Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)
micro-electromechanical system technology fatigue traditional metal fatigue test fatigue performance evaluation resonant vibration introduction analysis high cycle fatigue phenomenon porous steel strip fe-based amorphous soft magnetic alloy strips chinastandards.net rapid battery replacement technology
GB/T 38447-2020 in English

GB/T 38447-2020 in English

VALID

Micro-electromechanical system technology—Fatigue testing method of MEMS structure using resonant vibration

  • Issued on:2020-03-06
  • Implemented on:2020-07-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $250.00
$243.00
Standard No: GB/T 38447-2020
Document status: VALID
Title in English: Micro-electromechanical system technology—Fatigue testing method of MEMS structure using resonant vibration
Title in Chinese: 微机电系统(MEMS)技术 MEMS结构共振疲劳试验方法
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2020-03-06
Implemented on: 2020-07-01
ICS Classification: 31.200-Integrated circuits. Microelectronics
Chinese Classification: L55-Microcircuit in general
Professional Classification: GB-National Standard
Related Keywords: micro-electromechanical system technology fatigue
traditional metal fatigue test
fatigue performance evaluation
resonant vibration introduction analysis
high cycle fatigue phenomenon
Related Topics: MEMS
mems
Electronic fatigue testing machine
Fatigue Test Standard
Micro fatigue testing machine
resonance
Micro fatigue testing machine
Fatigue testing machine series
Fatigue testing machine series
Component Fatigue Test System
labor
stress test
resonator
resonance structure
resonance structure
mems technology
Electromagnetic Miniature Fatigue Testing Machine
mems technology
Fatigue test method
structural resonance
Material Structural Resonance
Measuring resonance
structural resonance
Resonance test method
Electromagnetic fatigue testing machine
resonator method
Resonance capacitor
Structural Resonance Method
mems micro motor
Electromagnetic Fatigue Test System
mems micro motor
mems test system
microsystem technology
GBT38447
GB/T 38447-2020
fatigue
Low-cycle fatigue test method for CB/Z submarine structural model
Electromechanical
Micro motor technology

《GB/T 38447-2020微机电系统(MEMS)技术 MEMS结构共振疲劳试验方法》由TC336(全国微机电技术标准化技术委员会)归口,主管部门为国家标准化管理委员会。


Introduction

Analysis of the core content of the standard

Scope of application and technical characteristics

This standard is applicable to the fatigue performance evaluation of MEMS structures in a resonant state, focusing on solving the long-term reliability problem of micron-scale structures. By precisely controlling the vibration amplitude (±3% accuracy) and frequency stability, an accelerated aging test equivalent to actual working conditions is achieved.


Comparison of key test elements

Elements Requirements Technical difficulties
Excitation mode Electrostatic/piezoelectric/electromagnetic, etc. Microscale force loading accuracy control
Amplitude control 50-100% of reference strength Compensation for discrete strength of brittle materials
Failure judgment Frequency deviation>3% or fracture Online monitoring of micro damage

Implementation points and cases

Silicon-based MEMS actuator test example

An electrostatically driven micromirror adopts the integrated detection scheme in Appendix A, at a resonant frequency of 39kHz:

  • Automatic gain control is used to keep the amplitude fluctuation less than 2%
  • Step stress loading is used (10MPa per level)
  • Humidity is controlled at 50%±1% to avoid environmental interference

The test data is consistent with the prediction of Paris' law, verifying the applicability of the crack growth theory.


Technology Evolution Analysis

Compared with the traditional metal fatigue test (GB/T 24176), the innovations of this standard are:

  1. Introducing resonance mode coupling to solve the problem of insufficient microstructure driving force
  2. Using online frequency tracking to compensate for the influence of temperature drift
  3. Establishing the Weibull-Paris composite model of silicon material to explain the high cycle fatigue phenomenon

Sample only — not a preview of GB/T 38447-2020
Page: 1 / 0
100%

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

  • GB/T 43931-2024 in English

    GB/T 43931-2024 in English

    General specification for microwave integrated circuit chip for aerospace

    2024-06-29
  • GB/T 7092-2021 in English

    GB/T 7092-2021 in English

    Outline dimensions of semiconductor integrated circuits

    2021-03-09
  • GB/T 34898-2017 in English

    GB/T 34898-2017 in English

    Micro electromechanical system technology-Test method for the nonlinear vibration of the MEMS resonant sensitive element

    2017-11-01
  • GB/T 42972-2023 in English

    GB/T 42972-2023 in English

    Microwave circuits—Test methods for detector

    2023-09-07
  • GB/T 26112-2010 in English

    GB/T 26112-2010 in English

    Micro-electromechanical system technology—General rules for the assessment of micro-mechanical parameters

    2011-01-10
  • GB/T 38446-2020 in English

    GB/T 38446-2020 in English

    Micro-electromechanical system technology—Test methods for tensile property measurement of strip thin films

    2020-03-06
  • GB/T 17023-1997 in English

    GB/T 17023-1997 in English

    Semiconductor devices Integrated circuits - Part 2: Digital integrated circuits Section two - Family specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74

    1997-10-07
  • GB/T 32814-2016 in English

    GB/T 32814-2016 in English

    Fabrication Technology of Silicon Based MEMS Process Specification Based on SOI Silicon

    2016-08-29
  • GB/T 19248-2003 in English

    GB/T 19248-2003 in English

    Test method for measuring the resistance of package leads

    2003-07-02