Mass calibrator
Mass calibrator, Total:62 items.
The international standard classification for "Mass calibrator" includes: Chemical analysis of metals , Vacuum technology , Chemical analysis .
The Chinese standard classification for "Mass calibrator" includes: Chemical Measurement , Vacuum technique and equipment , Basic standards and general methods .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1544-2015 Calibration Specification for Raman Spectrometers
- JJF 1818-2020 Calibration Specification of Calibration Device of Raman Spectrometers
- JJF 1930-2021 Calibration Specification for Organic High Resolution Magnetic Sector Mass Spectrometers
- JJF 1396-2013 Calibration Specification for Spectrum Analyzer
- JJF 1317-2011 Calibration Specification for Liquid Chromatography-Mass Spectrometers
- JJF 2008-2022 Calibration Specification for Comb Generators
- JJF 1850-2020 Calibration Specification for Germanium Gamma-ray Spectrometers
- JJF 1158-2006 Calibration Specification for Stable Isotope Gas Mass Spectrometer
- JJF 1528-2015 Calibration Specification for Time-of-Flight Mass Spectrometers
- JJF 1164-2006 Calibration Specification for Bench Top Gas Chromatography-Mass Spectrometers
- JJF 1975-2022 Calibration Specification for Spectroradiometers
- JJF 1329-2011 Calibration Specification for Instantaneous Spectral Instruments
- JJF 1851-2020 Calibration Specification for Alpha Spectrometers
- JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
- JJF 1531-2015 Calibration specification for fourier transform mass spectrometers
- JJF 1120-2004 Calibration Specification for Thermal ionization isotope mass spectrometers
- JJF 2067-2023 Calibration Specification for Energy-Dispersive X-ray Spectrometers
- JJF 1164-2018 Calibration Specification for Gas Chromatography-Mass Spectrometries
- JJF 1989-2022 Calibration Specification for Spectral Illuminance Meters
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18193-2000 Vacuum technology - Mass-spectrometer-type leak detector calibration
Group Standards of the People's Republic of China
- T/CSTM 00445-2021 Calibration specification for glow discharge mass spectrometry
- T/CTCA 14-2023 High quality school uniforms
未注明发布机构
- SEMI F33-0708-2008 TEST METHOD FOR CALIBRATION OF ATMOSPHERIC PRESSURE IONIZATION MASS SPECTROMETER (APIMS)
Professional Standard - Agriculture
- JJF 2115-2024 Liquid chromatography-inductively coupled plasma mass spectrometry instrument calibration specification
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Jiangsu Provincial Standard of the People's Republic of China
- DBS32/ 012-2016 High-performance liquid chromatography, liquid chromatography-mass spectrometry/mass spectrometry for the detection of quinoline yellow in local food safety standards
National Health Commission of the People's Republic of China
- GB 23200.23-2016 National food safety standard―Determination of dinoseb residue in foods Liquid chromatography-mass spectrometry
Professional Standard - Non-ferrous Metal
- YSBS 45384-2020 Niobium Low Alloy Steel Reference Material
Korean Agency for Technology and Standards (KATS)
- KS A 0083-2013 Mass spectrometer(type leak) detector general rules for calibration system
- KS A 0083-2023 Mass spectrometer(type leak) detector general rules for calibration system
- KS A 0083-2002 Mass-spectrometer-type leak-detector calibration
- KS B ISO 3530-2002(2012) Vacuum technology－Mass－spectrometer－type leak－detector calibration
- KS B ISO 3530:2013 Vacuum technology－Mass－spectrometer－type leak－detector calibration
- KS B ISO 3530-2013 Vacuum technology－Mass－spectrometer－type leak－detector calibration
- KS B ISO 3530:2002 Vacuum technology-Mass-spectrometer-type leak-detector calibration
- KS A 0083-2013(2018) Mass spectrometer(type leak) detector general rules for calibration system
GSO
- BH GSO ISO 3530:2016 Vacuum technology -- Mass-spectrometer-type leak-detector calibration
- GSO ISO 3530:2013 Vacuum technology -- Mass-spectrometer-type leak-detector calibration
- OS GSO ISO 3530:2013 Vacuum technology -- Mass-spectrometer-type leak-detector calibration
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
International Organization for Standardization (ISO)
- ISO 3530:1979 Vacuum technology; Mass-spectrometer-type leak-detector calibration
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
American Society for Testing and Materials (ASTM)
- ASTM E2040-19 Standard Test Method for Mass Scale Calibration of Thermogravimetric Analyzers
Association Francaise de Normalisation
- NF X10-530:1975 Vacuum technology - Mass spectrometer-type leak-detector calibration.
- NF C93-845:2006 Calibration of optical spectrum analyzers.
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
KR-KS
- KS A 0083-2013(2023) Mass spectrometer(type leak) detector general rules for calibration system
British Standards Institution (BSI)
- BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
SCC
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
Danish Standards Foundation
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
Japanese Industrial Standards Committee (JISC)
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
International Electrotechnical Commission (IEC)
- IEC 62129:2006 Calibration of optical spectrum analyzers
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