Portable Atomic Force Microscope

Portable Atomic Force Microscope, Total:32 items.

The international standard classification for "Portable Atomic Force Microscope" includes: Optics and optical measurements .

The Chinese standard classification for "Portable Atomic Force Microscope" includes: Basic Subject in general .

Taiwan Provincial Standard of the People's Republic of China

CNS 6600-1980 Portable Polarizing Microscope for Sampling and Determining Incombustible Matter in Coal and Rock-Dust Mixture

T/GDASE 0008-2020 Determination of Young's modulus of graphene film
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/CASMES 217-2023 Portable Field Microvickers hardness tester BXLB100
T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)

GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films

TIA-573C000-1998 Sectional Specification for Field-Portable Optical Microscopes
TIA/EIA-573CA00-1998 Blank Detail Specification for Field-Portable Optical Microscopes
EIA-546A000-1989 Sectional Specification for a Field Portable Optical Microscope for Inspection of Optical Waveguides and Related Devices

KS E 4005-1981 Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS E 4005-2007(2012) Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS E 4005-2007 Portable polarizing microscope for sampling and determining incombustible matter in coal and rock-dust mixtures
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS B 5619-2019 Microscopes — Eyepiece reticles

ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy

BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2859-11 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

CAN/CSA C22.2 No.207-M89-1989(R2013) Portable and Stationary Electric Signs and Displays