SN/T 2011-2007 in English
VALIDElectronic (capacitive) testing method for raw silk
- Issued on:2007-12-24
- Implemented on:2008-07-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$146.00
Scope
This standard specifies the method for detecting raw silk and classifying defects using capacitive electronic detectors. This standard is applicable to the detection of skeined and packaged raw silk in sizes 13D~69D.

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