Silicon wafer infrared

Silicon wafer infrared, Total:3 items.

The international standard classification for "Silicon wafer infrared" includes: Testing of metals , Chemical analysis of metals .

The Chinese standard classification for "Silicon wafer infrared" includes: Metal nondestructive testing method , Semimetal and semiconductor material analysis method , Metal physical property test method .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 1557-2018 Test method for determining interstitial oxygen content in silicon by infrared absorption
• GB/T 1557-2006 The method of determining interstitial oxygen content in silicon by infrared absorption
• GB/T 14143-1993 300～900μm Silicon slices－Measuring of interstitial oxygen content－Infrared absorption method

Others: Silicon circuit,silicon wafer,Sample Wafer,Silicon Spectrum,Silicon Spectrum,Wafer sample,Silicon wafer infrared,Wafer analysis,Silicon wafer,Wafer analysis,test wafer,test wafer,Gold silicon wafer,Scan silicon wafer,Wafer inspection,Silicon wafer gold,switch silicon,silicon wafer carbon,Silicon Wafer Plating,Wafer Cutting