semiconductor gap

semiconductor gap, Total:59 items.

The international standard classification for "semiconductor gap" includes: Semiconductor devices in general .

The Chinese standard classification for "semiconductor gap" includes: Semiconductor discrete devices in general .

---

Group Standards of the People's Republic of China

• T/CASAS 002-2021 Terminology for wide bandgap semiconductors

Professional Standard - Electron

• SJ 2433-1984 Bonding sheet for semiconductor tubes

Military Standard of the People's Republic of China-General Armament Department

• GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

Guangdong Provincial Standard of the People's Republic of China

• DB44/T 1873-2016 semiconductor refrigeration wine cabinet

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors
• GB/T 3859.2-1993 Semiconductor convertors Application guide

British Standards Institution (BSI)

• BS EN 62418:2010 Semiconductor devices. Metallization stress void test
• BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
• BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
• BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
• BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
• BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices
• BS EN 62779-1:2016 Semiconductor devices. Semiconductor interface for human body communication. General requirements
• BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
• BS IEC 60747-6:2001 Discrete semiconductor devices and integrated circuits - Thyristors
• BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors
• BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
• BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
• BS IEC 60747-14-1:2010 Semiconductor devices - Semiconductor sensors - Generic specification for sensors
• BS IEC 62779-4:2020 Semiconductor devices. Semiconductor interface for human body communication - Capsule endoscope
• BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices - Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
• BS EN 62779-2:2016 Semiconductor devices. Semiconductor interface for human body communication. Characterization of interfacing performances

Association Francaise de Normalisation

• NF C80-204*NF EN 62418:2011 Semiconductor devices - Metallization stress void test
• NF C96-015:2005 Discrete semiconductor devices - Part 15: isolated power semiconductor devices
• NF C96-779-1*NF EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1 : general requirements

International Electrotechnical Commission (IEC)

• IEC 62418:2010 Semiconductor devices - Metallization stress void test
• IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
• IEC 60747-14-2:2000 Semiconductor devices - Part 14-2: Semiconductor sensors; Hall elements
• IEC 60747-14-4:2011 Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers
• IEC 60747-14-1:2000 Semiconductor devices - Part 14-1: Semiconductor sensors; General and classification
• IEC 60747-15:2003 Discrete semiconductor devices - Part 15: Isolated power semiconductor devices

ABS - American Bureau of Shipping

• ABS 249-2017 GUIDANCE NOTES ON AIR GAP ANALYSIS FOR SEMI-SUBMERSIBLES

CZ-CSN

• CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices
• CSN 35 8701 Z1-1997 Semiconductor naming

GSO

• GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
• GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
• GSO IEC 60747-14-2:2014 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements
• BH GSO IEC 60747-14-2:2016 Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

Standard Association of Australia （SAA）

• AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors

German Institute for Standardization

• DIN EN 62418:2010 Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
• DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

• IEEE N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
• IEEE 256-1963 SEMICONDUCTOR DIODES

SCC

• BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
• BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors
• IEC 60146:1973 Semiconductor convertors
• DIN IEC 60747-14-5 E:2008 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
• 12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
• CEI EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication Part 1: General requirements

JP-JEITA

• JEITA ED7500A-2-2006 Standard for the dimensions of semiconductor devices (Discrete semiconductor devices)

NEMA - National Electrical Manufacturers Association

• NEMA CB-4:1989 Semiconductor Graphite

National Fire Protection Association (NFPA)

• NFPA FPH SECTION 6-30-2003 Semiconductor Manufacturing

YU-JUS

• JUS N.R1.322-1979 Terms and definitions for semiconductor ?evices. Thyristors

American National Standards Institute （ANSI)

• ANSI N42.31-2003 Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

European Committee for Electrotechnical Standardization（CENELEC）

• EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
• EN 62779-1:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements

Korean Agency for Technology and Standards (KATS)

• KS C 2607-2002 TESTING METHODS OF SEMICONDUCTOR

Others: indirect bandgap semiconductor,gap semiconductor,Semiconductor gap measurement,semiconductor gap,gap,semiconductor bandgap,semiconductor energy gap,UV semiconductor gap,Gap,semiconductor bandgap,semiconductor bandgap,UV gap semiconductor,UV semiconductor bandgap,bandgap semiconductor,light gap,semiconductor energy gap,Band gaps of various semiconductors,indirect bandgap semiconductor bandgap,Various semiconductor band gaps