x-ray scanning electron microscope
x-ray scanning electron microscope, Total:5 items.
The international standard classification for "x-ray scanning electron microscope" includes: Optical equipment , Other standards related to analytical chemistry .
The Chinese standard classification for "x-ray scanning electron microscope" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
Professional Standard - Public Safety Standards
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
Scanning Electron Microscopy-X-ray Spectroscopy,x-ray scanning electron microscope,Scanning Electron Microscopy X-ray Spectroscopy,Scanning Electron Microscopy X-ray Spectroscopy,x-ray feature x-ray,scanning electron microscope x-ray,X-ray energy dispersive scanning electron microscope,Feature x-ray x-ray,Scanning Electron Microscopy and X-rays,SEM characteristic x-rays,SEM and X-ray,SEM x-ray analysis,X-ray and SEM,scanning electron microscope x-ray,x-ray scanning electron microscope,small angle x-ray x-ray,fluorescent x-ray x-ray,x-ray fluorescence x-ray,x-ray x-ray imaging
