GB/T 14031-1992 in English

VALID

principles of measruing methods of analogue phase - Loop for semiconductor integrated circuits

Issued on:1992-01-02
Implemented on:1993-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $210.00
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Standard No:	GB/T 14031-1992
Document status:	VALID
Title in English:	principles of measruing methods of analogue phase - Loop for semiconductor integrated circuits
Title in Chinese:	半导体集成电路模拟锁相环测试方法的基本原理
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1992-01-02
Implemented on:	1993-08-01
ICS Classification:	31.200-Integrated circuits. Microelectronics
Chinese Classification:	L55-Microcircuit in general
Professional Classification:	GB-National Standard
Related Keywords:	electrical parameter test methods basic principles analogue phase circuits scopethis standard methods
Related Topics:	Fundamental Ring single-mode principle original semi-dry principle test mock test semiconductor integrated circuit Demodulation principle atomic simulation semi-preparation principle PLL Principle of gas composition basic principles Fundamentals of the indirect method The principle of semi-preparation Integrated Circuit Testing Principles and Methods Principles of Semiconductor Testing Rationale for Testing Semiconductor Kelvin Test Principle Principle of side voltage test Semiconductor Kelvin Test Principle GBT14031 GB/T 14031-1992 The principle of semi-solid Semiconductor integrated circuit driving test method Test method for semiconductor integrated circuit driver Working principle of semiconductor brushing machine How battery simulator works Solid phase synthesizer principle ECV testing principle HPLC conductivity detector principle Hipot measuring cell short circuit principle Basic principles of conductometric concentration determination Battery cell HIPOT test principle Loop tester principle Basic principles of cross-linking modification methods Integrated circuit testing related Basic methods of solid phase hybridization Open circuit potential test principles and methods Measurement methods and principles of conductivity Conductive properties of collector ring Principle of protoplast fusion method How to connect hapten to carrier Methods and principles of protoplast fusion Basic methods and principles of turbidity measurement

《GB/T 14031-1992半导体集成电路模拟锁相环测试方法的基本原理》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
本标准规定了半导体集成电路模拟锁相环电参数测试方法的基本原理。模拟锁相环与数字电路相同的静态和动态参数测试可参照GB3439《半导体集成电路TTL电路测试方法的基本原理》。

Scope

This standard specifies the basic principles of the electrical parameter test methods for semiconductor integrated circuit analog phase-locked loops (hereinafter referred to as devices or analog phase-locked loops).

More samples: JJG 21-2008 DL/T 5154-2012 DL/T 368-2010

Sample only — not a preview of GB/T 14031-1992

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