boron ion mass
boron ion mass, Total:107 items.
The international standard classification for "boron ion mass" includes: Toys , Testing of metals , Chemical analysis , Chemical analysis of metals , Semiconducting materials , Conducting materials , Ferrous metals in general , Surface active agents , Aluminium and aluminium alloys , Fertilizers , Other non-ferrous metals and their alloys , Materials for aerospace construction , Aluminium , Ferroalloys , Iron and steel castings .
The Chinese standard classification for "boron ion mass" includes: Semimetal and semiconductor material analysis method , Electron optics and other physical optics instrument , Basic standards and general methods , Semimetal and semiconductor material in general , Carbon material , Steel and iron alloy analysis method , Tooth paste, soap and detergent , Heavy metals and their alloys , Basic standards and general methods on chemical fertilizers , Precious metals and its alloy analysis method , Powder metallurgy analysis method , Metallurgy material and auxiliary material in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 39138.3-2020 Methods for chemical analysis of gold nickel chromium iron silicon boron alloys—Part 3:Determination of chromium,iron,silicon and boron contents—Inductively coupled plasma atomic emission spectrometry
- GB/T 32281-2015 Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry
- GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- GB/T 41435-2022 Determination of boric acid and salts of boric acid in toy materials —Inductively coupled plasma mass spectrometry
- GB/T 223.81-2007 Iron steel and alloy—Determination of total aluminum and total boron contents—Microwave digestion-inductively coupled plasma mass spectrometric method
- GB/T 42906-2023 Graphite materials―Test method for equivalent boron contents―Inductively coupled plasma atomic emission spectrometry
- GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry
- GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- GB/T 38791-2020 Oral care and cleansing products—Determination of boric acid and borates in toothpastes—Inductively coupled plasma atomic emission spectrometry
- GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
- GB/T 34764-2017 Determination of copper,iron,zinc,manganese,boron and molybdenum content in fertilizers-Inductively coupled plasma optical emission spectroscopy
- GB/T 6987.27-2001 Aluminium and aluminium alloys-Determination of copper content-Ion selective electrode method
Tianjin Provincial Standard of the People's Republic of China
- DB12/T 1022-2020 Determination of Available Boron Content in Soil by Inductively Coupled Plasma Mass Spectrometry
Group Standards of the People's Republic of China
- T/DCB 015-2024 Lithium difluorooxalate borate for lithium-ion batteries
- T/HMS 005-2023 Iron and steel-Determination of acid solvable boron content- Inductively coupled plasma atomic emission spectrometric method
- T/LNEMA 014-2024 Determination of Boron in Soil by Inductively Coupled Plasma Mass Spectrometry
- T/QAS 023-2020 Determination of lead content in industrial boric acid by inductively coupled plasma emission spectrometry
- T/CNIA 0012-2019 Determination of Boron, Phosphorus, Iron, Aluminum, Calcium, Titanium Content in Silicon Powder - Inductively Coupled Plasma Atomic Emission Spectrometry
- T/ADBM 001-2016 Air Anion Concentration Standard For Passenger Car
- T/NXCL 025-2023 Method for chemical analysis of beryllium — Determination of boron,cobalt,silver,lead,cadmium and lithium contents—Inductively coupled plasma mass spectrometry
- T/WSJD 20-2021 Specifications for quality control and testing of proton/carbon ion beam radiotherapy devices
- T/GXAS 480-2023 Soil and sediments-Determination of boron-Inductively coupled plasma mass spectrometry(ICP-MS)
- T/GXAS 720-2024 Ion-absorbing type rare earths ore—Determination of total rare earth ion phase—Inductively coupled plasma mass spectrometery
- T/SCS 000013-2021 Determination of Inorganic Anions(F-、Cl-、Br-、I-) in boron carbide – silicon carbide pellets By Ion Chromatography
Jilin Provincial Standard of the People's Republic of China
- DB22/T 1810-2013 Determination of boric acid and borate in food by ion chromatography
- DB22/T 1689-2012 Determination of copper, iron, manganese, zinc, boron, molybdenum in fertilizers by inductively coupled plasma spectrometry
- DB22/T 1809-2013 Determination of boric acid and borate in cosmetics by ion chromatography
Professional Standard - Non-ferrous Metal
- YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
- YS/T 423.3-2000 Methods for chemical analysis of nuclear-grade boron carbide powder—Determination of uncarbonized boron content
- YS/T 1539-2022 Determination of boron nitride content in aluminum-base powder-Inductively coupled plusma atomic emission spectrometry
- YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography
Professional Standard - Aviation
- HB 5220.41-1995 Chemical Analysis Method of High Temperature Alloy Chloroborate Ion Selective Electrode Method for Determination of Boron Content
- HB/Z 5218.25-2004 Methods for chemical analysis of aluminium alloys-Part 25:Determination of boron content by ion selective electrode method
- HB 5220.41-2008 Methods for Chemical Analysis of Superalloys - Part 41: Determination of Boron Content by Fluoroborate Ion Selective Electrode Method
Professional Standard - Agriculture
- SN/T 3826-2014 Determination for the content of boric acid and borate in cosmetics for import and export - Atomic emission spectrometry of inductive coupling plasma
Professional Standard - Geology
- DZ/T 0184.37-2024 Isotope analysis methods for geological samples Part 37: In situ boron isotope composition determination of micro-areas of boron-rich minerals by laser ablation-multi-collector inductively coupled plasma mass spectrometry
Professional Standard - Ferrous Metallurgy
- YB/T 190.12-2014 Continuous casting mould powder. The determination of boron trioxide content. The inductively coupled plasma atomic emission spectrometric method
- YB/T 6279-2024 Silica, iron, aluminum, calcium, boron, and phosphorus content determination by inductively coupled plasma atomic emission spectroscopy
- YB/T 4462-2015 High purity ferrosilicon. Determination of boron content. Inductively coupled plasma atomic emission spectrometric method
Professional Standard - Energy
- NB/SH/T 6046-2021 Standard test method for determining the biobased content of liquid petroleum products using radiocarbon analysis by accelerator mass spectrometry
Sichuan Provincial Standard of the People's Republic of China
- DB51/T 1698-2013 Determination of borate in cosmetics by ion exclusion chromatography
Professional Standard - Commodity Inspection
- SN/T 3515-2013 Iron, steel and alloy - Determination of boron, titanium, zirconium, niobium, tin, antimony, tantalum, tungsten and lead - Inductively coupled plasma mass spectrometric
Korean Agency for Technology and Standards (KATS)
- KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
- KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
- KS D ISO 17560:2003 Surface chemical analysis-Secondary-on mass spectrometry- Method for depth profiling of boron in silicon
- KS M ISO 2871-2022 Surface active agents-Detergents-Determination of cationic-active matter content-High-molecular-mass cationic-active matter
- KS M ISO 2871-2007(2017) Surface active agents-Detergents-Determination of cationic-active matter content-High-molecular-mass cationic-active matter
- KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
- KS M ISO 2871-2007(2022) Surface active agents-Detergents-Determination of cationic-active matter content-High-molecular-mass cationic-active matter
- KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
- KS M ISO 2871-2-2022 Surface active agents-Detergents-Determination of cationic-active matter content-Cationic-active matter of low molecular mass(between 200 and 500)
- KS M ISO 2871-2-2007(2017) Surface active agents-Detergents-Determination of cationic-active matter content-Cationic-active matter of low molecular mass(between 200 and 500)
- KS A 4043-1982 PERSONAL DOSEMETERS FOR boron coated NEUTRONS
- KS I ISO 14911:2009 Water quality-Determination of dissolved Li+, Na+,NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ using ion chromatography-Method for water and waste water
- KS M ISO 2871-2-2007(2022) Surface active agents-Detergents-Determination of cationic-active matter content-Cationic-active matter of low molecular mass(between 200 and 500)
International Organization for Standardization (ISO)
- ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
- ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
- ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
- ISO 14911:1998 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water
British Standards Institution (BSI)
- BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
- BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
- BS EN ISO 2871-1:1994 High molecular mass cationic-active matter
- BS ISO 14237:2000 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
- BS EN ISO 2871-2:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Cationic-active matter of low molecular mass (between 200 and 500)
- BS EN ISO 2871-2:1994 Surface active agents. Detergents. Determination of cationic-active matter content-Cationic-active matter of low molecular mass (between 200 and 500)
- 09/30153670 DC BS ISO 14237. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
- BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Association Francaise de Normalisation
- NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- NF ISO 14237:2010 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron atoms in silicon using uniformly doped materials
- NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.
- NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
- NF T90-048*NF EN ISO 14911:1999 Water quality - Determination of dissolved Li+, Na+, NH 4+, K+, Mn 2+, Ca 2+, Mg 2+, Sr 2+ and Ba 2+ using ion chromatography - Method for water and waste water.
- NF T73-320:1994 Surface active agents. Detergents. Determination of cationic-active matter content. Part 1 : high-molecular-mass cationic-active matter.
- NF T73-320-1*NF EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1 : high-molecular-mass cationic-active matter.
Japanese Industrial Standards Committee (JISC)
- JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- JIS K 0143:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
- JIS G 1258-7:2007 Iron and steel -- ICP atomic emission spectrometric method -- Part 7: Determination of boron content -- Distillation as trimethyl borate
- JIS K 0143:2000 Surface chemical analysis -- Secondary ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
- JIS H 1632-3:2014 Titanium.ICP atomic emission spectrometry.Part 3: Determination of boron
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Standard Association of Australia (SAA)
- AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
- AS ISO 14237:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
European Committee for Standardization (CEN)
- EN ISO 14911:1999 Water Quality - Determination of Dissolved Li+, Na+, NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ Using Ion Chromatography - Method for Water and Waste Water ISO 14911:1998
GCC Standardization Organization
- GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- GSO ISO 2871-1:2015 Surface active agents -- Detergents -- Determination of cationic-active matter content -- Part 1: High-molecular-mass cationic-active matter
- GSO ISO 14237:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Gosstandart of Russia
- GOST 27869-2019 High purity substances. Method for concentration of microimpurities by ion exchange
- GOST 27869-1988 High purity substances. Method for concentration of microimpurities by ion exchange
- GOST R 54352-2011 Food common salt. Determination of a mass fraction of magnesium-ion and calcium-ion by complexonometric method
German Institute for Standardization
- DIN EN ISO 2871-1:1994 Determination of cationic-active matter content of detergents - High-molecular mass cationic-active matter (ISO 2871-1:1988)
- DIN EN ISO 2871-1:2010-06 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter (ISO 2871-1:2010); German version EN ISO 2871-1:2010
- DIN EN ISO 14911:1999 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water (ISO 14911:1998); G
Ente Nazionale Italiano di Unificazione
- UNI EN ISO 2871-1:1996 Surface active agents. Detergents - Determination of cationic-active matter content. High-molecular-mass cationic- active matter.
South African Bureau of Standard
- SANS 163-2:1995 Water quality - Determination of dissolved anions by liquid chromatography of ions Part 2: Determination of bromide, chloride, nitrate, nitrite, orthophosphate and sulfate in waste water
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- OS GSO ISO 2871-1:2015 Surface active agents -- Detergents -- Determination of cationic-active matter content -- Part 1: High-molecular-mass cationic-active matter
Danish Standards Foundation
- DANSK DS/EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter
- DS/EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter
CH-SNV
- VSM 11875-1942 Anionic asphalt emulsifier. quality regulations
Spanish Association for Standardization (UNE)
- UNE-EN ISO 2871-1:1995 SURFACE ACTIVE AGENTS. DETERGENTS. DETERMINATION OF CATIONIC-ACTIVE MATTER CONTENT. PART 1: HIGH-MOLECULAR-MASS CATIONIC-ACTIVE MATTER. (ISO 2871-1:1988)
CZ-CSN
- CSN 70 0623 Cast.2-1976 Chemical analysis of glass. Determina- tion of boric oxide. Volumetric method (after the separation with ion exchanger)
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