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Saturation photocurrent of silicon cathode

Saturation photocurrent of silicon cathode, Total:179 items.

The international standard classification for "Saturation photocurrent of silicon cathode" includes: Fluorescent lamps. Discharge lamps , Optoelectronics. Laser equipment , Copper and copper alloys , Materials and components for shipbuilding , Other standards related to shipbuilding and marine structures , Petroleum products and natural gas handling equipment .

The Chinese standard classification for "Saturation photocurrent of silicon cathode" includes: Technical Management , Technical management , Electric light source products , Other electron tube , Heavy metals and their alloys analysis method , Vessel materials and their inspection methods , Material Protection , Electron beam tube .


Professional Standard - Electron

  • SJ 1947-1981 Detail specification for silicon power rectifier diodes,Type 2CZ32B,2DZ32B,2CZ33B and 2DZ33B
  • SJ/Z 9020-1987 Photometric and colorimetric methods of measurement for the light emitted by cathode-ray tube screens
  • SJ 2138-1982 Methods of measurement for regulated current of silicon current regulator diodes
  • SJ 2142-1982 Methods of measurement for current temperature coefficient of silicon current regulator diodes
  • SJ 1718-1981 Measurement of cathode pulse current of power klystrons
  • SJ 443-1973 Method of measurement for cathode heating time of high-voltage rectifier tubes
  • SJ 364-1973 Measurement of cathode current of reflex klystrons
  • SJ 445-1973 Methods of measurement for cathode pulse emission current and cathode pulse emission current on underheated condition of high-voltage rectifier tubes
  • SJ 2141-1982 Methods of measurement for breakdown voltage of silicon currenet regulator diodes
  • SJ 2140-1982 Methods of measurement for limiting voltage of silicon current regulator diodes
  • SJ 2214.7-1982 Method of measurement for saturation voltage of semiconductor phototransistors
  • SJ/T 10985-1996 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes
  • SJ/T 2216-2015 Technical specification for photodiode of silicon

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 10304.6-1988 Determination of Na in cathode carbonate by atomic absorption spectrophotometry
  • GB 9585-1988 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes
  • GB 5295-1985 The spectral response characteristic series of photocathodes
  • GB/T 13293.11-1991 Higher purity copper cathode. Determination of silicon content. Molybdenum blue spectrophotometric method
  • GB/T 17005-2019 General requirements for impressed current cathodic protection system of coastal structures
  • GB/T 3108-1999 Impressed current cathodic protection system for ship hull
  • GB/T 5295-1985 The spectral response characteristic series of photocathodes
  • GB/T 3789.3-1991 Measurements of the electrical properties of transmitting tubes-Measuring methods of cathode emission current
  • GB/T 22706-2008 Self-ballasted cold cathode fluorescent lamps - Service-performance requirements

Professional Standard - Military and Civilian Products

  • WJ 2100-2004 Test method for silicon photodiodes and silicon avalanche photodiodes

未注明发布机构

  • AMPP Paper 17666-2022 Improved cathodic protection current distribution method for the bottom of aboveground oil storage tanks
  • VG 81257:2009-01 Cathodic protection of ships - Cathodic alloy dimensions, masses, characteristic values and materials
  • JIS H 1103:1976(1995) Methods for Emission Spectrochemical Analysis of Electrolytic Cathode Copper
  • AMPP Paper 17629-2022 Inner line cathodic protection current mapping technology
  • DVGW AfK 6:1985-09 Application of foreign DC auxiliary anode in cathode corrosion protection and prevention of human current injury

Professional Standard - Commodity Inspection

  • SN/T 2260-2010 Determination chemical compounds of copper cathode—Photoelectric emission spectroscopic method

Professional Standard - Machinery

Taiwan Provincial Standard of the People's Republic of China

  • CNS 8105-1981 Test Method for Transistor Collector - Emitter Saturation Voltage

Professional Standard - Petroleum

  • SY/T 0036-2000 Design specificating of impressed current cathodic protection for buried steel pipeline
  • SY/T 7699-2023 Impressed current cathodic protection of offshore steel structures

Military Standard of the People's Republic of China-General Armament Department

  • GJB 3188-1998 Technical requirements for submarine impressed current cathodic protection systems
  • GJB 3188A-2018 Technical requirements for submarine impressed current cathodic protection systems

Professional Standard - Energy

  • NB/T 34069-2018 Impressed current cathodic protection device for enamel interior surface of water storage tank
  • NB/T 11075-2023 Saturable reactor for high voltage direct current (HVDC) converter valve

Group Standards of the People's Republic of China

  • T/SCS 000018-2024 Portable Spectroscopy for Heavy Metals in Water Based on Solution Cathode Glow Discharge

CZ-CSN

  • CSN 35 8585 Cast.1-1984 Television picture tubes. Measuring method of heating current, anodě current and cathode current
  • CSN 35 8562-1966 Methods of mea?jrement of maximum cathode current of television picture tubes

US-FCR

PL-PKN

  • PN T04830-05-1985 Electronic tubes Colour picture tubes Methods of measurement of filament current, anod? current and cathode current

Magyar Szabványügyi Testület

  • MSZ 10906/3.lap-1963 Electrode tube power mark measurement mode. Anode current, cathode current, you manage to bring the grid to measure the current
  • MSZ 10906/10.lap-1964 Electric tube power mark measurement mode. Cathode to anode current rises to the time of measurement

Gosstandart of Russia

  • GOST 19438.12-1975 Low-power electronic tubes and valves. Methods of measurement of plate current and currents of grids having positive potential
  • GOST 21815.1-1986 Image intensifier and image converter tubes. Method of measuring sensitivity of the photocathode to white light and to white light with selective light filter
  • GOST 21059.6-1979 Monochrome and colour TV picture tubes. Measurement techniques of heater current, anode current and cathode current
  • GOST 11612.1-1981 Photomultipliers. Measuring method of catode luminous sensitivity
  • GOST 21803.3-1976 Vacuum enclosed prove tubes. Method of measurement of current of grid having positive potential with respect to cathode
  • GOST 17038.3-1979 Ionizing-radiation scintillation detectors. Method for measurement of detector light yield of photomultiplier anode current
  • GOST 19438.8-1975 Low-power electronic tubes and valves. Methods of measurement of current due to the cathode electron emission
  • GOST 21107.2-1975 Gas discharge devices. Methods of measurement of electrical parameters of hot-cathode thyratrons and gas-filled rectifiers
  • GOST 21815.6-1986 Image intensifier and image converter tubes. Method of checking useful diameter of the photocathode
  • GOST R 70899-2023 Gas-discharge devices. Hot cathode thyratrons. Parameters system
  • GOST 21106.12-1977 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Method of measurement of leakage currents between electrodes and between cathode and heater
  • GOST 21106.7-1977 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Method of measurement of cathode current

SE-SIS

British Standards Institution (BSI)

  • BS DD 95-6:1987 Analysis of higher purity copper cathode Cu-CATH 1.-Methods for determination of phosphorus and silicon by spectrophotometry
  • BS 7317-6:1990 Methods for analysis of high purity copper cathode Cu-CATH-1 - Method for determination of phosphorus and silicon by spectrophotometry
  • BS EN 15257:2006(2011) Cathodic protection — Competence levels and certification of cathodic protection personnel
  • BS EN ISO 24656:2022 Cathodic protection of offshore wind structures

GCC Standardization Organization

  • GSO 2490:2015 Petroleum and natural gas industries- Impressed Current Anodes for Cathodic Protection
  • GSO IEC 60236:2014 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes

Military Standards (MIL-STD)

  • MIL MIL-DTL-24625A-2009 Anodes, Impressed Current Cathodic Protection - Platinized Type
  • MIL MIL-PRF-19500/656C-2020 Diode, Silicon, Schottky, Power Rectifier, Common Cathode or Common Anode Center Tap, Types 1N6785 and 1N6785R, JAN, JANTX, JANTXV and JANS
  • MIL MIL-PRF-19500/616G-2009 Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6657 through 1N6659 JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/656B-2015 Diode, Silicon, Schottky, Power Rectifier, Common Cathode or Common Anode Center Tap, Types 1N6785 and 1N6785R, JAN, JANTX, JANTXV and JANS
  • MIL MIL-DTL-23919D-2020 Reference Cell, Impressed Current Cathodic Protection (ICCP)-Silver-Silver Chloride
  • MIL MIL-PRF-19500/645D-2013 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6772, 1N6773, 1N6772R and 1N6773R JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/645C-2007 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6772, 1N6773, 1N6772R and 1N6773R JAN, JANTX, JANTXV, and JANS
  • MIL MIL-DTL-23919C-2012 Reference Cell, Impressed Current Cathodic Protection (ICCP)-Silver-Silver Chloride
  • MIL MIL-PRF-19500/671-2000 SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, COMMON CATHODE OR ANODE CENTER TAP, TYPES 1N6828, 1N6828R, 1N6833, 1N6833R, NN6828U3 AND 1N6833U3 JAN, JANTX, JANTXV, JANS
  • MIL MIL-PRF-19500/656A-2008 Semiconductor Device, Diode, Silicon, Schottky, Power Rectifier, Common Cathode or Common Anode Center Tap, Types 1N6785 and 1N6785R, JAN, JANTX, JANTXV and JANS
  • MIL MIL-PRF-19500/645E-2018 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6772, 1N6773, 1N6772R and 1N6773R JAN, JANTX, JANTXV, and JANS
  • MIL MIL-DTL-23919B-2009 Reference Cell, Impressed Current Cathodic Protection (ICCP)-Silver-Silver Chloride
  • MIL MIL-PRF-19500/616H-2017 SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, DUAL, COMMON CATHODE OR ANODE CENTER TAP, ULTRAFAST (SUPERSEDING MIL-PRF-19500/616G)
  • MIL MIL-PRF-19500/656-2001 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE OR COMMON ANODE CENTER TAP, TYPES 1N6785 AND 1N6785R JAN, JANTX, JANTXV AND JANS
  • MIL MIL-PRF-19500/643D-2020 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6766 and 1N6767, 1N6766R and 1N6767R, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/616F-2008 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6657 through 1N6659 and 1N6657R through 1N6659R, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/671A-2012 Semiconductor Device, Diode, Silicon, Schottky Power Rectifier, Common Cathode or Anode Center Tap, Types 1N6828, 1N6828R, 1N6833, 1N6833R, 1N6828U3 and 1N6833U3 JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/642E-2018 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6762 Through 1N6765 and 1N6762R Through 1N6765R JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/642D-2007 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6762 Through 1N6765 and 1N6762R Through 1N6765R JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/762-2010 Semiconductor Device, Diode, Silicon, Dual Schottky, Common Cathode, Type 1N7062CCT1, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/754A-2015 Semiconductor Device, Diode, Silicon, Schottky, Dual, Common Cathode, Type 1N7064CCU3 and 1N7064CCU3C, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/762A-2015 Semiconductor Device, Diode, Silicon, Dual Schottky, Common Cathode, Type 1N7062CCT1, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-S-19500/608-1993 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE OR COMMON ANODE CENTER TAP, TYPES 1M6660 AND 1N6660R JANTX, JANTXV AND JANS (S/S BY MIL-PRF-19500/608A)
  • MIL MIL-PRF-19500/754-2009 Semiconductor Device, Diode, Silicon, Schottky, Dual, Common Cathode, Type 1N7064CCU3 and 1N7064CCU3C, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/754B-2020 Semiconductor Device, Diode, Silicon, Schottky, Dual, Common Cathode, Type 1N7064CCU3 and 1N7064CCU3C, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/608D-2009 Semiconductor Device, Diode, Silicon, Schottky, Power Rectifier,Common Cathode, Common Anode Center Tap, Doubler, Types 1N6660, 1N6660CCT1, 1N6660R, 1N6660CAT1, and 1N6660DT1, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/608E-2018 Semiconductor Device, Diode, Silicon, Schottky, Power Rectifier,Common Cathode, Common Anode Center Tap, Doubler, Types 1N6660, 1N6660CCT1, 1N6660R, 1N6660CAT1, and 1N6660DT1, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/645B-2005 SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, DUAL, COMMON CATHODE OR ANODE CENTER TAP, ULTRAFAST, TYPES 1N6772, 1N6773, 1N6772R AND 1N6773R JAN, JANTX, JANTXV, AND JANS(SUPERSEDING MIL-PRF-19500/645A)
  • MIL MIL-PRF-19500/608A-1997 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE OR COMMON ANODE CENTER TAP, TYPES 1N6660 AND 1N6660R JAN, JANTX, JANTXV AND JANS (SUPERSEDING MIL-S-19500/608)
  • MIL MIL-PRF-19500/617D-2009 Semiconductor Devices, Unitized, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6672 through 1N6674 and 1N6672R through 1N6674R, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/617F-2020 Semiconductor Devices, Unitized, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6672 through 1N6674 and 1N6672R through 1N6674R, JAN, JANTX, JANTXV, and JANS
  • MIL MIL-PRF-19500/643C-2007 SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, DUAL. COMMON CATHODE OR ANODE CENTER TAP, ULTRAFAST, TYPES 1N6766 AND 1N6767, 1N6766R AND 1N6767R, JAN, JANTX, JANTXV, AND JANS(SUPERSEDING MIL-PRF-19500/643B)

U.S. Military Regulations and Norms

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO 2490:2015 Petroleum and natural gas industries- Impressed Current Anodes for Cathodic Protection
  • OS GSO IEC 60441:2014 Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screen
  • OS GSO IEC 60236:2014 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes
  • OS GSO 2411:2014 Petroleum and natural gas industries – Galvanic Anods for Cathodic Protection

Japanese Industrial Standards Committee (JISC)

  • JIS H 1103:1995 Method for photoelectric emission spectrochemical analysis of electrolytic cathode copper
  • JIS Z 8752:1989 Measuring methods of low pressures by hot cathode and cold cathode ionization gauges
  • JIS H 4502:1990 Nickel sheets and strips for cathode of electronic tube

Defense Logistics Agency

  • DLA MIL-PRF-19500/656 A-2008 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE OR COMMON ANODE CENTER TAP, TYPES 1N6785 AND 1N6785R, JAN, JANTX, JANTXV AND JANS
  • DLA SMD-5962-87605 REV B-2005 MICROCIRCUIT, LINEAR, NEGATIVE VOLTAGE REGULATOR, MONOLITHIC SILICON
  • DLA SMD-5962-89549-1989 MICROCIRCUITS, DIGITAL, BIPOLAR, PIPELINE REGISTER WITH SHADOW REGISTER, MONOLITHIC SILICON
  • DLA MIL-PRF-19500/642 D VALID NOTICE 1-2012 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6762 Through 1N6765 and 1N6762R Through 1N6765R JANTX, JANTXV, and JANS
  • DLA MIL-PRF-19500/643 C (1)-2012 SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, DUAL, COMMON CATHODE OR ANODE CENTER TAP, ULTRAFAST, TYPES 1N6766 AND 1N6767, 1N6766R AND 1N6767R, JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/644 A VALID NOTICE 2-2011 Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6768 Through 1N6771 and 1N6768R Through 1N6771R JAN, JANTX, JANTXV, and JANS
  • DLA MIL-PRF-19500/765 A-2013 SEMICONDUCTOR DEVICE, DIODE, SILICON, DUAL SCHOTTKY, COMMON CATHODE, TYPE 1N7072CCT3, AND 1N7078U3 JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/762-2009 SEMICONDUCTOR DEVICE, DIODE, SILICON, DUAL SCHOTTKY, COMMON CATHODE, TYPE 1N7062CCT1, JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/764 F-2009 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, COMMON CATHODE, TYPE 1N7071CCT8, JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/671 A-2012 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY POWER RECTIFIER, COMMON CATHODE OR ANODE CENTER TAP, TYPES 1N6828, 1N6828R, 1N6833, 1N6833R, 1N6828U3, AND 1N6833U3, JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/608 D-2009 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE, COMMON ANODE CENTER TAP, DOUBLER, TYPES 1N6660, 1N6660CCT1, 1N6660R, 1N6660CAT1, AND 1N6660DT1, JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/608 D (1)-2010 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, POWER RECTIFIER, COMMON CATHODE, COMMON ANODE CENTER TAP, DOUBLER, TYPES 1N6660, 1N6660CCT1, 1N6660R, 1N6660CAT1, AND 1N6660DT1, JAN, JANTX, JANTXV, AND JANS
  • DLA MIL-PRF-19500/754 D-2009 SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY, DUAL, COMMON CATHODE, TYPE 1N7064CCU3 and 1N7064CCU3C, JAN, JANTX, JANTXV, AND JANS

United States Navy

Ente Nazionale Italiano di Unificazione

  • UNI CEI 5:1992 Cathodic protection of buried metallic structures. Current measurements.
  • UNI 10835:2024 Cathodic protection of buried metallic structures - Anodes and ground-beds for impressed current stations - Design and installation criteria
  • EC 1-2008 UNI EN 15257:2007 Cathodic protection - Competence levels and certification of cathodic protection personnel
  • UNI EN 15257:2007 Cathodic protection - Competence levels and certification of cathodic protection personnel
  • UNI 10835:1999 Cathodic protection of buried metallic structures - Anodes and ground-beds for impressed current stations - Design and installation criteria
  • UNI 10167:1993 Cathodic protection of buried metallic structures. Cathodic protection cabinets and test post boxes.

National Association of Corrosion Engineers (NACE)

  • NACE 10A196-1998 Impressed Current Anodes for Underground Cathodic Protection Systems Item No. 24190
  • NACE SP0196-2011 Galvanic Anode Cathodic Protection of Internal Submerged Surfaces of Steel Water Storage Tanks (Item No: 21077)
  • NACE 7L198-2009 Design of Galvanic Anode Cathodic Protection Systems for Offshore Structures (Item No. 24196)
  • NACE Paper 13133-2019 Application of VCIs in the Annular Space of Casing and Its Effect on Cathodic Protection Current Diversion
  • NACE Paper 14685-2020 Recent advances in measuring and understanding cathodic protection current permeability in organic coatings
  • NACE SP0388-2018 Forced current cathodic protection of internal immersed surfaces of carbon steel water storage tanks

Korean Agency for Technology and Standards (KATS)

  • KS D 1899-2019 Methods for photoelectric emission spectrochemical analysis of electrolytic cathode copper
  • KS D 1899-1993 Methods for emission spectrochemical analysis of electrolytic cathode copper
  • KS D 7031-2012(2017) Magnesium galvanic anodes for cathodic protection
  • KS C IEC 60441:2003 Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screen
  • KS C IEC 60441:2013 Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screen
  • KS C IEC 60441-2013 Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screen
  • KS C IEC 60441-2003(2008) Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screen
  • KS D 5584-1992(2002) NICKEL SHEETS AND STRIPS FOR CATHODE OF ELECTRONIC TUBE
  • KS D 5584-1981 NICKEL SHEETS AND STRIPS FOR CATHODE OF ELECTRONIC TUBE

National Electrical Manufacturers Association(NEMA)

  • NEMA C78.3-1978 DIMENSIONAL AND ELECTRICAL CHARACTERISTICS OF FLUORESCENT LAMPS - INSTANT-START AND COLD-CATHODE TYPES
  • NEMA C78.3-1991 Fluorescent Lamps - Instant-Start and Cold-Cathode Types - Dimensional and Electrical Characteristics

International Electrotechnical Commission (IEC)

  • IEC 60441:1974 Photometric and colorimetric methods of measurement of the light emitted by a cathode-ray tube screen
  • IEC 60236:1967 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes
  • IEC 60236:1974 Methods for the designation of electrostatic deflecting electrodes of cathode-ray tubes

Electronic Components, Assemblies and Materials Association

  • ECA TEP116-C-1993 Optical Characteristics of Cathode Ray Tube Screens Includes Access to Additional Content
  • ECA TEP105-8-1987 Raster Response Measurement for Monochrome Cathode Ray Tubes

Lithuanian Standards Office

  • LST EN 15257-2007 Cathodic protection - Competence levels and certification of cathodic protection personnel

Danish Standards Foundation

Spanish Association for Standardization (UNE)

Standard Association of Australia (SAA)

American Water Works Association (AWWA)

  • AWWA D104-2004 Automatically Controlled, Impressed-Current Cathodic Protection for the Interior of Steel Water Tanks
  • AWWA DSS91011 Impact of Impressed Current Cathodic Protection on Infrastructure Emphasis on Water Industry
  • AWWA D104-1997 Automatically Controlled, Impressed-Current Cathodic Protection for the Interior of Steel Water Tanks
  • AWWA D104-2001 Automatically Controlled, Impressed-Current Cathodic Protection for the Interior of Steel Water Tanks
  • AWWA D104-2017 Automatically Controlled, Impressed-Current Cathodic Protection for the Interior Submerged of Steel Water Storage Tanks

American National Standards Institute (ANSI)

  • ANSI/AWWA D104-2004 Automatically Controlled, Impressed-Current Cathodic Protection for the Interior of Steel Water Tanks
  • ANSI C78.3-1991 Fluorescent lamp instant start and cold cathode type dimensions and electrical characteristics

Standards Norway

  • NS-EN 15257:2006 Cathodic protection — Competence levels and certification of cathodic protection personnel

Swedish Institute for Standards

  • SS-EN 12496:2013 Galvanic anodes for cathodic protection in seawater and saline mud

Bureau of Indian Standards

  • IS 9883-1981 Photometric and colorimetric methods of measurements of the light emitted by a cathode-ray tube screen

GOST

  • GOST R 71378-2024 High-voltage cenotrons. Method of measuring the anode-cathode capacitance

ECIA - Electronic Components Industry Association

  • TEP105-8-1987 Raster Response Measurement for Monochrome Cathode Ray Tubes

German Institute for Standardization

  • DIN EN 15257:2007 Cathodic protection - Competence levels and certification of cathodic protection personnel; English version of DIN EN 15257:2007-03

American Society for Testing and Materials (ASTM)

  • ASTM B115-10(2016) Standard Specification for Electrolytic Copper Cathode
  • ASTM G220-20 Standard Practice for Replacing Saturated Calomel Reference Electrode (SCE) for Measuring Electrode Potentials

European Committee for Standardization (CEN)

International Organization for Standardization (ISO)

YU-JUS

  • JUS N.R1.113-1977 Electronic tubes. Measurements oftke electrical properties. Methods of measurement oj emission current from hot cathodesjor high - vacuum ekctronic tubes and valves

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO 2411:2015 Petroleum and natural gas industries – Galvanic Anods for Cathodic Protection