GB/T 1557-2018 in English
VALIDTest method for determining interstitial oxygen content in silicon by infrared absorption
- Issued on:2018-09-17
- Implemented on:2019-06-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$156.00
《GB/T 1557-2018硅晶体中间隙氧含量的红外吸收测量方法》由TC203(全国半导体设备和材料标准化技术委员会)归口,TC203SC2(全国半导体设备和材料标准化技术委员会材料分会)执行,主管部门为国家标准化管理委员会。
Introduction
1. Standard Overview
GB/T 1557-2018 is a standard for the infrared absorption measurement method of interstitial oxygen content in silicon crystals, which replaces the previous GB/T 1557-2006 version. This standard is mainly applicable to the determination of interstitial oxygen content in N-type and P-type silicon single crystals, involving the application of normal temperature and low temperature infrared equipment.
2. Key points of standard revision
| Revision content | 2006 edition | 2018 edition |
|---|---|---|
| Test range expansion | - | Added a new test range for low-temperature infrared equipment, with oxygen content starting from $0.5\times10^{15}~\mathrm{cm}^{-3}$ |
| Normative references | - | Added GB/T4059, GB/T4060, GB/T29057, GB/T35306 |
| Test principle update | - | For details on low-temperature Fourier transform infrared spectrometers, see $\mathrm{GB/T}35306$ |
3. Implementation suggestions
Equipment selection:Based on the test requirements, a high-resolution Fourier transform infrared spectrometer (resolution $4~\mathrm{cm}^{-1}$ or better at room temperature) is preferred. For low-temperature testing, equipment with ultra-low temperature environment control is recommended.
Sample preparation:Ensure that the sample thickness is within the range of $0.04~0.40~\mathrm{cm}$ and there is no oxide on the surface. After double-sided polishing, use a micrometer to measure the thickness, and the error should be less than $0.5\%$.
Interference factor control: The humidity in the test environment must be lower than $60\%$ to avoid the absorption of water vapor and carbon dioxide affecting the results. The inclination angle of the sample surface should not exceed $10^\circ$ to reduce the reflection effect.

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