Electron probes are non-destructive
Electron probes are non-destructive, Total:54 items.
The international standard classification for "Electron probes are non-destructive" includes: Other standards related to analytical chemistry , Optical measuring instruments , Optical equipment , Surgical instruments and materials .
The Chinese standard classification for "Electron probes are non-destructive" includes: Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Other special devices , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 15075-1994 Method for testing EPMA instrument
- GB/T 15074-2008 General guide of quantitative analysis by EPMA
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products - Part 1: Method of electron probe microanalysis
Professional Standard - Military and Civilian Products
- WJ 2297-1995 Electronic Probe Verification Regulations
Professional Standard - Medicine
- YY/T 0172-1994 Explorer for womb
- YY/T 0172-2014 Uterine probe
National Metrological Verification Regulations of the People's Republic of China
- JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer
- JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
未注明发布机构
- ANSI/EIA 364-25E:2017 TP-25E Probe Damage Test Procedure for Electrical Connectors
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface
Professional Standard - Petroleum
- SY/T 6027-2012 Quantitative Analysis Method of Rock and Mineral by Electron Probe Microanalysis
- SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals
国家能源局
- SY/T 6027-2019 Quantitative analysis of rocks and minerals by electron probe microanalysis
Taiwan Provincial Standard of the People's Republic of China
- CNS 7664-1987 Method of Test for Low Frequency (Below 3 MHz)Electrical Connectors (TP - 25 Probe Damage Test)
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
Yunnan Provincial Standard of the People's Republic of China
- DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method
CZ-CSN
- CSN ON 81 3790-1966 Electric feeler
- CSN ON 81 3791-1966 Holder of electric íeeler
American National Standards Institute (ANSI)
- ANSI/EIA 364-25C:1998 Electric Connectors – Probe Damage Test Procedure
- ANSI/EIA 364-25D:2010 Probe Damage Test Procedure for Electrical Connectors
Society of Automotive Engineers (SAE)
- SAE TS351-1-1985 TS351 Test for Electrical Connectors Test Probe Damage
British Standards Institution (BSI)
- BS EN ISO 15548-2:2008 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification
- BS EN ISO 15548-2:2013 Non-destructive testing. Equipment for eddy current examination. Probe characteristics and verification
- BS EN 13860-2:2003 Non destructive testing - Eddy current examination - Equipment characteristics and verification - Probe characteristics and verification
ECIA - Electronic Components Industry Association
- RS-364-25A-1983 TP-25A Probe Damage Test Procedure for Electrical Connectors
Japanese Industrial Standards Committee (JISC)
- JIS Z 2316-3:2014 Non-destructive testing -- Eddy current testing -- Part 3: Probe characteristics and verification
- JIS Z 3031:1975 Nondestructive testing symbols for welds
HU-MSZT
- MNOSZ 15510-1955 Surgical instruments. uterine probe
International Organization for Standardization (ISO)
- ISO 15548-2:2008 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification
- ISO/TS 11774:2011 Non-destructive testing - Performance-based qualification
- ISO 18563-2:2017 Non-destructive testing - Characterization and verification of ultrasonic phased array equipment - Part 2: Probes
European Committee for Standardization (CEN)
- EN ISO 15548-2:2013 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification
- EN ISO 18563-2:2017 Non-destructive testing - Characterization and verification of ultrasonic phased array equipment - Part 2: Probes
- EN ISO 12718:2019 Non-destructive testing - Eddy current testing - Vocabulary (ISO 12718:2019)
German Institute for Standardization
- DIN EN ISO 15548-2:2009 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification (ISO 15548-2:2008); English version of DIN EN ISO 15548-2:2009-01
- DIN EN ISO 9934-2:2003 Non-destructive testing - Magnetic particle testing - Part 2: Detection media (ISO 9934-2:2002); German version EN ISO 9934-2:2002
Korean Agency for Technology and Standards (KATS)
- KS B 6752-2013 Nondestructive examination
- KS B 6752-2004 Nondestructive examination
- KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
- KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
RU-GOST R
- GOST R 55680-2013 Non-destructive testing. Ferrosonde method
- GOST 21104-1975 Non-destructive testing. Ferrosonde method
SE-SIS
- SIS SS 11 45 01-1984 Non-destructive testing - Penetrant flaw detection
KR-KS
- KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
- KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
GSO
- GSO ISO 23833:2015 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
- OS GSO ISO 12710:2013 Non-destructive testing -- Ultrasonic inspection -- Evaluating electronic characteristics of ultrasonic test instruments
- BH GSO ISO 23833:2017 Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
- BH GSO ISO 12710:2016 Non-destructive testing -- Ultrasonic inspection -- Evaluating electronic characteristics of ultrasonic test instruments
SCC
- BS ISO 23833:2006 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
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