GB/T 30655-2014 in English
VALIDTest methods for internal quantum efficiency of nitride LED epitaxial layers
- Issued on:2014-12-31
- Implemented on:2015-09-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$146.00
《GB/T 30655-2014氮化物LED外延片内量子效率测试方法》由TC203（全国半导体设备和材料标准化技术委员会）归口，主管部门为国家标准化管理委员会。
本标准规定了Ⅲ-Ⅴ族氮化物 LED外延片内量子效率的测试方法。
本标准适用于基于Ⅲ-Ⅴ族氮化物的量子阱 LED内量子效率的测试。
Scope
This standard specifies the test method for the internal quantum efficiency of III-V nitride LED epitaxial wafers. This standard applies to the test of quantum efficiency in quantum well LEDs based on III-V nitrides.
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