AFM Step Height
AFM Step Height, Total:11 items.
The international standard classification for "AFM Step Height" includes: Test conditions and procedures in general , Optics and optical measurements .
The Chinese standard classification for "AFM Step Height" includes: Basic standards and general methods , Basic Subject in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
Group Standards of the People's Republic of China
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
Professional Standard - Nuclear Industry
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
International Organization for Standardization (ISO)
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
British Standards Institution (BSI)
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ESDU - Engineering Sciences Data Unit
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
GSO
- GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
