GB/T 15653-1995 in English

VALID

Measuring methods for gas sensors of metal-oxide semiconductor

Issued on:1995-07-24
Implemented on:1996-04-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $150.00
$146.00

Standard No:	GB/T 15653-1995
Document status:	VALID
Title in English:	Measuring methods for gas sensors of metal-oxide semiconductor
Title in Chinese:	金属氧化物半导体气敏元件测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1995-07-24
Implemented on:	1996-04-01
ICS Classification:	31.020-Electronic components in general
Chinese Classification:	L15-Sensitive component and sensor
Professional Classification:	GB-National Standard
Related Keywords:	semiconductor gas sensors gas sensors other gas sensors test methods metal-oxide semiconductor scopethis standard
Related Topics:	Metal Oxidation Gas+ metal oxidation pool metal oxidation pool semiconductor photooxidation Gas sensitivity test box+ metal oxide capacitor Metal oxides and detection metal oxide capacitor metal oxide + capacitor Metal Oxidation Metal? Oxide? Metal Capacitors Pseudocapacitive metal oxides metal superoxide Check metal oxides metal superoxide Low Dimensional Oxide Semiconductors binary conductive metal metal oxide pseudocapacitor metal oxide metal oxide capacitor Gas detection volume semiconductor element Test gas concentration air test Pseudocapacitance of metal oxides Oxide Test gas sensitive Sensitive non-metal oxide Oxygen semiconductor Oxidized metal detection semiconductor oxidation dimension oxide semiconductor interface capacitor metal oxide semiconductor oxidation semi-metallic organisms cobalt phosphide semiconductor semi-metal element Sensitive+ metal oxide supercapacitor semimetallic carbene Semiconductor outgassing Outgassing of semiconductor components zn semiconductor element semiconductor gas Semiconductor component gas Metal Oxidation Detection hole-type semimetal Semiconductor Test Technology Detection of metal oxides Detection of gas concentration Detection of gas concentration Test methods for semi-metals semiconductor dioxide semiconductor ca element Atmospheric Oxidation of Metallic Plutonium Metal Oxidation Degree half metal half human Zirconium compound semiconductor metal reoxidation Semimetals and Semiconductor Materials amount of metal gas Gas resolution gas in metal metal oxide semiconductor Gas sensor GBT15653 The properties of metal oxides semiconductor metal elements Zeta potential of metal oxides Oxide devices Metal oxide oxygen element content Use of metal materials in semiconductor equipment parts Semiconductor components Preparation method of compound semiconductor oxide semiconductors to oxygen and carbon dioxide Oxygen test method Water body metal substance standards Compound semiconductor raw material extraction method Silicon carbide bulk metal test method Metal activation energy test Test method for chlorine element in metal coordination compounds Metal oxidation degree What are the methods for measuring metal compounds? gb 15653 Semiconductor chemical purification methods Oxidizing substances test method Metal Oxide Standards Method for testing metal elements in bioglass

《GB/T 15653-1995金属氧化物半导体气敏元件测试方法》由339-1（工业和信息化部（电子））归口，主管部门为工业和信息化部（电子）。
本标准规定了金属氧化物半导体气敏件性能参数测试方法的基本原理，没有规定这些方法在实际使用时的技术细节，测试时可按相应的详细规范的规定进行。本标准适用于金属氧化物半导体气敏件性能参数的测试，其他气敏件亦可参照使用。

Scope

This standard specifies the basic principles of the test methods for performance parameters of metal oxide semiconductor gas sensors (hereinafter referred to as components), and does not specify the technical details of these methods in actual use. The test can be carried out in accordance with the corresponding detailed specifications. This standard applies to the testing of performance parameters of metal oxide semiconductor gas sensors, and other gas sensors can also be used as a reference.

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