Principle of square resistance test with four probes
Principle of square resistance test with four probes, Total:27 items.
The international standard classification for "Principle of square resistance test with four probes" includes: Electricity. Magnetism. Electrical and magnetic measurements , Other methods of testing of metals , Chemical analysis of metals , Testing of metals .
The Chinese standard classification for "Principle of square resistance test with four probes" includes: Radio Measurement , Semimetal and semiconductor material analysis method , Metal physical property test method , Technical management .
National Metrological Verification Regulations of the People's Republic of China
- JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
- JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
Group Standards of the People's Republic of China
- T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
- T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
Professional Standard - Ferrous Metallurgy
- YB/T 6166-2024 Graphene film sheet resistance measurement four-probe method
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method
Professional Standard - Electron
- SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
Professional Standard - Non-ferrous Metal
- YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
- YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface
Korean Agency for Technology and Standards (KATS)
- KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS L 1619-2023 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS C 0256-2002(2017) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
Japanese Industrial Standards Committee (JISC)
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
- JIS K 7194:1994 Testing method for resistivity of conductive plastics with a four-point probe array
- JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
- JIS R 1637:1998 Test method for resistivity of conductive fine ceramic thin films with a four-point probe array
KR-KS
- KS L 1619-2013(2023) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
RU-GOST R
- GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method
American Society for Testing and Materials (ASTM)
- ASTM F390-11 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array