Interference and Diffraction
Interference and Diffraction, Total:248 items.
The international standard classification for "Interference and Diffraction" includes: Linear and angular measurements , Optical measuring instruments , Measuring instruments , Other standards related to optics and optical measurements , Optics and optical measurements , Radiation protection , Particle size analysis. sieving , Occupational safety. Industrial hygiene .
The Chinese standard classification for "Interference and Diffraction" includes: Office supplies and office implements , Length Measurement , Optical Measurement , Chemical Measurement , Measuring tool and instrument , Optical metrological instrument , Electron optics and other physical optics instrument , Optical instrument in general , Fasteners , Radiological sanitation protection , Powder metallurgy analysis method , Optical communication equipment .
Professional Standard - Education
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY 64-1980 Double slit interferometer (trial)
- JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
国家能源局
- SY/T 7340-2016 Riser interference
National Metrological Verification Regulations of the People's Republic of China
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 77-2006 Verification Regulation of Interference Microscopes
- JJG 331-1994 Verification Regulation of Laser Interference Comparator
- JJG 661-1990 Verification Regulation of Flatness Interferometer with Isoclinic Circle Fringe
- JJG 101-1981 Verification Regulation of Contact-type Interferometers
- JJG 661-2004 Verification Regulation of Flatness Interferometer with Isoclinic Circle Fringe
- JJG 77-1983 Verification Regulation of Interference Microscope
- JJG 677-2006 Verification Regulation of Interference Type Methane Measuring Device
- JJG 677-1996 Verification Regulation of Interference Type Methane Measuring Devece
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG(煤炭) 5-1988 Verification rules for methane detectors based on the principle of light interference
- JJG 770-1992 Verification Regulation of Koster Interference Comparator
- JJG 101-2004 Verification Regulation of Contact-type Interferometers
- JJG 371-2005 Verification Regulation of Gauge Block Interferometers
- JJG 812-1993 Interference Filter
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 739-2005 Verification Regulation of Laser Interferometers
- JJG 371-1992 Verification Regulation of Laser Gauge Block Interferometer
Professional Standard - Machinery
- JB/T 5610-1991 Dual-frequency Laser Interferometer
- JB/T 8226.6-1999 Coating for optical element narrow bandpass interterence filter coating
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 8239.1-1999 Basic parameters for diffraction grating
- JB/T 8239.2-1999 Specification for diffraction grating
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 8233-1999 Vertical contact interferometers
- JB/T 5610-2006 Laser interferometer
机械电子工业部
- JB 5610-1991 Dual frequency laser interferometer
Professional Standard - Aviation
- HB 8011-2002 Pins,90°countersunk head,in titanium alloy material for interfere fit
- HB 8378-2013 Titanium alloy interference type short thread small hexagon head bolts
- HB 7035-1993 Shear Type Interference Fit Flat Head Bolts
- HB 8379-2013 Titanium alloy interference type hex head bolts
- HB 8019-2002 90°reduced countersunk head bolts in titanium alloy for interferance fit
- HB 5620-1980 Technical conditions for interference fit riveting of headless rivets
- HB 7034-1994 100° Countersunk Bolts for Shear-Resistant Interference Fit Connections
- HB 8380-2013 Titanium alloy interference type 100° countersunk head bolt
- HB/Z 142-1989 Selection of interference amount and hole expansion amount
- HB 7035-1994 Shear-type Interference Fit Connection Flush Bolt
- HB 20073-2011 Pins, mushroom head, sealed, for interfere fit
- HB 5620-1983 Technical conditions for interference fit riveting of headless rivets
- HB 8010-2002 Pins pan head in titanium alloy material for interfere fit
- HB 20072-2011 Pins, 90°countersunk head, sealed, for interfere fit
工业和信息化部
- JB/T 13358-2018 Optical interference band pass filters
- JB/T 13872-2020 Phase shift interferometer for flat
- YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
- JB/T 13360-2018 Interference filters used in fluorescence detection analysis
Taiwan Provincial Standard of the People's Republic of China
- CNS 10928-1984 Method of Test for Fiber Optic Devices (Reflactive Index Profile Transverse Interference Method)
- CNS 5242-1980 Interferometer Type Instrumental Gas Detector for Inflammable Gas
- CNS 13034-1992 Method of Measuring the Linear Thermal Expansion Coefficient for Low Expansion Glass by Laser Interferometry
- CNS 5901-1980 Interferometer Type Gas Alarms
Group Standards of the People's Republic of China
- T/SZBX 080-2022 Phase-shifting Laser Interferometer
国家发展和改革委员会
- MT/T 28-2005 Optical interference methane detector
Professional Standard - Coal
- MT 1098-2009 Optical interference type methane gas transducer for mine
- MT 28-1994 Optical interferometric methane detector
- MT 28-2005 Methane Detector of Interferometer Type
未注明发布机构
- JIS Z 2411:2024 General rules for acoustic optical interference imaging analysis
- GJB 8704-2015 Calibration Specification for Digital Laser Plane Interferometer
Professional Standard - Agriculture
- 77药典 四部-2015 0451 X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
- 2355药典 二部-2010 Appendix IX FX-Ray Powder Diffraction Method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1739-2019 Calibration Specification for Digital Laser Spherical Interferometers
- JJF 1913-2021 Calibration Specification for Laser Interferometric Comparators
- JJF 1100-2016 Calibration Specification for Flat Equal Thickness Interferometers
- JJF 1100-2003 Calibration Specification for Flat Equal Thickness Interferometers
- JJF 2007-2022 Calibration Specification for Optical Fiber End-Face Interferometers
- JJF 1163-2006 Program of Pattern Evaluation of Methane Detectors of Interferometer Type
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 26328-2010 Optical interference filters for biochemical analyzer
- GB/T 44078-2024 Determination of optical center distance in photoelectric system—Low coherence interferometry
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
- GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
- GB 8758-1988 Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
Military Standard of the People's Republic of China-General Armament Department
- GJB 131.2-1986 Technical conditions for interference fit riveting of headless rivets
- GJB 1713-1993 Specifications for Nanolaser Polarization Interferometers
- GJB 9250-2017 Explosive pressure test method Laser interference test method
- GJB 337-1987 Determination method of nitrogen content of nitrocellulose (interferometer method)
Henan Provincial Standard of the People's Republic of China
- DB41/T 2290-2022 Ground subsidence interferometric radar monitoring specifications
Professional Standard - Aerospace
- QJ 1697-1989 General Specifications for Infrared Interference Filters
Jilin Provincial Standard of the People's Republic of China
- DB22/T 2651-2017 Calibration specification for digital laser spherical interferometer
机械工业部
- JB/T 8226.6-1995 Optical parts coating narrow band interference filter film
国家安全生产监督管理总局
- MT/T 1098-2009 Optical interference methane gas sensor for coal mines
未注明发布机构
- JIS Z 2411:2024 General rules for acoustic optical interference imaging analysis
- GJB 8704-2015 Calibration Specification for Digital Laser Plane Interferometer
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB/J 6221-2008 Calibration specification for digital laster plane interferometer
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Professional Standard - Post and Telecommunication
- YD/T 592-1992 Test method for wavelength dispersion of mono-mode optical fiber - interference method
Heilongjiang Provincial Standard of the People's Republic of China
- DB23/T 1528-2013 Technical regulations for fast dynamic dual-frequency laser interferometer
International Telecommunication Union (ITU)
- ITU-R BO.2019-1999 Interference Calculation Methods
- ITU-R P.526-2013 Propagation by diffraction
- ITU-R P.526-11-2009 Propagation by diffraction
- ITU-R BO.1293-2002 Protection masks and associated calculation methods for interference into broadcast-satellite systems involving digital emissions
- ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
- ITU-R P.526-10-2007 Propagation by diffraction
- ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
- ITU-R QUESTION 203-17-1997 Characteristics and telecommunication requirements for space very long baseline interferometry
TIA - Telecommunications Industry Association
- TIA/EIA-455-29-A-1989 FOTP-29 Refractive Index Profile@ Transverse Interference Method (Withdrawn May 2003)
Danish Standards Foundation
- DS 813:1996 Interference joints - Calculation and design rules
- DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
CZ-CSN
- CSN 01 4317-1989 Metric screw threads. Interference fits
- CSN 01 4217-1965 Fressure connections. Interferences of fits ISO.
- CSN 77 0333-1985 Determination of gas permeability of packaging materials. Interferometric method
Korean Agency for Technology and Standards (KATS)
- KS E 4115-2013 Interferometer type gas alarms
- KS C 6479-1991(2016) General rules of interference filter
- KS C 6911-2020 Test methods of interference filter
- KS C 6479-2021 General rules of interference filter
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS E 4111-2013 INTERFEROMETER TYPE INSTRUMENTAL GAS DETECTOR FOR INFLAMMABLE GAS
- KS E 4111-1980 Interferometer type instrumental gas detector for inflammable gas
- KS E 4111-1996 Interferometer type instrumental gas detector for inflammable gas
- KS E 4111-1996(2011) INTERFEROMETER TYPE INSTRUMENTAL GAS DETECTOR FOR INFLAMMABLE GAS
- KS B 0506-2016 Instruments for the Measurement of Surface Roughness by the Interferometric Method
- KS B 8400-2-2010 Lasers and laser-related equipments-Test methods for laser interferometers for displacement measurement-Part 2:Test methods for laser interferometers
- KS B 0506-1975 Instruments for the Measurement of Surface Roughness by the Interferometric Method
- KS B 8400-2-2015 Lasers and laser-related equipments — Test methods for laser interferometers for displacement measurement — Part 2: Test methods for laser interferometers
- KS E 4115-2006(2011) Interferometer type gas alarms
- KS B 8400-2-2020 Lasers and laser-related equipments — Test methods for laser interferometers for displacement measurement — Part 2: Test methods for laser interferometers
- KS B 8400-2-2015(2020) Lasers and laser-related equipments — Test methods for laser interferometers for displacement measurement — Part 2: Test methods for laser interferometers
- KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
- KS E 4115-1980 Interferometer type gas alarms
- KS E 4115-2006 Interferometer type gas alarms
- KS B 0506-2021 Instruments for the Measurement of Surface Roughness by the Interferometric Method
- KS M 0043-2019 General rules for X-ray diffractometric analysis
- KS R 9194-1996 Testing methods of permissible interference values for track circuit device
- KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary
- KS B 0506-2016(2021) Instruments for the Measurement of Surface Roughness by the Interferometric Method
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS L 2106-2009 Measuring method for the homogeneity of glasses by laser interferometry
- KS L 2106-1994 Measuring method for the homogeneity of glasses by laser interferometry
- KS L 2106-2019 Measuring method for the homogeneity of glasses by laser interferometry
SCC
- ITU-R P.526-15-2019 Propagation by diffraction
- VDI/VDE 2655 BLATT 1.3-2020 Optical measurement technology on microtopographies - calibration of area-measuring interferometers and interference microscopes for shape measurement
- BS PD ISO/TR 14999-3:2005 Optics and photonics. Interferometric measurement of optical elements and optical systems-Calibration and validation of interferometric test equipment and measurements
- JIS B 7072-2:2020 Measuring method for temperature coefficient of refractive index of optical glass -- Part 2: Interferometry
- DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- DIN 7155-2:1966 ISO-fits for the shaft basis system; tolerances of fit (clearances and interferences)
- BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
ITU-R - International Telecommunication Union/ITU Radiocommunication Sector
- ITU-R P.526-2-1992 Propagation by Diffraction
- ITU-R P.526-7-2001 Propagation by Diffraction
- ITU-R P.526-14-2018 Propagation by diffraction
- ITU-R P.526-5-1997 Propagation by Diffraction
- ITU-R P.526-9-2005 Propagation by diffraction
- ITU-R P.526-3-1994 Propagation by Diffraction
- ITU-R P.526-12-2012 Propagation by diffraction
- ITU-R P.526-4-1995 Propagation by Diffraction
- ITU-R P.526-6-1999 Propagation by Diffraction
- ITU-R BO.1293-1997 Protection Masks and Associated Calculation Methods for Interference into Broadcast Satellite Systems Involving Digital Emissions
- ITU-R BO.1293-1-2000 Protection Masks and Associated Calculation Methods for Interference into Broadcast Satellite Systems Involving Digital Emissions
- QUESTION 203-1/7-1997 Characteristics and telecommunication requirements for space very long baseline interferometry
- ITU-R S.1428-1 FRENCH-2001 Reference FSS Earth-Station Radiation Patterns for Use in Interference Assessment Involving Non-GSO Satellites in Frequency Bands between 10.7 GHz and 30 GHz
GB-REG
- REG NASA-LLIS-1595--2005 Lessons Learned - Interferometer Design
British Standards Institution (BSI)
- PD ISO/TR 14999-3:2005 Optics and photonics. Interferometric measurement of optical elements and optical systems. Calibration and validation of interferometric test equipment and measurements
- BS ISO 6760-2:2024 Optics and photonics. Test method for temperature coefficient of refractive index of optical glasses - Interferometric method
- BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
- BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
- BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
- 23/30446938 DC BS ISO 6760-2. Optics and photonics. Test method for temperature coefficient of refractive index of optical glasses - Part 2. Interferometric method
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
- NP 516-2000 Cereals and cereal products Determination of moisture content Routine reference method
American Society for Testing and Materials (ASTM)
- ASTM E2246-02 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-05 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-02 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-05 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-11 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-02 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11e1 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11e1 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-11e1 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM E2244-05 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11(2018) Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11(2018) Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
- ASTM E2246-11(2018) Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2539-14(2017) Standard Test Method for Multiangle Color Measurement of Interference Pigments
IET - Institution of Engineering and Technology
- THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
- APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory
- GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
Japanese Industrial Standards Committee (JISC)
- JIS M 7625:1993 Interferometer type gas alarms
- JIS Z 4751-2-43:2005 Medical electrical equipment -- Part 2-43: Particular requirements for the safety of X-ray equipment for interventional procedures
- JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
International Organization for Standardization (ISO)
- ISO/TR 14999-3:2005 Optics and photonics - Interferometric measurement of optical elements and optical systems - Part 3: Calibration and validation of interferometric test equipment and measurements
- ISO/DIS 6760-2:2014 Optics and photonics — Test method for temperature coefficient of refractive index of optical glasses — Part 2: Interferometric method
- ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
- ISO/CD 6760-2.2 Optics and photonics — Test method for temperature coefficient of refractive index of optical glasses — Part 2: Interferometric method
American National Standards Institute （ANSI)
- ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/ASME B1.12-1987 Class 5 Interference - Fit Thread
- ANSI/ASME B89.1.8-2011 Performance Evaluation of Displacement-Measuring Laser Interferometers
- ANSI/EIA 455-179:1988 Inspection of Cleaved Fiber End Faces by Interferometry
AT-ON
- ONORM M 1320-1993 Interference fits - Design Ajustements serres - Conception
United States Navy
- NAVY MIL-B-28850 (7)-1986 BLANKERS, INTERFERENCE, MX-8757/UPX, MX-8758/UPX, AND MX-8758A/UPX
- NAVY MIL-B-28850-1979 BLANKERS, INTERFERENCE, MX-8757/UPX, MX-8758/UPX, AND MX-8758A/UPX
Standard Association of Australia （SAA）
- ISO 6760-2:2024 Optics and photonics - Test method for temperature coefficient of refractive index of optical glasses - Part 2: Interferometric method
AIA/NAS - Aerospace Industries Association of America Inc.
- NASM14218-1998 Rivet@ Solid@ 120 Degrees Flush Interference Shear Head
- NASM14218-2010 RIVET@ SOLID@ 120 DEGREES FLUSH INTERFERENCE SHEAR HEAD (Rev 1)
German Institute for Standardization
- DIN 976-2:2009 Stud bolts - Part 2: Metric interference thread MFS
- DIN 976-2:1995 Stud bolts - Part 2: Metric interference thread MFS
- DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
- DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
CU-NC
- NC 78-17-1984 Milk and Milk Derivatives Cheeses Determination of Humidity
- NC 78-18-1984 Milk and Milk Derivatives. Cheeses. Determination of the Content of Fat Matter
U.S. Military Regulations and Norms
- ARMY MIL-F-48616 (2)-1985 FILTER (COATINGS), INFRARED INTERFERENCE, GENERAL SPECIFICATION FOR
- ARMY MIL-F-48616 SUPP 1-1977 FILTER (COATINGS), INFRARED INTERFERENCE, GENERAL SPECIFICATION FOR
- ARMY MIL-F-48616 NOTICE 1-1997 FILTER (COATINGS), INFRARED INTERFERENCE, GENERAL SPECIFICATION FOR
- ARMY MIL-F-48616-1977 FILTER (COATINGS), INFRARED INTERFERENCE, GENERAL SPECIFICATION FOR
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
American Society of Mechanical Engineers (ASME)
- ASME B89.1.8-2011 Performance Evaluation of Displacement-Measuring Laser Interferometers
- ASME B89.1.8-2011(R2021) Performance Evaluation of Displacement-Measuring Laser Interferometers
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE 952-2020 IEEE Standard for Specifying and Testing Single-Axis Interferometric Fiber Optic Gyros
- IEEE Std 952-2020 IEEE Standard for Specifying and Testing Single-Axis Interferometric Fiber Optic Gyros
Association Francaise de Normalisation
- NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
- NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
- NF E11-016:1987 Length measuring instruments - Fringe counting,laser source interferometers
- NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.
European Committee for Standardization (CEN)
- EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)
GSO
- BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
- OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
- GSO ISO/TR 14999-3:2014 Optics and photonics -- Interferometric measurement of optical elements and optical systems -- Part 3: Calibration and validation of interferometric test equipment and measurements
- GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
- BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
Aerospace Industries Association/ANSI Aerospace Standards
- AIA/NAS NAS 1810-1978 Rivet-Hi-Shear, Flat Head Interference Fit, Titanium Alloy (Rev. 1)
- AIA/NAS NAS 1814-1978 Rivet-Hi-Shear, Flat Head Interference Fit, Titanium Alloy (Rev. 1)
- AIA/NAS NAS 1816-1978 Rivet-Hi-Shear, Flat Head Interference Fit, Titanium Alloy Rev. 1
- AIA/NAS NAS 1808-1978 Rivet-Hi-Shear, Flat Head Interference Fit, Titanium Alloy (Rev. 1)
- AIA/NAS NAS 1812-1978 Rivet-Hi-Shear, Flat Head Interference Fit, Titanium Alloy (Rev. 1)
- AIA/NAS NAS 1806-1978 Rivet-Hi-Shear, Flat Head Interference Fit, Titanium Alloy Rev. 1
ES-UNE
- UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)
Aerospace Industries Association
- AIA NASM14218-1998 Rivet, Solid, 120 Degrees Flush Interference Shear Head FSC 5320
CEN - European Committee for Standardization
- EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
KR-KS
- KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary
- KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
SAE - SAE International
- SAE J2739-2007 Absorptive and Interference Coatings Applied on Replaceable Headlamp Bulbs
- SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction
Society of Automotive Engineers (SAE)
- SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
- SAE J2739-2011 Absorptive and Interference Coatings Applied on Replaceable Headlamp Bulbs (Stabilized Type)
- SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
Electron Diffraction and Electron Microscopy,X-ray Diffraction and Polycrystalline X-ray Diffraction,Interference and Diffraction of Light,Transmission and Diffraction,interference diffraction,Diffraction and xrd,Interference Diffraction and Polarization,interference diffraction,polarization interference diffraction,polarization diffraction interference,Polarization + Interference + Diffraction,polarization interference diffraction,Diffraction and Transmission,interference, diffraction or polarization,Interference and Diffraction,light interference diffraction,Scattering and Diffraction,Light Interference Diffraction Polarization Demonstration Instrument,Interferometric terahertz waves and non-interferential terahertz waves,Electron Diffraction and Electron Diffraction
