GB/T 6624-1995 in English

SUPERSEDED

Standard method for measuring the surface quality of polished silicon slices by visual inspection

Issued on:1995-04-18
Implemented on:1995-01-02
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $180.00
$175.00

Standard No:	GB/T 6624-1995
Document status:	SUPERSEDED
Superseded by:	GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection
Superseded on:	2010-06-01
Title in English:	Standard method for measuring the surface quality of polished silicon slices by visual inspection
Title in Chinese:	硅抛光片表面质量目测检验方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1995-04-18
Implemented on:	1995-01-02
Chinese Classification:	H21-Metal physical property test method
Professional Classification:	GB-National Standard
Related Keywords:	polished silicon slices surface quality inspection surface quality standard method polished wafers
Related Topics:	polishing visual inspection surface quality vs. Silicon Surface Inspection wafer surface peak Silicon Wafer Inspection Method Light sheet detection Surface amount Test Quality Objectives One eye water quality testing Spotlight Surface film detection Mesh measurement method Surface energy detection After visual inspection Bread detection method Water quality detection method Spectral detection Silicone detection method Silicon sphere surface Water quality testing category visual inspection Material surface detection method Mesh measurement method Test Quality Objectives mesh measurement method Surface Inspection Applications visual inspection Test Objectives and Test Quality Objectives Test Checklist Water quality mesh detection Mesh detection method Detection method of silicon in water How to detect mesh silicon detector Detection of surface energy surface detector Test Checklist Surface fe detection Photometric detection Material Surface Measurement Methods Surface Quality GBT6624 GBT6624-1995 GB/T 6624-2009 Aluminum Surface Quality Silicon polished wafer Optical double-sided polished aperture New method of metallographic polishing Silica gel detection method Plasmid quality detection methods Testing method for gluten water absorption polishing disc Method for detecting impurities on rubber block surface Electropolishing inspection method Polishing powder quality Titanium silicon inspection Quality inspection methods for silica Detection of bulk metal impurities in silicon wafers How to determine the quantitative limit of the photometer test method Detection method for silicone content Quality inspection methods for wide-body vehicles Sample installation method for surface photovoltage and longitudinal photocurrent measurement Validation of flow cytometry phenotypic detection methodology Validation of tablet test methods Measurement method of trace amounts of silicon Shrapnel overcurrent detection method How to use texture analyzer to detect bread Filter detection method Illustration of filter detection method Testing methods for gluten quality Metallographic polishing method Tablet testing methods Silicon powder content on silicon wafer surface gb/t 6624 gb/t6624 gb/t6624-1995 Characterization methods of silicon quantum dots

《GB/T 6624-1995硅抛光片表面质量目测检验方法》由TC203（全国半导体设备和材料标准化技术委员会）归口，主管部门为国家标准化管理委员会。
本标准规定了在一定光照条件下，用目测检验硅单晶单面抛光片表面质量的方法。本标准适用于硅抛光片表面质量检验。

Scope

This standard specifies the method for visually inspecting the surface quality of silicon single crystal single-sided polished wafers (hereinafter referred to as polished wafers) under certain lighting conditions. This standard applies to the surface quality inspection of silicon polished wafers.

More samples: NB/T 47013.2-2015 GB 50021-2001(2009) YD/T 3934-2021

Sample only — not a preview of GB/T 6624-1995

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