non-contact scanning
non-contact scanning, Total:3 items.
The international standard classification for "non-contact scanning" includes: Testing of metals , Semiconducting materials .
The Chinese standard classification for "non-contact scanning" includes: Metal physical property test method , Semimetal and semiconductor material in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32280-2015 Test method for warp of silicon wafers—Automated non-contact scanning method
- GB/T 29507-2013 Test method for measuring flatness, thickness and total thickness vsriation on silicon wafers. Automated non-contact scanning
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method
non-contact measuring instrument,Non-contact optical measurement,Non-contact optical measurement system,non-contact measurement,non-contact measurement,scanning tunneling microscope,Non-contact gas flow meter,Kelvin probe non-contact,non contact,Contactless,non-contact scanning,Contactless,Non-contact resistance measurement,Non-scanning imaging and scanning imaging,Contact scanning principle,Non-contact resistance,non-polar liquid contact angle,Polar Contact Angle vs Nonpolar Contact Angle,Chamber non-contact seal,Contact angle of polar liquid and non-polar liquid on solid surface
