dual plasma mass spectrometer
dual plasma mass spectrometer, Total:38 items.
The international standard classification for "dual plasma mass spectrometer" includes: Chemical laboratories. Laboratory equipment , Semiconducting materials , Chemical reagents , Other standards related to optics and optical measurements , Chemical analysis .
The Chinese standard classification for "dual plasma mass spectrometer" includes: Chemical Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Semimetal and semiconductor material in general , chromatograph , Basic standards and general methods , Hydrogeological survey .
Professional Standard - Medicine
- YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry
Professional Standard - Agriculture
- 53药典 四部-2020 0412 Inductively coupled plasma mass spectrometry
- 73药典 四部-2015 0412 Inductively coupled plasma mass spectrometry
- JJF 2115-2024 Liquid chromatography-inductively coupled plasma mass spectrometry instrument calibration specification
- JJG(教委) 015-1996 Verification Regulations for Inductively Coupled Plasma Atomic Emission Spectrometer
- 1807药典 一部-2010 Appendix XI D Inductively Coupled Plasma Mass Spectrometry
National Metrological Technical Specifications of the People's Republic of China
- JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 36244-2018 Inductively coupled plasma atomic emission spectrometer
- GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- GB/T 36240-2018 Ion chromatographs
Group Standards of the People's Republic of China
- T/CIMA 0023-2020 Technical requirements for vehicle-mounted inductively coupled plasma quadrupole mass spectrometer
- T/DLAS 004-2021 Determination of five kinds of selenium in selenium-enriched agricultural products by ion chromatography-inductively coupled plasma mass spectrometry
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1015-1990 Verification regulations for inductively coupled plasma direct reading spectrometer
Professional Standard - Commodity Inspection
- SN/T 2210-2008 Determination of hexavalent chromium in health foods - IC-ICP-MS method
工业和信息化部
- SJ/T 11637-2016 General principles of inductively coupled plasma mass spectrometry for electronic chemicals
Professional Standard - Geology
- DZ/T 0064.80-1993 Groundwater quality test methods - the determination of lithium and other 39 elements with plasma-mass spectroscopy
International Organization for Standardization (ISO)
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Japanese Industrial Standards Committee (JISC)
- JIS K 0133:2000 General rules for high frequency plasma mass spectrometry
- JIS K 0133:2007 General rules for high frequency plasma mass spectrometry
- JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- JIS H 1632-3:2014 Titanium.ICP atomic emission spectrometry.Part 3: Determination of boron
GSO
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- GSO ISO 26062:2013 Nuclear technology -- Nuclear fuels -- Procedures for the measurement of elemental impurities in uranium- and plutonium-based materials by inductively coupled plasma mass spectrometry
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
German Institute for Standardization
- DIN EN ISO 17294-1:2022-07 Water quality - Application of inductively coupled plasma mass spectrometry (ICP-MS) - Part 1: General guidelines (ISO/DIS 17294-1:2022); German and English version prEN ISO 17294-1:2022 / Note: Date of issue 2022-06-17*Intended as replacement for DIN ...
Korean Agency for Technology and Standards (KATS)
- KS I ISO 17294:2014 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
- KS I ISO 17294-2014(2021) Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
- KS I ISO 17294-2021 Water quality — Application of inductively coupled plasma mass spectrometry(ICP-MS)
British Standards Institution (BSI)
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
American Society for Testing and Materials (ASTM)
- ASTM D5673-03 Standard Test Method for Elements in Water by Inductively Coupled Plasma8212;Mass Spectrometry
- ASTM D5673-05 Standard Test Method for Elements in Water by Inductively Coupled Plasma-Mass Spectrometry
- ASTM D5673-02 Standard Test Method for Elements in Water by Inductively Coupled Plasma8212;Mass Spectrometry
- ASTM D5673-96 Standard Test Method for Elements in Water by Inductively Coupled Plasma8212;Mass Spectrometry
SCC
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
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