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Database: 365,228(8 Aug 2026)

boron ion mass

boron ion mass, Total:107 items.

The international standard classification for "boron ion mass" includes: Toys , Testing of metals , Chemical analysis , Chemical analysis of metals , Semiconducting materials , Conducting materials , Ferrous metals in general , Surface active agents , Aluminium and aluminium alloys , Fertilizers , Other non-ferrous metals and their alloys , Materials for aerospace construction , Aluminium , Ferroalloys , Iron and steel castings .

The Chinese standard classification for "boron ion mass" includes: Semimetal and semiconductor material analysis method , Electron optics and other physical optics instrument , Basic standards and general methods , Semimetal and semiconductor material in general , Carbon material , Steel and iron alloy analysis method , Tooth paste, soap and detergent , Heavy metals and their alloys , Basic standards and general methods on chemical fertilizers , Precious metals and its alloy analysis method , Powder metallurgy analysis method , Metallurgy material and auxiliary material in general .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 39138.3-2020 Methods for chemical analysis of gold nickel chromium iron silicon boron alloys—Part 3:Determination of chromium,iron,silicon and boron contents—Inductively coupled plasma atomic emission spectrometry
  • GB/T 32281-2015 Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry
  • GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry
  • GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • GB/T 41435-2022 Determination of boric acid and salts of boric acid in toy materials —Inductively coupled plasma mass spectrometry
  • GB/T 223.81-2007 Iron steel and alloy—Determination of total aluminum and total boron contents—Microwave digestion-inductively coupled plasma mass spectrometric method
  • GB/T 42906-2023 Graphite materials―Test method for equivalent boron contents―Inductively coupled plasma atomic emission spectrometry
  • GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry
  • GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • GB/T 38791-2020 Oral care and cleansing products—Determination of boric acid and borates in toothpastes—Inductively coupled plasma atomic emission spectrometry
  • GB/T 20176-2006 Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials
  • GB/T 34764-2017 Determination of copper,iron,zinc,manganese,boron and molybdenum content in fertilizers-Inductively coupled plasma optical emission spectroscopy
  • GB/T 6987.27-2001 Aluminium and aluminium alloys-Determination of copper content-Ion selective electrode method

Tianjin Provincial Standard of the People's Republic of China

  • DB12/T 1022-2020 Determination of Available Boron Content in Soil by Inductively Coupled Plasma Mass Spectrometry

Group Standards of the People's Republic of China

  • T/DCB 015-2024 Lithium difluorooxalate borate for lithium-ion batteries
  • T/HMS 005-2023 Iron and steel-Determination of acid solvable boron content- Inductively coupled plasma atomic emission spectrometric method
  • T/LNEMA 014-2024 Determination of Boron in Soil by Inductively Coupled Plasma Mass Spectrometry
  • T/QAS 023-2020 Determination of lead content in industrial boric acid by inductively coupled plasma emission spectrometry
  • T/CNIA 0012-2019 Determination of Boron, Phosphorus, Iron, Aluminum, Calcium, Titanium Content in Silicon Powder - Inductively Coupled Plasma Atomic Emission Spectrometry
  • T/ADBM 001-2016 Air Anion Concentration Standard For Passenger Car
  • T/NXCL 025-2023 Method for chemical analysis of beryllium — Determination of boron,cobalt,silver,lead,cadmium and lithium contents—Inductively coupled plasma mass spectrometry
  • T/WSJD 20-2021 Specifications for quality control and testing of proton/carbon ion beam radiotherapy devices
  • T/GXAS 480-2023 Soil and sediments-Determination of boron-Inductively coupled plasma mass spectrometry(ICP-MS)
  • T/GXAS 720-2024 Ion-absorbing type rare earths ore—Determination of total rare earth ion phase—Inductively coupled plasma mass spectrometery
  • T/SCS 000013-2021 Determination of Inorganic Anions(F-、Cl-、Br-、I-) in boron carbide – silicon carbide pellets By Ion Chromatography

Jilin Provincial Standard of the People's Republic of China

  • DB22/T 1810-2013 Determination of boric acid and borate in food by ion chromatography
  • DB22/T 1689-2012 Determination of copper, iron, manganese, zinc, boron, molybdenum in fertilizers by inductively coupled plasma spectrometry
  • DB22/T 1809-2013 Determination of boric acid and borate in cosmetics by ion chromatography

Professional Standard - Non-ferrous Metal

  • YS/T 1496-2021 Analysis method for palladium compounds Determination of impurity anion content Ion chromatography
  • YS/T 423.3-2000 Methods for chemical analysis of nuclear-grade boron carbide powder—Determination of uncarbonized boron content
  • YS/T 1539-2022 Determination of boron nitride content in aluminum-base powder-Inductively coupled plusma atomic emission spectrometry
  • YS/T 1497-2021 Analysis method for platinum compounds Determination of impurity anion content Ion chromatography

Professional Standard - Aviation

  • HB 5220.41-1995 Chemical Analysis Method of High Temperature Alloy Chloroborate Ion Selective Electrode Method for Determination of Boron Content
  • HB/Z 5218.25-2004 Methods for chemical analysis of aluminium alloys-Part 25:Determination of boron content by ion selective electrode method
  • HB 5220.41-2008 Methods for Chemical Analysis of Superalloys - Part 41: Determination of Boron Content by Fluoroborate Ion Selective Electrode Method

Professional Standard - Agriculture

  • SN/T 3826-2014 Determination for the content of boric acid and borate in cosmetics for import and export - Atomic emission spectrometry of inductive coupling plasma

Professional Standard - Geology

  • DZ/T 0184.37-2024 Isotope analysis methods for geological samples Part 37: In situ boron isotope composition determination of micro-areas of boron-rich minerals by laser ablation-multi-collector inductively coupled plasma mass spectrometry

Professional Standard - Ferrous Metallurgy

  • YB/T 190.12-2014 Continuous casting mould powder. The determination of boron trioxide content. The inductively coupled plasma atomic emission spectrometric method
  • YB/T 6279-2024 Silica, iron, aluminum, calcium, boron, and phosphorus content determination by inductively coupled plasma atomic emission spectroscopy
  • YB/T 4462-2015 High purity ferrosilicon. Determination of boron content. Inductively coupled plasma atomic emission spectrometric method

Professional Standard - Energy

  • NB/SH/T 6046-2021 Standard test method for determining the biobased content of liquid petroleum products using radiocarbon analysis by accelerator mass spectrometry

Sichuan Provincial Standard of the People's Republic of China

  • DB51/T 1698-2013 Determination of borate in cosmetics by ion exclusion chromatography

Professional Standard - Commodity Inspection

  • SN/T 3515-2013 Iron, steel and alloy - Determination of boron, titanium, zirconium, niobium, tin, antimony, tantalum, tungsten and lead - Inductively coupled plasma mass spectrometric

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
  • KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
  • KS D ISO 17560:2003 Surface chemical analysis-Secondary-on mass spectrometry- Method for depth profiling of boron in silicon
  • KS M ISO 2871-2022 Surface active agents-Detergents-Determination of cationic-active matter content-High-molecular-mass cationic-active matter
  • KS M ISO 2871-2007(2017) Surface active agents-Detergents-Determination of cationic-active matter content-High-molecular-mass cationic-active matter
  • KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
  • KS M ISO 2871-2007(2022) Surface active agents-Detergents-Determination of cationic-active matter content-High-molecular-mass cationic-active matter
  • KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
  • KS M ISO 2871-2-2022 Surface active agents-Detergents-Determination of cationic-active matter content-Cationic-active matter of low molecular mass(between 200 and 500)
  • KS M ISO 2871-2-2007(2017) Surface active agents-Detergents-Determination of cationic-active matter content-Cationic-active matter of low molecular mass(between 200 and 500)
  • KS A 4043-1982 PERSONAL DOSEMETERS FOR boron coated NEUTRONS
  • KS I ISO 14911:2009 Water quality-Determination of dissolved Li+, Na+,NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ using ion chromatography-Method for water and waste water
  • KS M ISO 2871-2-2007(2022) Surface active agents-Detergents-Determination of cationic-active matter content-Cationic-active matter of low molecular mass(between 200 and 500)

International Organization for Standardization (ISO)

  • ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
  • ISO 14911:1998 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water

British Standards Institution (BSI)

  • BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
  • BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
  • BS EN ISO 2871-1:1994 High molecular mass cationic-active matter
  • BS ISO 14237:2000 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
  • BS EN ISO 2871-2:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Cationic-active matter of low molecular mass (between 200 and 500)
  • BS EN ISO 2871-2:1994 Surface active agents. Detergents. Determination of cationic-active matter content-Cationic-active matter of low molecular mass (between 200 and 500)
  • 09/30153670 DC BS ISO 14237. Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials
  • BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Association Francaise de Normalisation

  • NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • NF ISO 14237:2010 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron atoms in silicon using uniformly doped materials
  • NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.
  • NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
  • NF T90-048*NF EN ISO 14911:1999 Water quality - Determination of dissolved Li+, Na+, NH 4+, K+, Mn 2+, Ca 2+, Mg 2+, Sr 2+ and Ba 2+ using ion chromatography - Method for water and waste water.
  • NF T73-320:1994 Surface active agents. Detergents. Determination of cationic-active matter content. Part 1 : high-molecular-mass cationic-active matter.
  • NF T73-320-1*NF EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1 : high-molecular-mass cationic-active matter.

Japanese Industrial Standards Committee (JISC)

  • JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0143:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
  • JIS G 1258-7:2007 Iron and steel -- ICP atomic emission spectrometric method -- Part 7: Determination of boron content -- Distillation as trimethyl borate
  • JIS K 0143:2000 Surface chemical analysis -- Secondary ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
  • JIS H 1632-3:2014 Titanium.ICP atomic emission spectrometry.Part 3: Determination of boron

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Standard Association of Australia (SAA)

  • AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • AS ISO 14237:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

European Committee for Standardization (CEN)

  • EN ISO 14911:1999 Water Quality - Determination of Dissolved Li+, Na+, NH4+, K+, Mn2+, Ca2+, Mg2+, Sr2+ and Ba2+ Using Ion Chromatography - Method for Water and Waste Water ISO 14911:1998

GCC Standardization Organization

  • GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • GSO ISO 2871-1:2015 Surface active agents -- Detergents -- Determination of cationic-active matter content -- Part 1: High-molecular-mass cationic-active matter
  • GSO ISO 14237:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
  • GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Gosstandart of Russia

  • GOST 27869-2019 High purity substances. Method for concentration of microimpurities by ion exchange
  • GOST 27869-1988 High purity substances. Method for concentration of microimpurities by ion exchange
  • GOST R 54352-2011 Food common salt. Determination of a mass fraction of magnesium-ion and calcium-ion by complexonometric method

German Institute for Standardization

  • DIN EN ISO 2871-1:1994 Determination of cationic-active matter content of detergents - High-molecular mass cationic-active matter (ISO 2871-1:1988)
  • DIN EN ISO 2871-1:2010-06 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter (ISO 2871-1:2010); German version EN ISO 2871-1:2010
  • DIN EN ISO 14911:1999 Water quality - Determination of dissolved Li<(hoch)+>, Na<(hoch)+>, NH<(Index)4><(hoch)+>, K<(hoch)+>, Mn<(hoch)2+>, Ca<(hoch)2+>, Mg<(hoch)2+>, Sr<(hoch)2+> and Ba<(hoch)2+> using ion chromatography - Method for water and waste water (ISO 14911:1998); G

Ente Nazionale Italiano di Unificazione

  • UNI EN ISO 2871-1:1996 Surface active agents. Detergents - Determination of cationic-active matter content. High-molecular-mass cationic- active matter.

South African Bureau of Standard

  • SANS 163-2:1995 Water quality - Determination of dissolved anions by liquid chromatography of ions Part 2: Determination of bromide, chloride, nitrate, nitrite, orthophosphate and sulfate in waste water

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • OS GSO ISO 2871-1:2015 Surface active agents -- Detergents -- Determination of cationic-active matter content -- Part 1: High-molecular-mass cationic-active matter

Danish Standards Foundation

  • DANSK DS/EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter
  • DS/EN ISO 2871-1:2010 Surface active agents - Detergents - Determination of cationic-active matter content - Part 1: High-molecular-mass cationic-active matter

CH-SNV

Spanish Association for Standardization (UNE)

  • UNE-EN ISO 2871-1:1995 SURFACE ACTIVE AGENTS. DETERGENTS. DETERMINATION OF CATIONIC-ACTIVE MATTER CONTENT. PART 1: HIGH-MOLECULAR-MASS CATIONIC-ACTIVE MATTER. (ISO 2871-1:1988)

CZ-CSN

  • CSN 70 0623 Cast.2-1976 Chemical analysis of glass. Determina- tion of boric oxide. Volumetric method (after the separation with ion exchanger)