Memory Group Statistics

Memory Group Statistics, Total:122 items.

The international standard classification for "Memory Group Statistics" includes: Titanium products , Textile fabrics , Non-ferrous metals , Powder metallurgy , Integrated circuits. Microelectronics , Non-destructive testing , Identification cards and related devices , Welded joints , Implants for surgery, prosthetics and orthotics , Playgrounds .

The Chinese standard classification for "Memory Group Statistics" includes: Rare light metals and their alloys , Silk and silk textile products , Microcircuit in general , Basic standards and general methods , Data medium , Welding and cutting , Orthopedic devices , Toys .

工业和信息化部

YS/T 1307.1-2019 Test method for shape memory properties of nickel-titanium shape memory alloys - Part 1: Tensile testing
YS/T 1136-2016 Nickel-titanium shape memory alloy seamless tube for medical devices
YS/T 1307.2-2019 Test method for shape memory properties of nickel-titanium shape memory alloys - Part 2: Bending testing
JB/T 13468-2018 Non-destructive testing-Practice for integrated method of eddy current and metal magnetic memory

Professional Standard - Textile

FZ/T 43053-2019 Polyester filament shape memory fabrics

Professional Standard - Non-ferrous Metal

YS/T 970-2014 Phase change temperature measuring method for nickel-titanium shape memory alloys
YS/T 1684-2024 Double pass titanium nickel shape memory alloy wire
YS/T 971-2014 Titanium-nickel shape memory alloy wires
YS/T 1064-2015 Terminology for nickel-titanium shape memory alloys

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 20296-2012 Mnemonics and symbols for integrated circuits
GB/T 44046-2024 Non-destructive testing—Metal magnetic memory—Inspection of welded joints
GB/T 17551-1998 Identification cards - Optical memory cards - General characteristics
GB/T 20296-2006 Mnemonics and symbols for integrated circuits
GB/T 17550.1-1998 Identification cards--Optical memory cards--Linear recording method--Part 1:Physical characteristics
GB/T 12604.10-2023 Non-destructive testing—Terminology—Part 10：Magnetic memory testing
GB/T 24627-2023 Wrought nickel-titanium shape memory alloys for surgical implants
GB/T 26641-2011 Non-destructive testing - Magnetic memory testing - General principles
GB/T 17550.3-1998 Identification cards--Optical memory cards --Linear recording method--Part 3:Optical properties and characteristics
GB/T 12604.10-2011 Non-destructive testing - Terminology - Terms used in magnetic memory testing
GB/T 17550.4-2000 Identification cards - Optical memory cards - Linear recording method - Part 4: Logical data structures

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39985-2021 Titanium-nickel shape memory alloy plate
GB/T 34370.10-2020 Nondestructive testing of amusement equipments—Part 10:Magnetic memory testing
GB/T 39989-2021 Superelastic titanium-nickel shape memory alloy bar and wire
GB/T 41420-2022 Textiles—Determination and evaluation for shape memory property
GB/T 26641-2021 Non-destructive testing—Magnetic memory testing—General requirements

Taiwan Provincial Standard of the People's Republic of China

CNS 13940.1-1997 Identification cards-Optical memory cards-Linear recording method-Part 1:Physical characteristics
CNS 13939-1997 Identification cards-Optical memory cards-General characteristics
CNS 10322-1983 Method of Test for Ferrite Cores for Memory Devices
CNS 13940.3-1997 Identification cards-Optical memory cards-Linear recording method-Part 3:Optical properties and characteristics
CNS 13940-1-1997 Identification cards-Optical memory cards-Linear recording method-Part 1:Physical characteristics
CNS 13940-3-1997 Identification cards-Optical memory cards-Linear recording method-Part 3:Optical properties and characteristics

Military Standard of the People's Republic of China-General Armament Department

GJB 8518-2015 Specification for shape memory alloy fastening rings
GJB 8620-2015 Specification for nickel-titanium-niobium shape memory alloy rods

Group Standards of the People's Republic of China

T/QGCML 1123-2023 Computer cluster parallel computing system and method
T/QGCML 1174-2023 Memory foam mattress production technical specifications
T/CALAS 74-2019 Laboratory animals - Guideline for learning and memory behavior test
T/HCPA 007-2023 Efficient Memory Instructor Professional Skills Assessment
T/GDAQI 011-2019 Magnetic Memory Testing Method for Stress of Overground Metal Pipeline

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5913-2006 Specification for NiTiNb shape memory alloy bars

Professional Standard - Electricity

DL/T 370-2010 Metal magnetic memory testing of welded joint on pressure equipment

Professional Standard - Machinery

JB/T 11605-2013 Non-destructive testing instruments — Metal magnetic memory instrument - technical requirments
JB/T 11611-2013 Non-destructive testing instrument — Eddy current and magnetic memory integrated testing instrument

U.S. Military Regulations and Norms

ARMY MIL-H-2987 B NOTICE 1-1997 HIDER, FLASH
ARMY MIL-H-2987 B-1975 HIDER, FLASH
ARMY MIL-C-70490 NOTICE 1-1995 CIRCUIT CARD ASSEMBLY, MEMORY
ARMY MIL-C-70490 (1)-1986 CIRCUIT CARD ASSEMBLY, MEMORY
ARMY MIL-C-70490-1985 CIRCUIT CARD ASSEMBLY, MEMORY
ARMY MIL-C-63526 NOTICE 1-1996 CARTRIDGE, 105MM, TANK GUN FLASH SIMULATOR, XM23
ARMY MIL-C-63526-1981 CARTRIDGE, 105MM, TANK GUN FLASH SIMULATOR, XM23

RO-ASRO

STAS 12326/1-1985 STORAGE OSCILLOSCOPES Terminology
STAS 12326/2-1985 STORAGE OSCILLOSCOPES General requirements and particular test methods

RU-GOST R

GOST 25492-1982 Memories of digital computers. Terms and definitions
GOST 21480-1976 "Man-machine" system mnemo-schemes. General ergonomic requirements
GOST R 52081-2003 Non-destructive testing. Method of metal magnetic memory. Terms and definitions

International Electrotechnical Commission (IEC)

IEC TR 61352:2006 Mnemonics and symbols for integrated circuits
IEC TR 61352:2000 Mnemonics and symbols for integrated circuits

Korean Agency for Technology and Standards (KATS)

KS D 0057-2001 Glossary of terms used for shape memory alloys
KS D 0057-2004 Glossary of terms used for shape memory alloys
KS D 0057-2019 Glossary of terms used for shape memory alloys
KS D 0057-2004(2019) Glossary of terms used for shape memory alloys
KS B ISO 24497-1-2008(2013) Non-destructive testing－Metal magnetic memory－Part 1：Vocabulary
KS D 0058-2019 Method for determining the transformation temperature of shape memory alloys
KS D 0058-2001 Method for determining the transformation temperature of shape memory alloys
KS D 0058-2004(2019) Method for determining the transformation temperature of shape memory alloys
KS D 0302-2019 Method of fixed temperature load test for coil spring of shape memory alloys
KS D 0058-2004 Method for determining the transformation temperature of shape memory alloys
KS D 0304-2004 Method for fixed strain test for coil springs of shape memory alloys
KS B ISO 24497-2-2008(2013) Non-destructive testing－Metal magnetic memory－Part 2：General requirements
KS D 0072-2002(2017) Method of fixed temperature tensile test for wires of Ti－Ni shape memory alloys
KS D 0072-2002 Method of fixed temperature tensile test for wires of Ti－Ni shape memory alloys
KS D 0302-2004 Method of fixed temperature load test for coil spring of shape memory alloys

British Standards Institution (BSI)

BS ISO/IEC 11694-6:2014 Identification cards. Optical memory cards. Linear recording method. Use of biometrics on an optical memory card
BS ISO/IEC 11694-6:2006 Identification cards - Optical memory cards - Linear recording method - Use of biometrics on an optical memory card
BS ISO/IEC 11694-3:2015 Identification cards. Optical memory cards. Linear recording method. Optical properties and characteristics
BS ISO/IEC 11694-3:2008 Identification cards - Optical memory cards - Linear recording method - Optical properties and characteristics
BS ISO/IEC 11694-4:1997 Identification cards. Optical memory cards. Linear recording method. Logical data structures

SCC

MIL MIL-M-28787/433-1991 MODULES, STANDARD ELECTRONIC MEMORY TIMING MODULE, KEY CODE JEQ

Japanese Industrial Standards Committee (JISC)

JIS H 7107:2003 Wires of Ti-Ni shape memory alloy
JIS H 7001:2009 Glossary of terms used for shape memory alloys
JIS H 7001:2002 Glossary of terms used for shape memory alloys
JIS H 7001:1989 Glossary of terms used in shape memory alloys
JIS H 7101:1989 Method for determining the transformation temperatures of shape memory alloys
JIS H 7101:2002 Method for determining the transformation temperature of shape memory alloys
JIS H 7107:2009 Wires, tapes and tubings of Ti-Ni shape memory alloy
JIS H 7105:1993 Method of fixed strain test for coil springs of shape memory alloys
JIS H 7105:2002 Method of fixed strain test for coil springs of shape memory alloys

Association Francaise de Normalisation

NF EN 111101:1991 Special frame specification: memory viewing tubes
NF EN 111100:1991 Intermediate specification: memory viewing tubes
NF A51-080:1991 Shape memory alloys (SMA). Vocabulary and measures.
NF EN 4819:2017 Série aérospatiale - Bouton mémoire par contact (CMB) pour usage aéronautique

Defense Logistics Agency

DLA SMD-5962-02518-2003 MICROCIRCUIT MEMORY CMOS, DIGITAL, 256M X 8 BIT STACKED DIE (2GBIT) SYNCHRONOUS DRAM (SDRAM), MODULE
DLA SMD-5962-02517 REV A-2004 MICROCIRCUIT MEMORY CMOS, DIGITAL, 128M X 8 BIT STACKED DIE(1GBIT) SYNCHRONOUS DRAM (SDRAM), MODULE
DLA SMD-5962-94573 REV B-1996 MICROCIRCUIT, DIGITAL, CMOS, HISTOGRAMMER/ACCUMULATING BUFFER, MONOLITHIC SILICON
DLA SMD-5962-89841 REV L-2008 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE ARRAY LOGIC (EEPLD), MONOLITHIC SILICON

International Organization for Standardization (ISO)

ISO/IEC 11693:2000 Identification cards - Optical memory cards - General characteristics
ISO/IEC 11694-1:2000 Identification cards - Optical memory cards - Linear recording method - Part 1: Physical characteristics
ISO/IEC 11694-1:2005 Identification cards - Optical memory cards - Linear recording method - Part 1: Physical characteristics
ISO/IEC 11694-1:2012 Identification cards - Optical memory cards - Linear recording method - Part 1: Physical characteristics
ISO 24497-1:2007 Non-destructive testing - Metal magnetic memory - Part 1: Vocabulary
ISO/IEC 11694-4:2001 Identification cards - Optical memory cards; Linear recording method - Part 4: Logical data structures
ISO/IEC 11694-3:2001 Identification cards - Optical memory cards; Linear recording method - Part 3: Optical properties and characteristics

Canadian Standards Association (CSA)

CSA ISO/IEC 11694-6-06:2006 Identification cards Optical memory cards Linear recording method Part 6: Use of biometrics on an optical memory card ISO/IEC 11694-6:2006
CSA ISO/IEC 11693-06:2006 Identification cards Optical memory cards General characteristics ISO/IEC 11693:2005

CZ-CSN

CSN 01 3349-1989 Graphical symbols for electrical diagrams. Memory units

U.S. Air Force

AIR FORCE MIL-W-6873 C NOTICE 1-1997 WELDING; FLASH, CARBON AND ALLOY STEEL
AIR FORCE MIL-W-6873 C-1991 WELDING; FLASH, CARBON AND ALLOY STEEL

American Society for Testing and Materials (ASTM)

ASTM F2005-05(2015) Standard Terminology for Nickel-Titanium Shape Memory Alloys
ASTM F2005-05 Standard Terminology for Nickel-Titanium Shape Memory Alloys
ASTM F2005-00 Standard Terminology for Nickel-Titanium Shape Memory Alloys
ASTM F2005-21 Standard Terminology for Nickel-Titanium Shape Memory Alloys
ASTM F2005-05(2010) Standard Terminology for Nickel-Titanium Shape Memory Alloys

FI-SFS

SFS 5233-1986 Install pipe. Insulation requirements for memory insulating tubes

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD21-C-1998 Configurations for Solid State Memories Release 8 ***MUST GO DIRECT TO JEDEC, 703.907.7559***

United States Navy

NAVY MIL-STD-2217 VALID NOTICE 3-2005 MEMORY LOADER/VERIFIER MULTIPLEX BUS INTERFACE WITH AVIONIC SYSTEMS, REQUIREMENTS FOR
NAVY MIL-STD-2217 CHG NOTICE 2-2000 MEMORY LOADER/VERIFIER MULTIPLEX BUS INTERFACE WITH AVIONIC SYSTEMS, REQUIREMENTS FOR

GSO

GSO ISO 24497-2:2021 Non-destructive testing — Metal magnetic memory — Part 2: General requirements
BH GSO ISO 24497-2:2022 Non-destructive testing — Metal magnetic memory — Part 2: General requirements

ETSI - European Telecommunications Standards Institute

GS LIS 002-2013 Localisation Industry Standards (LIS); Translation Memory eXchange (TMX) (V1.4.2)

American National Standards Institute （ANSI)

ANSI X3.54-1986 Information Systems - Recorded Magnetic Tape for Information Interchange - (6250 cpi, Group-Coded Recording)

(U.S.) Telecommunications Industries Association

TIA-136-005-C-2004 TDMA ?Third Generation Wireless Introduction, Identification, and Semi- Permanent Memory

US-UFC

UFC 4-021-01 CHANGE 1-2010 DESIGN AND O&M: MASS NOTIFICATION SYSTEMS

European Telecommunications Standards Institute (ETSI)

ETSI GS LIS 002-2013 Localisation Industry Standards (LIS); Translation Memory eXchange (TMX) (V1.4.2)

Others: Memory Group Statistics,Memory Group Statistics