-
YS/T 28-2024 in English
Package and labeling for silicon wafers
VALID
Issued on:2024-10-24 | Implemented on:2025-05-01
$189.00 $184.00 -
GB/T 12964-2018 in English
Monocrystalline silicon polished wafers
VALID
Issued on:2018-09-17 | Implemented on:2019-06-01
$160.00 $156.00 -
GB/T 4058-2009 in English
Test method for detection of oxidation induced defects in polished silicon wafers
VALID
Issued on:2009-10-30 | Implemented on:2010-06-01
$300.00 $291.00 -
GB/T 3045-2017 in English
Conventional abrasive―Chemical analysis of silicon carbide
SUPERSEDED
Issued on:2017-12-29 | Implemented on:2018-07-01
$490.00 $476.00 -
GB/T 30868-2025 in English
Test method for micropipe density of monocrystalline silicon carbide
VALID
Issued on:2025-08-01 | Implemented on:2026-02-01
$135.00 $131.00 -
GB/T 19921-2005 in English
Test method of particles on silicon wafer surfaces
SUPERSEDED
Issued on:2005-09-19 | Implemented on:2006-04-01
$120.00 $117.00 -
GB/T 26071-2018 in English
Monocrystalline silicon wafers for solar cells
SUPERSEDED
Issued on:2018-09-17 | Implemented on:2019-04-01
$160.00 $156.00 -
GB/T 26065-2010 in English
Specification for polished test silicon wafers
VALID
Issued on:2011-01-10 | Implemented on:2011-10-01
$300.00 $291.00 -
YS/T 985-2014 in English
Polished reclaimed silicon wafers
VALID
Issued on:2014-10-14 | Implemented on:2015-04-01
$220.00 $214.00 -
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