Scanning Electron Microscopy and X-rays
Scanning Electron Microscopy and X-rays, Total:33 items.
The international standard classification for "Scanning Electron Microscopy and X-rays" includes: Protection against crime , Other standards related to analytical chemistry , Optical equipment .
The Chinese standard classification for "Scanning Electron Microscopy and X-rays" includes: Crime judging technology , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument .
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
Professional Standard - Public Safety Standards
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1520-2018 Forensic science―Examination methods for elements of black powder and flash powder―Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
- GA/T 823.3-2018 Examination methods for paint evidence in Forensics―Part 3:Scanning electron microscope/energy dispersive X-ray analysis(SEM/EDX)
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Professional Standard - Commodity Inspection
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export-Part 1:X-ray diffraction and scan electron microscopy method
国家能源局
- NB/T 10122-2018 Shale scanning and imagination method using X-ray computed tomography
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
Group Standards of the People's Republic of China
- T/CAB 0144-2022 Recycled Anode Metal Target for X-Ray Tube of CT Scanner
International Organization for Standardization (ISO)
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
American Society for Testing and Materials (ASTM)
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
- ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
- ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
American National Standards Institute （ANSI)
- ANSI/ASME B89.4.23-2020 X-Ray Computed Tomography (CT) Performance Evaluation
American Society of Mechanical Engineers (ASME)
- ASME B89.4.23-2020 X-Ray Computed Tomography (CT) Performance Evaluation
GB-REG
- REG NASA-LLIS-0801--2000 Lessons Learned ?Advanced Computed X-Ray Tomography
SCC
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
Japanese Industrial Standards Committee (JISC)
- JIS B 7442:2013 Industrial X-ray CT systems.Vocabulary
GOSTR
- PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
x-ray scanning electron microscope,scanning electron microscope x-ray,Scanning Electron Microscopy and X-rays,SEM characteristic x-rays,Water and X-ray Fluorescence,SEM and X-ray,SEM x-ray analysis,related to x-rays,X-ray and SEM,scanning electron microscope x-ray,x-ray scanning electron microscope,X-ray Diffraction and X-ray Fluorescence,x-ray and surface analysis,Rays and Matter x,Continuous X-ray vs Fluorescent X-ray,gamma rays vs. x-rays,x-rays vs gamma rays,x ray and water,Continuous X-ray vs. X-ray Fluorescence
