erase memory
erase memory, Total:80 items.
The international standard classification for "erase memory" includes: Titanium products , Non-ferrous metals , Textile fabrics , Integrated circuits. Microelectronics , Non-destructive testing , Identification cards and related devices .
The Chinese standard classification for "erase memory" includes: Rare light metals and their alloys , Silk and silk textile products , Microcircuit in general , Basic standards and general methods , Data medium .
工业和信息化部
- YS/T 1136-2016 Nickel-titanium shape memory alloy seamless tube for medical devices
- YS/T 1307.2-2019 Test method for shape memory properties of nickel-titanium shape memory alloys - Part 2: Bending testing
- YS/T 1307.1-2019 Test method for shape memory properties of nickel-titanium shape memory alloys - Part 1: Tensile testing
Professional Standard - Non-ferrous Metal
- YS/T 1064-2015 Terminology for nickel-titanium shape memory alloys
- YS/T 1684-2024 Double pass titanium nickel shape memory alloy wire
- YS/T 971-2014 Titanium-nickel shape memory alloy wires
Professional Standard - Textile
- FZ/T 43053-2019 Polyester filament shape memory fabrics
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 20296-2012 Mnemonics and symbols for integrated circuits
- GB/T 26641-2011 Non-destructive testing - Magnetic memory testing - General principles
- GB/T 12604.10-2011 Non-destructive testing - Terminology - Terms used in magnetic memory testing
- GB/T 20296-2006 Mnemonics and symbols for integrated circuits
- GB/T 17551-1998 Identification cards - Optical memory cards - General characteristics
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41420-2022 Textiles—Determination and evaluation for shape memory property
- GB/T 26641-2021 Non-destructive testing—Magnetic memory testing—General requirements
- GB/T 39985-2021 Titanium-nickel shape memory alloy plate
Taiwan Provincial Standard of the People's Republic of China
- CNS 10322-1983 Method of Test for Ferrite Cores for Memory Devices
- CNS 13940.1-1997 Identification cards-Optical memory cards-Linear recording method-Part 1:Physical characteristics
- CNS 13939-1997 Identification cards-Optical memory cards-General characteristics
Military Standard of the People's Republic of China-General Armament Department
- GJB 8620-2015 Specification for nickel-titanium-niobium shape memory alloy rods
- GJB 8518-2015 Specification for shape memory alloy fastening rings
Group Standards of the People's Republic of China
- T/HCPA 007-2023 Efficient Memory Instructor Professional Skills Assessment
- T/QGCML 1174-2023 Memory foam mattress production technical specifications
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5913-2006 Specification for NiTiNb shape memory alloy bars
Defense Logistics Agency
- DLA SMD-5962-96796 REV D-2007 MICROCIRCUIT, MEMORY, 128K X 8-BIT, ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY, MONOLITHIC SILICON
- DLA SMD-5962-82025 REV H-2005 MICROCIRCUIT, MEMORY, DIGITAL, 16K X 8 UV ERASEABLE PROGRAMMABLE READ ONLY MEMORY (EPROM), MONOLITHIC SILICON
- DLA SMD-5962-93144 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE, LOGIC DEVICE, MONOLITHIC SILICON
- DLA SMD-5962-92322-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT FAST COLUMN ACCESS UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-90658 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 8 UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-89817 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 32K X 8-BIT UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-38267 REV H-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K X 8 BIT EEPROM, MONOLITHIC SILICON
- DLA SMD-5962-93091 REV D-2005 MICROCIRCUIT, HYBRID, MEMORY, 512K X 8-BIT, ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY
- DLA SMD-5962-02518-2003 MICROCIRCUIT MEMORY CMOS, DIGITAL, 256M X 8 BIT STACKED DIE (2GBIT) SYNCHRONOUS DRAM (SDRAM), MODULE
- DLA SMD-5962-89614 REV F-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K X 8-BIT UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-93155 REV B-2005 MICROCIRCUIT, HYBRID, MEMORY, 256K X 8-BIT, ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY
- DLA SMD-5962-89815 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 REGISTERED UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-93122-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 2K X 16-BIT STATE MACHINE UVEPROM, MONOLITHIC SILICON
- DLA SMD-5962-02517 REV A-2004 MICROCIRCUIT MEMORY CMOS, DIGITAL, 128M X 8 BIT STACKED DIE(1GBIT) SYNCHRONOUS DRAM (SDRAM), MODULE
- DLA SMD-5962-93154 REV A-2005 MICROCIRCUIT, HYBRID, MEMORY, 128K X 8-BIT, ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY
- DLA SMD-5962-93168 REV A-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS ELECTRICALLY ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-97609 REV A-2003 MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 2M X 8-BIT, MONOLITHIC SILICON
- DLA SMD-5962-93087 REV A-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
- DLA SMD-5962-94585 REV J-2003 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 128K X 32-BIT, ELECTRICALLY ERASABLE/PROGRAMMABLE READ ONLY MEMORY
- DLA SMD-5962-94614 REV E-2003 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 32K X 32-BIT, ELECTRICALLY ERASABLE AND PROGRAMMABLE READ ONLY MEMORY
- DLA SMD-5962-94510 REV A-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
Standard Association of Australia (SAA)
- AS K203:1970 Case marking paint (for marking and obliterating)
U.S. Military Regulations and Norms
- ARMY MIL-H-2987 B NOTICE 1-1997 HIDER, FLASH
- ARMY MIL-C-70490 NOTICE 1-1995 CIRCUIT CARD ASSEMBLY, MEMORY
- ARMY MIL-H-2987 B-1975 HIDER, FLASH
- ARMY MIL-C-70490-1985 CIRCUIT CARD ASSEMBLY, MEMORY
- ARMY MIL-C-70490 (1)-1986 CIRCUIT CARD ASSEMBLY, MEMORY
RO-ASRO
- STAS 12326/1-1985 STORAGE OSCILLOSCOPES Terminology
International Electrotechnical Commission (IEC)
- IEC TR 61352:2006 Mnemonics and symbols for integrated circuits
- IEC TR 61352:2000 Mnemonics and symbols for integrated circuits
Korean Agency for Technology and Standards (KATS)
- KS D 0057-2001 Glossary of terms used for shape memory alloys
- KS D 0057-2004 Glossary of terms used for shape memory alloys
- KS D 0057-2019 Glossary of terms used for shape memory alloys
- KS D 0057-2004(2019) Glossary of terms used for shape memory alloys
British Standards Institution (BSI)
- BS ISO/IEC 11694-6:2014 Identification cards. Optical memory cards. Linear recording method. Use of biometrics on an optical memory card
- BS ISO/IEC 11694-6:2006 Identification cards - Optical memory cards - Linear recording method - Use of biometrics on an optical memory card
- BS ISO/IEC 11694-3:2015 Identification cards. Optical memory cards. Linear recording method. Optical properties and characteristics
- BS ISO/IEC 11694-4:1997 Identification cards. Optical memory cards. Linear recording method. Logical data structures
Association Francaise de Normalisation
- NF EN 111100:1991 Intermediate specification: memory viewing tubes
- NF EN 111101:1991 Special frame specification: memory viewing tubes
- NF A51-080:1991 Shape memory alloys (SMA). Vocabulary and measures.
Japanese Industrial Standards Committee (JISC)
- JIS H 7107:2003 Wires of Ti-Ni shape memory alloy
- JIS H 7001:2009 Glossary of terms used for shape memory alloys
- JIS H 7001:2002 Glossary of terms used for shape memory alloys
- JIS H 7001:1989 Glossary of terms used in shape memory alloys
International Organization for Standardization (ISO)
- ISO/IEC 11693:2000 Identification cards - Optical memory cards - General characteristics
Canadian Standards Association (CSA)
- CSA ISO/IEC 11694-6-06:2006 Identification cards Optical memory cards Linear recording method Part 6: Use of biometrics on an optical memory card ISO/IEC 11694-6:2006
CZ-CSN
- CSN 01 3349-1989 Graphical symbols for electrical diagrams. Memory units
U.S. Air Force
- AIR FORCE MIL-W-6873 C-1991 WELDING; FLASH, CARBON AND ALLOY STEEL
- AIR FORCE MIL-W-6873 C NOTICE 1-1997 WELDING; FLASH, CARBON AND ALLOY STEEL
American Society for Testing and Materials (ASTM)
- ASTM F2005-05(2015) Standard Terminology for Nickel-Titanium Shape Memory Alloys
- ASTM F2005-05 Standard Terminology for Nickel-Titanium Shape Memory Alloys
- ASTM F2005-00 Standard Terminology for Nickel-Titanium Shape Memory Alloys
- ASTM F2005-21 Standard Terminology for Nickel-Titanium Shape Memory Alloys
- ASTM F2005-05(2010) Standard Terminology for Nickel-Titanium Shape Memory Alloys
FI-SFS
- SFS 5233-1986 Install pipe. Insulation requirements for memory insulating tubes
RU-GOST R
- GOST 21480-1976 "Man-machine" system mnemo-schemes. General ergonomic requirements
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