Diffraction peak + broadening
Diffraction peak + broadening, Total:61 items.
The international standard classification for "Diffraction peak + broadening" includes: Non-destructive testing , Inorganic chemicals in general , Chemical analysis of metals , Semiconducting materials , Other standards related to optics and optical measurements , Aluminium and aluminium alloys .
The Chinese standard classification for "Diffraction peak + broadening" includes: X ray, magnetic powder, fluorescent light and other defectoscope , Inorganic chemicals in general , Metal physical property test method , Compound semiconductor material , Electron optics and other physical optics instrument .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
- GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
- GB/T 30656-2014 Polished monocrystalline silicon carbide wafers
- GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
- GB/T 23413-2009 Determination of crystallite size and micro - strain of nano - Materials - X - ray diffraction line broadening method
Professional Standard - Electron
- SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
- SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction
Professional Standard - Machinery
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
Professional Standard - Agriculture
- 77药典 四部-2015 0451 X-ray diffraction method
- SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
- 2355药典 二部-2010 Appendix IX FX-Ray Powder Diffraction Method
Taiwan Provincial Standard of the People's Republic of China
- CNS 3260-1971 Peaking Coil
工业和信息化部
- HG/T 5705-2020 Determination of titanium dioxide phase concent in hydrogenation catalysts- X-ray diffractometry
Group Standards of the People's Republic of China
- T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry
- T/BJWA 005-2022 Determination of 17O-NMR FWHM in Water NMR Method
- T/BJWA 004-2022 Low Hertz 17O-NMR FWHM Natural Drinking Water
Professional Standard - Ferrous Metallurgy
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
Professional Standard - Non-ferrous Metal
- YS/T 976-2014 Determination of α-alumina content in calcined alumina by X-ray diffraction
British Standards Institution (BSI)
- BS ISO 19950:2015 Aluminium oxide primarily used for the production of aluminium. Determination of alpha alumina content. Method using X-ray diffraction net peak areas
- BS EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - XRD methods
GSO
- GSO ISO 19950:2021 Aluminium oxide primarily used for the production of aluminium — Determination of alpha alumina content — Method using X-ray diffraction net peak areas
- BH GSO ISO 19950:2022 Aluminium oxide primarily used for the production of aluminium — Determination of alpha alumina content — Method using X-ray diffraction net peak areas
International Organization for Standardization (ISO)
- ISO 19950:2015 Aluminium oxide primarily used for the production of aluminium - Determination of alpha alumina content - Method using X-ray diffraction net peak areas
GOSTR
- GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium
GOST
- GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium
Standard Association of Australia （SAA）
- AS 2879.3:1991 Alumina - Determination of alpha alumina content by X-ray diffraction
- AS 2879.3:2010(R2013) Determination of alpha alumina content in alumina using X-ray diffraction method
- AS 2879.3:2010 Alumina, Part 3: Determination of alpha alumina content by X-ray diffraction
SCC
- ITU-R P.526-15-2019 Propagation by diffraction
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
ITU-R - International Telecommunication Union/ITU Radiocommunication Sector
- ITU-R P.526-2-1992 Propagation by Diffraction
- ITU-R P.526-7-2001 Propagation by Diffraction
- ITU-R P.526-12-2012 Propagation by diffraction
- ITU-R P.526-4-1995 Propagation by Diffraction
- ITU-R P.526-14-2018 Propagation by diffraction
- ITU-R P.526-5-1997 Propagation by Diffraction
- ITU-R P.526-9-2005 Propagation by diffraction
- ITU-R P.526-3-1994 Propagation by Diffraction
- ITU-R P.526-6-1999 Propagation by Diffraction
International Telecommunication Union (ITU)
- ITU-R P.526-2013 Propagation by diffraction
- ITU-R P.526-11-2009 Propagation by diffraction
- ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
- ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
- ITU-R P.526-10-2007 Propagation by diffraction
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Association Francaise de Normalisation
- NF A09-282:2019 Non-destructive testing - Phase quantification by X-ray diffraction
- NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2019 General rules for X-ray diffractometric analysis
IET - Institution of Engineering and Technology
- GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
European Committee for Standardization (CEN)
- EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
German Institute for Standardization
- DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
American Society for Testing and Materials (ASTM)
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
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