Handheld four-probe

Handheld four-probe, Total:42 items.

The international standard classification for "Handheld four-probe" includes: Electricity. Magnetism. Electrical and magnetic measurements , Testing of metals , Carbon materials , Protection against crime , Other methods of testing of metals , Chemical analysis of metals , Dental equipment .

The Chinese standard classification for "Handheld four-probe" includes: Technical management , Radio Measurement , Metal physical property test method , Oxide and elementary substance , Guard and alarm system , Semimetal and semiconductor material analysis method , Stomatologic device, equipment and material .

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Professional Standard - Electron

• SJ/T 31122-1994 Requirements of readiness and methods of inspection and assessment for four-point probes
• SJ/T 10315-1992 Generic specification for Four-point probe
• SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe

National Metrological Verification Regulations of the People's Republic of China

• JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
• JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
• GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
• GB 12899-2018 General specification for hand-held metal detector

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB 12899-2018(英文版) General technical specifications for handheld metal detectors
• GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
• GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
• GB 12899-2003 General specification for hand-held metal detector
• GB 12899-1991 Specification for hand-held metal detectors
• GB 5666-1985 Dental explorers

Jiangsu Provincial Standard of the People's Republic of China

• DB32/T 4027-2021 Dynamic four-probe method for the determination of electrical conductivity of graphene powder

Group Standards of the People's Republic of China

• T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method
• T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
• T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method

Hebei Provincial Standard of the People's Republic of China

• DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method

Professional Standard - Ferrous Metallurgy

• YB/T 6166-2024 Graphene film sheet resistance measurement four-probe method

Taiwan Provincial Standard of the People's Republic of China

• CNS 6288-1989 Probes

Professional Standard - Medicine

• YY/T 1014-2013 Dental explorers
• YY 91014-1999 Dental explorers
• YY 91914-1999 Dental probe

HU-MSZT

• MNOSZ 15513-1955 Surgical instruments. probe
• MNOSZ 15510-1955 Surgical instruments. uterine probe
• MNOSZ 15544-1953 Surgical instrument Payr type probe
• MNOSZ 4092-1951 Surgical instrument button-shaped needle probe
• MNOSZ 4093-1951 Surgical instruments (for injuries, etc.) needle probes
• MSZ 12192-1981 dental probe

Korean Agency for Technology and Standards (KATS)

• KS P 2011-2023 Surgical needle holders
• KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
• KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• KS P 2014-2006 Probes
• KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
• KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE

SCC

• DIN EN 61010-031 E:2011 Draft Document - Safety requirements for hand-held probe assemblies for electrical measurement and test - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test (IEC 66/446A/CD:2011)

RU-GOST R

• GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method

Japanese Industrial Standards Committee (JISC)

• JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
• JIS T 2605:1953 Probes

IN-BIS

• IS 12126-1987 Specification for handheld metal detectors (frisks) for weapons detection

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