GB/T 38447-2020 in English
VALIDMicro-electromechanical system technology—Fatigue testing method of MEMS structure using resonant vibration
- Issued on:2020-03-06
- Implemented on:2020-07-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$243.00
《GB/T 38447-2020微机电系统(MEMS)技术 MEMS结构共振疲劳试验方法》由TC336(全国微机电技术标准化技术委员会)归口,主管部门为国家标准化管理委员会。
Introduction
Analysis of the core content of the standard
Scope of application and technical characteristics
This standard is applicable to the fatigue performance evaluation of MEMS structures in a resonant state, focusing on solving the long-term reliability problem of micron-scale structures. By precisely controlling the vibration amplitude (±3% accuracy) and frequency stability, an accelerated aging test equivalent to actual working conditions is achieved.
Comparison of key test elements
| Elements | Requirements | Technical difficulties |
|---|---|---|
| Excitation mode | Electrostatic/piezoelectric/electromagnetic, etc. | Microscale force loading accuracy control |
| Amplitude control | 50-100% of reference strength | Compensation for discrete strength of brittle materials |
| Failure judgment | Frequency deviation>3% or fracture | Online monitoring of micro damage |
Implementation points and cases
Silicon-based MEMS actuator test example
An electrostatically driven micromirror adopts the integrated detection scheme in Appendix A, at a resonant frequency of 39kHz:
- Automatic gain control is used to keep the amplitude fluctuation less than 2%
- Step stress loading is used (10MPa per level)
- Humidity is controlled at 50%±1% to avoid environmental interference
The test data is consistent with the prediction of Paris' law, verifying the applicability of the crack growth theory.
Technology Evolution Analysis
Compared with the traditional metal fatigue test (GB/T 24176), the innovations of this standard are:
- Introducing resonance mode coupling to solve the problem of insufficient microstructure driving force
- Using online frequency tracking to compensate for the influence of temperature drift
- Establishing the Weibull-Paris composite model of silicon material to explain the high cycle fatigue phenomenon

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