Surface Microsystem

Surface Microsystem, Total:144 items.

The international standard classification for "Surface Microsystem" includes: Chemical analysis , Optical equipment , Testing of metals , Glass in general , Integrated circuits. Microelectronics , Navigation and control equipment .

The Chinese standard classification for "Surface Microsystem" includes: Basic standards and general methods , Magnifier and microscope , Metal physical property test method , Material and component for instrument and meter , Microcircuit in general , Mechanics Measurement , Electric control devices and measurement equipment for vessel .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 34899-2017 Micro-electromechanical system technology-Measuring method of microstructure surface stress based on Raman spectroscopy
GB 2609-1981 Object lens for microscopes series
GB 9247-1988 Microscopes--Series of condensers
GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
GB/T 31226-2014 Standard test method for determination of surface roughness by scanning tunneling microscopy for gas distribution system components
GB/T 22461.2-2023 Surface chemical analysis—Vocabulary—Part 2:Terms used in scanning probe microscopy
GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
GB 9246-1988 Microscopes--Series of oculars(eyepieces)
GB/T 22061-2008 Microscopes - Reference system of polarized light microscopy
GB/T 41805-2022 Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging

Professional Standard - Machinery

JB/T 8380-1996 Polarizing Microscope Reference System

Group Standards of the People's Republic of China

T/SPSTS 031-2023 Graphene Material Surface Potential Measurement Atomic Force Microscopy
T/CSIQ 3101-2015 Stereo microscope method for testing surface microstructure of ceramic works of art
T/DASI 019-2022 Cast-in-place microporous water-conducting pavement (ground) system

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG 2025-1989 Measuring Instruments for Microhardness

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39213-2020 Dredging track and profile monitor

机械工业部

JB/T 8230.10-1995 Microscope condenser series
JB/T 8230.9-1995 Microscope eyepiece series
JB/T 8230.2-1995 Microscope objective lens series

未注明发布机构

JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
ISO 643:2019/Amd 1:2020 Steels — Micrographic determination of the apparent grain size

未注明发布机构

JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
ISO 643:2019/Amd 1:2020 Steels — Micrographic determination of the apparent grain size

British Standards Institution (BSI)

BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
BS ISO 18337:2015 Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
BS ISO 9345-2:2014 Microscopes. Imaging distances related to mechanical reference planes. Infinity-corrected optical systems
BS ISO 23124:2024 Surface chemical analysis. Measurement of lateral and axial resolutions of a Raman microscope
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
BS 7011-2.2:1998 Consumable accessories for light microscopes. Slides. Specification for materials and quality of finish
BS EN ISO 643:2020 Steels. Micrographic determination of the apparent grain size
BS EN ISO 643:2012 Steels. Micrographic determination of the apparent grain size
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
BS EN ISO 945:1994 Cast iron - Designation of microstructure of graphite
BS EN ISO 25178-607:2019 Geometrical product specifications (GPS). Surface texture: Areal - Nominal characteristics of non-contact (confocal microscopy) instruments

SCC

AWWA WQTC55011 Characterizing Corroded Surfaces by Using High Resolution Light Microscopy
BS 7012-8:1990 Light microscopes-Specification for surface marked graticules for eyepieces
11/30199166 DC BS ISO 11952. Surface chemical analysis. Scanning probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
AWWA WQTC50454 A Systematic Study on the Surface Charge of Microorganisms in Drinking Water
BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
AWWA JAW30339 Journal AWWA — Association of Microorganisms With Surfaces in Distribution Systems
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS 7011-3-3.2:1990 Consumable accessories for light microscopes. Cover glasses-Specification for materials and quality of finish
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS 6054-1:1981 Glossary of terms for micrographics-General terms
12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
BS 6054-3:1984 Glossary of terms for micrographics-Film processing
CSA C22.2 No.62-1993(R2022) Surface Raceway Systems
BS EN ISO 643:2003 Steels. Micrographic determination of the apparent grain size
DANSK DS/ISO 643:2020 Steels – Micrographic determination of the apparent grain size
10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS 6054-4:1987 Glossary of terms for micrographics-Materials and packaging
BS 7011-3.2:1998 Consumable accessories for light microscopes. Cover glasses-Specification for materials and quality of finish
BS 7011-2-2.2:1990 Consumable accessories for light microscopes. Slides-Specification for materials and quality of finish
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

International Organization for Standardization (ISO)

ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
ISO 18337:2015 Surface chemical analysis - Surface characterization - Measurement of the lateral resolution of a confocal fluorescence microscope
ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 23124:2024 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
ISO/DIS 23124:2023 Surface Chemical Analysis — Measurement of lateral and axial resolutions of Raman microscope
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO/FDIS 23124:2023 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO/CD 643 Steels — Micrographic determination of the apparent grain size
ISO/DIS 643:2023 Steels — Micrographic determination of the apparent grain size
ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants

PT-IPQ

E 308-1975 Electrolytic surface of nickel and chromium. Determination of nickel surface thickness. microscopic observation

GSO

GSO ISO 11952:2015 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
BH GSO ISO 11952:2017 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
GSO ISO 8576:2015 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
OS GSO ISO 11952:2015 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
GSO ISO 9345-2:2014 Microscopes -- Imaging distances related to mechanical reference planes -- Part 2: Infinity-corrected optical systems
GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 27911:2013 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
GSO ISO 3057:2013 Non-destructive testing -- Metallographic replica techniques of surface examination
GSO ISO 11775:2021 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
BH GSO ISO 11775:2022 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants

RU-GOST R

GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOST R ISO 643-2015 Steels. Micrographic determination of the apparent grain size
GOST R ISO 643-2011 Steels. Micrographic determination of the apparent grain size

German Institute for Standardization

DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN V 32938:1998 Surface profiling by means of optical microscopic methods - Concepts and measurement procedures
DIN ISO 8576:2002 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
DIN EN ISO 643:2020-06 Steels - Micrographic determination of the apparent grain size (ISO 643:2019, Corrected version 2020-03); German version EN ISO 643:2020
DIN EN ISO 643:2003 Steels - Micrographic determination of the apparent grain size (ISO 643:2003); German version EN ISO 643:2003

Korean Agency for Technology and Standards (KATS)

KS B ISO 8576:2006 Optics and optical instruments－Microscopes－Reference system of polarized light microscopy
KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
KS B 0161-1999(2009) Surface roughness－Definitions and designation

KR-KS

KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy

American Society for Testing and Materials (ASTM)

ASTM F1438-93(2005) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM F1438-93(1999) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM F1438-93(2020) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM F1438-93(2012) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

Japanese Industrial Standards Committee (JISC)

JIS B 7251:2000 Reference system of polarized light microscopy
JIS G 0551:2013 Steels.Micrographic determination of the apparent grain size
JIS G 0551:2020 Steels -- Micrographic determination of the apparent grain size
JIS G 0551:2005 Steels -- Micrographic determination of the apparent grain size
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy

Association Francaise de Normalisation

NF B35-600*NF EN ISO 10991:2010 Micro process engineering - Vocabulary
NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
NF EN ISO 25178-607:2019 Geometrical product specification (GPS) - Surface finish: Surface - Part 607: nominal characteristics of non-contact instruments (confocal microscopy)
NF A04-102:2003 Steels - Micrographic determination of the apparent grain size.
NF A04-102:2013 Steels - Micrographic determination of the apparent grain size

IX-UIC

UIC OR 612-05-2012 Display system in driver cabs (DDS) - Electronic timetable display (ETD)

SAE - SAE International

SAE AS6296-2016 Electronic Flight Instrument System (EFIS) Displays

CZ-CSN

CSN 73 1331-1974 Microscopical analysis of the air-void systém in hardened concrete

European Committee for Standardization (CEN)

EN 945:1994 Cast Iron - Designation of Microstructure of Graphite

Danish Standards Foundation

DS/EN ISO 945:1994 Cast iron-Designation of microstructure of graphite

SE-SIS

SIS SS 11 11 14-1984 Steel — Determination of slag inclusions — Microscopic methods — Manual representation

Society of Automotive Engineers (SAE)

SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems