single crystal domain film
single crystal domain film, Total:49 items.
The international standard classification for "single crystal domain film" includes: Glass products , Other insulating materials , Other treatments and coatings .
The Chinese standard classification for "single crystal domain film" includes: Industrial technical glass , Electrical insulating material and its products , Material Protection , Special electronic technology material , Technical Management , Technical management .
Group Standards of the People's Republic of China
- T/XAI 16-2023 The specification for mask drawing design of COF tape
- T/XAI 8-2021 The test method for tin thickness of COF—Coulomb method
- T/CASME 17-2022 Pneumatic diaphragm single seat regulating valve
- T/QGCML 1655-2023 Thin film transistor LCD
- T/CECA 69-2022 Single-crystal thin film substrates for SAW devices
- T/CITS 301-2025 Opal-structured photonic crystal films
- T/XAI 14-2023 The specification for drawing design of COF tape
- T/ZZB 0514-2018 Optical Reflector Film for TFT-LCD Panel Display
- T/XAI 15-2023 The specifications for solder resist graphics of COF tape
- T/XAI 7-2021 The test method for bending of COF
- T/XAI 9-2021 The test method for solder resist hardness of COF
- T/XAI 12-2021 The method for electrical testing of COF tape
- T/TMAC 133-2025 Liquid Crystal Polymer (LCP) Film
- T/COEMA 002LCD-2022 Polarizer film of low moisture permeability for TFT-LCD
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- SPC GB/T 37382-2019 Optical functional films -- Films for backlight unit of liquid crystal display -- High temperature and high humidity aging measurement (TEXT OF DOCUMENT IS IN CHINESE)
- GB/T 44538-2024 Carbon based films—Determination of optical properties of amorphous carbon films by spectfoscopic ellipsometry
- GB/T 36289.2-2018 Insulating films of crystalline silicon photovoltaic (PV) modules-Part 2:Fluorine plastic films
- GB/T 31958-2015 Substrate glass for thin film transistor liquid crystal display device
- GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display device
- GB/T 36289.1-2018 Insulating films of crystalline silicon photovoltaic(PV) modules-Part 1:Polyethylene terephthalate films
Professional Standard - Electron
- SJ 2154-1982 Miorocrystal glass substrates for use in thick film integrated circuits
- SJ 20520-1995 Specification for Cadmium-Zine Telluride Slice for Mercury-Cadmium Telluride film
- SJ/T 11516-2015 Specification for thin film transistor (TFT) mask
- SJ/T 11207-1999 Measurement of magnetic properties of YIG single crystal magnetic-films
Professional Standard - Chemical Industry
- HG/T 4357-2012 Polarizer for the Thin Film Transistor -Liquid Crystal Display (TFT-LCD)
- HG/T 5507-2018 Optical functional films-Top diffusion film for liquid crystal display(LCD)backlight unit
Ministry of Housing and Urban-Rural Development of the People's Replublic of China
- GB 51136-2015 Code for design of thin film transistor liquid crystal display plant
Professional Standard - Commodity Inspection
- SN/T 1175-2003 Methods for the inspection of thin film transistor color liquid crystal display devices for import and export
Korean Agency for Technology and Standards (KATS)
- KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
- KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
- KS D 2715-2006(2011) Tensile specimen of single- and poly-crystal nano/micro thin film materials
Japanese Industrial Standards Committee (JISC)
- JIS C 2261:1986 Mica with films on one side (sheets and tapes)
European Committee for Standardization (CEN)
- EN ISO 23216:2022 Carbon based films - Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (ISO 23216:2021)
International Organization for Standardization (ISO)
- ISO 23216:2021 Carbon based films — Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
Defense Logistics Agency
- DLA SMD-5962-01513-2001 MICROCIRCUIT, DIGITAL-LINEAR, 256 OUTPUT, THIN FILM TRANSISTOR (TFT) GATE DRIVER, MONOLITHIC SILICON
- DLA SMD-5962-99590 REV A-2001 MICROCIRCUIT, DIGITAL-LINEAR, 192/200 OUTPUT, THIN FILM TRANSISTOR (TFT) GATE DRIVER, MONOLITHIC SILICON
Association Francaise de Normalisation
- NF EN ISO 23216:2022 Carbon-based films – Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
Ente Nazionale Italiano di Unificazione
- UNI EN ISO 23216:2023 Carbon based films - Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
British Standards Institution (BSI)
- BS EN ISO 23216:2022 Carbon based films. Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
- BS ISO 23216:2021 Carbon based films. Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
- 20/30400316 DC BS ISO 23216. Carbon based films. Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
Spanish Association for Standardization (UNE)
- UNE-EN ISO 23216:2023 Carbon based films - Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (ISO 23216:2021)
German Institute for Standardization
- DIN EN ISO 23216:2023-01 Carbon based films - Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (ISO 23216:2021); German version EN ISO 23216:2022
- DIN EN ISO 23216:2023 Carbon based films - Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (ISO 23216:2021)
- DIN EN ISO 23216 E:2022-08 Carbon-based films Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (draft)
Danish Standards Foundation
- DANSK DS/ISO 23216:2021 Carbon based films – Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry
- DANSK DS/EN ISO 23216:2022 Carbon based films – Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (ISO 23216:2021)
Standards Norway
- NS-EN ISO 23216:2022 Carbon based films - Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry (ISO 23216:2021)
American Society for Testing and Materials (ASTM)
- ASTM F1618-02 Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
