GB/T 4937.4-2012 in English

VALID

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Issued on:2012-11-05
Implemented on:2013-02-15
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $120.00
$117.00

Standard No:	GB/T 4937.4-2012
Document status:	VALID
Title in English:	Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Title in Chinese:	半导体器件机械和气候试验方法第4部分：强加速稳态湿热试验（HAST）
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2012-11-05
Implemented on:	2013-02-15
ICS Classification:	31.080.01-Semiconductor devices in general
Chinese Classification:	L40-Semiconductor discrete devices in general
Professional Classification:	GB-National Standard
Related Keywords:	steady state damp heat test accelerated stress test climatic test methods semiconductor devices damp heat
Related Topics:	steady state damp heat Steady state damp heat test Steady state test to speed up climate test Damp heat test Mechanical and climatic test methods for semiconductor devices Plastic packaged device GB/T 4937.4 HAST GB/T 4937.4 GBT4937.4v GB/T 4937.4-2012 GB/T 4937.4-2012v Accelerated Steady State Damp Heat Test Steady state damp heat test method

《GB/T 4937.4-2012半导体器件机械和气候试验方法第4部分：强加速稳态湿热试验（HAST）》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。

Scope

This part of GB/T 4937 is an overcurrent highly accelerated steady state damp heat test (HAST) method, which is used to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

More samples: DL/T 368-2010 GB 50021-2001(2009) JJG 21-2008

Sample only — not a preview of GB/T 4937.4-2012

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