Four Probe Automatic

Four Probe Automatic, Total:34 items.

The international standard classification for "Four Probe Automatic" includes: Electricity. Magnetism. Electrical and magnetic measurements , Testing of metals , Carbon materials , Other methods of testing of metals , Chemical analysis of metals , Dental equipment .

The Chinese standard classification for "Four Probe Automatic" includes: Technical management , Radio Measurement , Metal physical property test method , Oxide and elementary substance , Semimetal and semiconductor material analysis method , Stomatologic device, equipment and material .

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Professional Standard - Electron

• SJ/T 31122-1994 Requirements of readiness and methods of inspection and assessment for four-point probes
• SJ/T 10315-1992 Generic specification for Four-point probe
• SJ/T 31123-1994 Requirements of readiness and methods of inspection and assessment for automatic multi-point test probes
• SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe

National Metrological Verification Regulations of the People's Republic of China

• JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
• JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method

Jiangsu Provincial Standard of the People's Republic of China

• DB32/T 4027-2021 Dynamic four-probe method for the determination of electrical conductivity of graphene powder

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
• GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
• GB 5666-1985 Dental explorers
• GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array

Professional Standard - Ferrous Metallurgy

• YB/T 6166-2024 Graphene film sheet resistance measurement four-probe method

Group Standards of the People's Republic of China

• T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
• T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
• T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method

Hebei Provincial Standard of the People's Republic of China

• DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method

Taiwan Provincial Standard of the People's Republic of China

• CNS 6288-1989 Probes

Professional Standard - Medicine

• YY 91014-1999 Dental explorers
• YY 91914-1999 Dental probe
• YY/T 1014-2013 Dental explorers

RU-GOST R

• GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method

Japanese Industrial Standards Committee (JISC)

• JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
• JIS T 2605:1953 Probes

Korean Agency for Technology and Standards (KATS)

• KS P 2014-2006 Probes
• KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
• KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
• KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
• KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
• KS P ISO 7492:2013 Dental explorers

HU-MSZT

• MSZ 12192-1981 dental probe

Society of Automotive Engineers (SAE)

• SAE AS4251-2013 Coupling Assemblies, Non-Locking Probe Style, Self-Aligning, Self-Sealing Disconnects

SAE - SAE International

• SAE AS4251-1988 Coupling Assemblies@ Non- Locking Probe Style@ Self-Aligning@ Self- Sealing Disconnects

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