Dependability management systems
VDI - Verein Deutscher Ingenieure
- VDI 4003-2004 Zuverlaessigkeitsmanagement
U.S. Military Regulations and Norms
- ARMY MIL-PRF-55365/8 H-2011 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLE CWR11 (METRIC)
- ARMY MIL-PRF-55365/11 C-2011 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLES CWR19 AND CWR29
- ARMY MIL-PRF-55365/4 H-2011 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY, AND HIGH RELIABILITY STYLES CWR06 AND CWR09
- ARMY MIL-HDBK-189 B-2010 Reliability Growth Management
- ARMY MIL-HDBK-189-1981 RELIABILITY GROWTH MANAGEMENT
- ARMY MIL-HDBK-189 VALID NOTICE 1-2000 RELIABILITY GROWTH MANAGEMENT
- ARMY MIL-HDBK-00189 A-2009 Reliability Growth Management
Lithuanian Standards Office
- LST EN 60300-1-2003 Dependability management. Part 1: Dependability management systems (IEC 60300-1:2003)
- LST EN 60300-2-2004 Dependability management. Part 2: Guidelines for dependability management (IEC 60300-2:2004)
BELST
- STB 2465-2016 Dependability in technics. Dependability management of technically complicated items
Indonesia Standards
- SNI 04-3854-1995 Reliability and maintainability management
response reliability,reliability test,car reliability,reliability test,Triode,environmental reliability,hardware reliability,reliability company,Reliability testing,environmental reliability,Reliability Simulation,reliability test,hardware reliability,Transistor parameters,Inductor reliability,Reliability Training,Reliability Block Diagram,Reliability experiment,Transistor reliability