Rationale for Testing

Rationale for Testing, Total:33 items.

The international standard classification for "Rationale for Testing" includes: Integrated circuits. Microelectronics , Electronic tubes , Semiconductor devices in general .

The Chinese standard classification for "Rationale for Testing" includes: Microcircuit in general , Semiconductor integrated circuit , Technical management , Technical management .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
GB/T 4377-1996 Semiconductor integrated circuits-General principles of measuring methods of voltage regulator
GB/T 14030-1992 principles of measuring methods of timer circuits for semiconductor integrated circuits
GB/T 14114-1993 principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
GB/T 14029-1992 principles of measuring methods of analogue multiplier for semiconductor integrated circuits
GB/T 14028-1992 principles of measuring methods of analogue switches for semiconductor integrated circuits
GB/T 14115-1993 principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
GB/T 14031-1992 principles of measruing methods of analogue phase - Loop for semiconductor integrated circuits

Professional Standard - Electron

SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
SJ/T 10802-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
SJ/T 10739-1996 Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
SJ/T 10806-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for display drivers
SJ/T 10805-2000 Semiconductor integrated circuits - General principles of measuring methods for voltage comparators
SJ/T 10881-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
SJ/T 10400-1993 General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
SJ/T 10402-1993 General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
SJ/T 10804-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator
SJ/T 10801-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for magnetic memory drivers
SJ 2480-1984 General principles of static measurement for D/A converters for hybrid integrated circuits
SJ/T 10879-1996 Semiconductor integrated audio circuits - General principles of measuring methods for audio preamplifiers
SJ/T 10427.2-1993 General principles of measuring methods of intermediate-frequency amplifier for semiconductor audio integrated circuits
SJ/T 10401-1993 General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
SJ/T 10880-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
SJ/T 10818-1996 Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits
SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
SJ/T 10800-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for sense amplifiers
SJ/T 10804-2000 Semiconductor integrated circuits.General principles of measuring methods for level translator
SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits
SJ/T 10427.1-1993 Grneral Principles of measuring methods of FM converter for semiconductor audio integrated circuits
SJ 2481-1984 General principles of static measurement for A/D converters for hybrid integrated circuits

SCC

DANSK DS/EN 1288-1:2001 Glass in building - Determination of the bending strength of glass - Part 1: Fundamentals of testing glass