How to use mc1000 ion sputtering
How to use mc1000 ion sputtering, Total:11 items.
The international standard classification for "How to use mc1000 ion sputtering" includes: Vacuum technology .
The Chinese standard classification for "How to use mc1000 ion sputtering" includes: Vacuum technique and equipment .
Professional Standard - Electron
- SJ 1781-1981 Sputtering ion pump--Testing methods
Professional Standard - Machinery
- JB/T 4081-1991 Sputtering ion pump type and basic parameters
- JB/T 2965-1992 Performance Testing Method of Sputtering Ion Pump
- JB/T 4082-1991 Sputtering ion pump technical conditions
- JB/T 4081-2011 Vacuum technology － Sputter-ion pumps
British Standards Institution (BSI)
- BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
- 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
International Organization for Standardization (ISO)
- ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
German Institute for Standardization
- DIN 28429:2003 Vacuum technology - Acceptance specifications for getter ion pumps
SCC
- ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
