diffuse near-field microscopy
diffuse near-field microscopy, Total:55 items.
The international standard classification for "diffuse near-field microscopy" includes: Glass in general , Physicochemical methods of analysis , Chemical analysis .
The Chinese standard classification for "diffuse near-field microscopy" includes: Material and component for instrument and meter , Electron optics and other physical optics instrument , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32869-2016 Nanotechnologies-Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 41805-2022 Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging
Military Standard of the People's Republic of China-General Armament Department
- GJB 7955-2012 Step measurement method for dynamic electromagnetic scattering of near field targets
- GJB 6924-2009 The measurement methods for near field electromagnetic scattering of simulated sea surface
- GJB 6179-2007 The quasi-dynamic measuring methods of Near Field electromagnetic scattering characteristics for full scale targets
- GJB 6182-2007 The radiation measuring methods of targets on microwave or millimeter wave in near field
- GJB 6924A-2021 Simulation test method for near-field electromagnetic scattering characteristics of target and sea surface background
- GJB 6637-2008 The quasi-dynamic measurements method for electromagnetic scattering of scale target in near field
- GJB 6182A-2021 Target and its environment near-field microwave; millimeter wave radiation characteristics test method
Heilongjiang Provincial Standard of the People's Republic of China
- DB23/T 1525-2013 Basic Requirements for Reflective Fluorescence Confocal Microscopy
Group Standards of the People's Republic of China
- T/CASMES 217-2023 Portable Field Microvickers hardness tester BXLB100
Professional Standard - Machinery
- JB/T 5383-1991 Specification for Transmission Electron Microscope
未注明发布机构
- GJB 6923-2009 Test method for ground background near-field microwave and millimeter wave radiation characteristics
- ASTM RR-D05-1043 2014 D7708-Test Method for Microscopical Determination of the Reflectance of Vitrinite Dispersed in Sedimentary Rocks
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Professional Standard - Post and Telecommunication
- YD/T 2497-2013 Mobile payment - Technical requirements for contactless radio frequency interface based on 13.56MHz near field communication technology
Professional Standard - Energy
- NB/T 10462-2020 AC-DC switching power supply-Technology specification for near field radiated, radio-frequency, electromagnetic field immunity test
Korean Agency for Technology and Standards (KATS)
- KS D 2713-2006 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
- KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
British Standards Institution (BSI)
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
International Organization for Standardization (ISO)
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GSO
- BH GSO ISO 27911:2016 Surface chemical analysis -- Scanning-probe microscopy -- Definition and calibration of the lateral resolution of a near-field optical microscope
American Society for Testing and Materials (ASTM)
- ASTM E883-11(2017) Standard Guide for Reflected–Light Photomicrography
- ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM E883-11(2024) Standard Guide for Reflected–Light Photomicrography
- ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM D7708-14 Standard Test Method for Microscopical Determination of the Reflectance of Vitrinite Dispersed in Sedimentary Rocks
- ASTM D7708-23 Standard Test Method for Microscopical Determination of the Reflectance of Vitrinite Dispersed in Sedimentary Rocks
- ASTM D7708-11 Standard Test Method for Microscopical Determination of the Reflectance of Vitrinite Dispersed in Sedimentary Rocks
- ASTM D7708-23a Standard Test Method for Microscopical Determination of the Reflectance of Vitrinite Dispersed in Sedimentary Rocks
TIA - Telecommunications Industry Association
- TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
- TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
SCC
- 10/30165036 DC BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
American National Standards Institute （ANSI)
- ANSI/TIA/EIA 573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
RU-GOST R
- GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
GOSTR
- PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
- PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
Japanese Industrial Standards Committee (JISC)
- JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
- JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Association Francaise de Normalisation
- FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
