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Database: 365,228(8 Aug 2026)

microscopic defect

microscopic defect, Total:37 items.

The international standard classification for "microscopic defect" includes: Ophthalmic equipment , Protection against crime , Optical equipment , Glass in general .

The Chinese standard classification for "microscopic defect" includes: Medical optical instrument and endoscope , Crime judging technology , Magnifier and microscope , Material and component for instrument and meter .


Professional Standard - Medicine

Professional Standard - Public Safety Standards

  • GA/T 1670-2019 Forensic sciences—General technical specifications for comparison microscopes

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Professional Standard - Machinery

  • JB/T 7811-1995 Technical delivery conditions for popular biological microscopes

IN-BIS

International Organization for Standardization (ISO)

British Standards Institution (BSI)

  • BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
  • BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
  • BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
  • BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
  • BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
  • BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
  • BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
  • 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
  • 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
  • BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
  • BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
  • BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan

Japanese Industrial Standards Committee (JISC)

Korean Agency for Technology and Standards (KATS)

SCC

HU-MSZT