Thin Film Reflectometer
Thin Film Reflectometer, Total:42 items.
The international standard classification for "Thin Film Reflectometer" includes: Other organic chemicals , Optics and optical measurements , Testing of metals .
The Chinese standard classification for "Thin Film Reflectometer" includes: Organic chemicals in general , Optical instrument in general , Metal physical property test method .
工业和信息化部
- HG/T 5676-2020 Silver reflective film with high reflectivity
- HG/T 5854-2021 Optical functional films--Coated reflective film
Group Standards of the People's Republic of China
- T/ZZB 0514-2018 Optical Reflector Film for TFT-LCD Panel Display
- T/CPIA 0036.1-2022 Retroreflective optical films for photovoltaic modules Part 1: Films for tinned ribbon surfaces
National Metrological Technical Specifications of the People's Republic of China
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27583-2011 Optical functional films - Determination of reflected glare
- GB/T 26332.5-2022 Optics and photonics—Optical coatings—Part 5: Minimum requirements for antireflecting coatings
- GB/T 26332.6-2022 Optics and photonics—Optical coatings—Part 6: Minimum requirements for reflecting coatings
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40279-2021 Test method for thickness of films on silicon wafer surface—Optical reflection method
Professional Standard - Chemical Industry
- HG/T 4915-2016 White reflective films-Determination of reflectance
- HG/T 5854~5857-2021 Coated reflective films for optical functional films, triacetyl cellulose (TAC) anti-glare films, anti-fouling cured films, and transparent cured films for cover plates (2021)
Professional Standard - Machinery
- JB/T 8226.3-1999 Coating for optical element front surface reflecting coating
- JB/T 8226.1-1999 Coating for optical element anti-reflection coating
- JB/T 5589-1991 Optical Part Coatings - High Reflectance Film
- JB/T 8226.4-1999 Coating for optical element rear surface mirror coating
- JB/T 4167-1999 Membrane type pneumatic measuring instrument
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB/J 5463-2005 Verification regulation for measurement equipment of optical film refractive index and thickness
Military Standard of the People's Republic of China-General Armament Department
- GJB 8687-2015 Calibration procedures for optical film refractive index and thickness testers
American Society for Testing and Materials (ASTM)
- ASTM E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2444-11(2018) Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2244-11(2018) Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-05 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-05 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444-05e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2246-11 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-02 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2444-11e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
- ASTM E2244-02 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-02 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-05 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11e1 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2244-11e1 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-11e1 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2246-11(2018) Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
- ASTM E2245-11(2018) Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
Society of Automotive Engineers (SAE)
- SAE AMS2521C-2013 Coating, Reflection-Reducing for Instrument Glasses
GM North America
- GM GM3656M-1996 Exterior Reflective Film
RO-ASRO
- STAS 10157-1975 PAINTS AND VARNISHES Determination of film gloss by measuring specular reflexion
Japanese Industrial Standards Committee (JISC)
- JIS R 1698:2015 Measurement of spectral reflectance of fine ceramics thin films under humid condition
SCC
- AWWA SP250144 Electrolyte Selectivity By Thin-Film Composite Reverse Osmosis Membranes
Thin Film Stress Apparatus,UV film reflectance,Thin Film Stress Apparatus,X-ray thin film reflectometer,Thin Film Reflectometer,Thin Film Reflectometer,Thin film concentrator,Thin film reflection,Nano thin film instrument,thin film diffractometer,Thin film breather,Film Thickness Gauge,Thin Film Preparation Apparatus,Film Tensile Tester,Film Tensile Tester,Film Scratch Tester,Film Thickness Gauge,x-ray reflective film thickness,Film reflectance