GB/T 41805-2022 in English

VALID

Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging

Issued on:2022-10-12
Implemented on:2023-05-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $250.00
$243.00

Standard No:	GB/T 41805-2022
Document status:	VALID
Title in English:	Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging
Title in Chinese:	光学元件表面疵病定量检测方法显微散射暗场成像法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2022-10-12
Implemented on:	2023-05-01
ICS Classification:	81.040.01-Glass in general
Chinese Classification:	N05-Material and component for instrument and meter
Professional Classification:	GB-National Standard
Related Keywords:	digital inspection system dark-field imaging introduction core interpretation quantitative inspection technical specifications microscopic traditional visual inspection methods
Related Topics:	quantitative method Optical element scattering Quantitative detection Quantitative detection dark field imaging Optical Inspection Microscopy dark field Optical Inspection Microscopy optical imaging system Dark field imaging Near field imaging Quantitative detection method dark field imaging quantitative method Microscopic imaging microscope dark field Microscopic Imaging System optical imaging system imaging samples Surface Test Method Microdisc Microscopic Imaging System Optical microscopy Various optical components Microscopic imaging microscope dark field scattered field dark field test Scattering component Micro Disperser Microscope dark field with quantitative standard imaging optics pixel pixel Imaging and quantification autoradiographic imaging Chemical Composition Determination Surface microscopic measurement method Scatter imaging Scatter imaging Trace zinc detection method dark field light microscopic defect near-field microscopy diffuse near-field optics diffuse near-field microscopy dark field conditions optical quantification Imaging English surface quantification Surface Microsystem Dark field imaging Near field imaging electric field imaging autoradiographic imaging The imaging must be dark around field imaging spectroscopy GB/T 41805 GB/T 41805-2022 What are the electrochemical methods for trace element detection? Microscope software customization Method for detecting medium thickness of optical components Reading burette in the dark Small animal imaging quantification Chemical element detection methods Principles of Trace Element Detection Methodology Microinjection is a physical method Quantitative detection method using evaporative light scattering detector Spectral disease detection method Imaging field of view test Application of photoresist and flow imaging methods In vivo imager detection method Optical component surface defects Optical imaging measurement Optical imaging intensity measurement Dispersion detection method How to adjust the microscope image when it is too dark

《GB/T 41805-2022光学元件表面疵病定量检测方法显微散射暗场成像法》由TC103（全国光学和光子学标准化技术委员会）归口，TC103SC5（全国光学和光子学标准化技术委员会光学材料和元件分会）执行，主管部门为中国兵器工业集团公司。

Introduction

Core interpretation of technical specifications

Microscopic scattering dark field imaging system breaks through the limitations of traditional visual inspection methods. It establishes a digital inspection system through an annular light source and a scientific-grade camera. The recognition accuracy reaches 0.014mm (see Appendix C electron microscope diagram), realizing the precise calculation of pit diameter and scratch width.

Key Technical Parameters Comparison Table

Detection Module	No. 1 Standard Plate Requirements	Typical Values for Industrial Applications
Imaging Resolution	≤3μm	2.5μm
Light Source Illumination Stability	≤2%	±1% (Temperature Controlled LED Solution)

Analysis of Digital Detection Process Evolution

Image Algorithm Processing Chain

Denoising preprocessing: Gaussian filtering is used to eliminate ambient light interference
Dynamic threshold segmentation: Adaptively determine the binary boundary
Morphological feature extraction: Calculate the ratio of the connected domain area to the perimeter

Core technology formula:
R = C²/N, when R>649, it is judged as a long scratch with an accuracy of 97.3%

Test system validation requirements

Laboratory environment calibration

Temperature control: 23±1℃ constant temperature system
Humidity monitoring: Industrial-grade humidity sensor Real-time recording

Implementation and application suggestions

Production line adaptation specifications

Precision guide platform: Positioning accuracy ≤5μm, repeatability ≤2μm
Sub-aperture stitching algorithm: At least 20% area overlap to ensure big data fusion

More samples: GB 18306-2015 DL/T 368-2010 JGJ 94-2008

Sample only — not a preview of GB/T 41805-2022

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