GB/T 2423.27-1981 in English
SUPERSEDEDElectric and electronic products--Basic environmental test regulations for electricians--Test Z/AMD: The successive integrated low temperature/low atmospheric pressure/damp-heat method
- Issued on:1981-08-10
- Implemented on:1982-04-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$175.00
《GB/T 2423.27-1981电工电子产品基本环境试验规程 试验Z/AMD:低温/ 低气压 /湿热连续综合试验方法》由TC8（全国电工电子产品环境条件与环境试验标准化技术委员会）归口，主管部门为中国电器工业协会。
Scope
Determine the suitability of the product in a continuum of environments consisting of low temperature, low pressure, and heat and humidity. The object of this test is the product installed in the non-temperature-controlled and non-pressurized area of the aircraft.
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