Probe material

Probe material, Total:10 items.

The international standard classification for "Probe material" includes: Surgical instruments and materials , Semiconducting materials , Testing of metals .

The Chinese standard classification for "Probe material" includes: Technical management , General and microsurgical devices , Other special devices , Semimetal and semiconductor material in general , Metal physical property test method .

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Professional Standard - Electron

• SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques
• SJ/T 10315-1992 Generic specification for Four-point probe

Professional Standard - Medicine

• YY/T 0172-1994 Explorer for womb
• YY 0075-2005 Lachrymal probes
• YY/T 0172-2014 Uterine probe

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe

Professional Standard - Machinery

• JB/T 12074-2014 Quantitative Analysis of Composition Metal - Electron Probe Microanalysis

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method

Japanese Industrial Standards Committee (JISC)

• JIS T 2605:1953 Probes

Korean Agency for Technology and Standards (KATS)

• KS P 2014-2006 Probes

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