Ray Stress Analyzer

Ray Stress Analyzer, Total:174 items.

The international standard classification for "Ray Stress Analyzer" includes: Non-destructive testing , Chemical analysis of metals , Other standards related to optics and optical measurements , Radiation protection , IT applications in science , Other standards related to analytical chemistry , Chemical analysis , Nuclear energy engineering , Cement. Gypsum. Lime. Mortar , Electricity. Magnetism. Electrical and magnetic measurements , Occupational safety. Industrial hygiene , Non-metalliferous minerals , Laboratory medicine .

The Chinese standard classification for "Ray Stress Analyzer" includes: X ray, magnetic powder, fluorescent light and other defectoscope , Optical instrument in general , Electron optics and other physical optics instrument , Radiological sanitation protection , Metal physical property test method , Computer application , Basic standards and general methods , Basic standards and general methods , Radioactive isotope application instrument , Cement , Optical Measurement , Ionizating Radiation Measurement , Radio Measurement , Medical laboratory equipment .

Professional Standard - Machinery

JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
JB/T 9394-1999 Specifications for the X-ray stressometers
JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
JB/T 13874-2020 Online micro-dissolved hydrogen analyzer
JB/T 9394-2011 Non-destructive testing instruments — Specifications for the X-ray stressometers
JB/T 11144-2011 X-ray diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 35734-2017 Portable tube-excited X-ray fluorescence analysis equipment―Classification, safety requirements and test
GB/T 7704-1987 Residual stress measurement by X-Ray
GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

Group Standards of the People's Republic of China

T/ACEF 153-2024 Technical guidelines for radiation protection of X-ray stressometers

Professional Standard - Building Materials

JC/T 1085-2008 X-ray fluorescence analyzer for cement

Professional Standard - Nuclear Industry

EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer

National Metrological Technical Specifications of the People's Republic of China

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF 1079-2002 Calibration Specification of Cathode Ray Tubes(CRT) Color Analyzers
JJF 2218-2025 Calibration Specification for Urodynamics Analyzers
JJF 1710-2018 Calibration Specification for Frequency Response Analyzers
JJF 1127-2004 Calibration Specification for RF impedance/Meterial Analyzers
JJF(机械)1083-2023 Calibration Specifications for X-ray Residual Stress Testers

Occupational Health Standard of the People's Republic of China

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

Professional Standard - Ferrous Metallurgy

YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer

Professional Standard - Energy and Power Planning

DL/T 1151.22-2012 Analytical Methods of Scale and Corrosion Products in Power Plants - Part 22: Standard Test Methods of X-ray Fluorescence Spectrometry and X-ray Diffraction

Professional Standard - Petroleum

SY/T 6071-1994 Radio Frequency Analysers for Water-cut of Crude Oil

Professional Standard - Customs

HS/T 12-2006 Quantitative Analysis of Talc, Chlorite, Magnesite Mixed Phase - Method of X-ray Diffractometer

Taiwan Provincial Standard of the People's Republic of China

CNS 12510-1989 Non-dispersed Infrared Gas Analyzer

Professional Standard - Medicine

YY/T 1173-2010 Polymerase chain reaction analyzer

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 09002-1987 Trial Verification Regulations for WIL TRON6409 RF Analyzer
JJG(电子) 09006-1989 Verification Regulations for WILTRON640 RF Analyzer

Professional Standard - Education

JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer

Hunan Provincial Standard of the People's Republic of China

DB43/T 802-2013 Nickel water quality online automatic analyzer
DB43/T 743-2012 Cobalt water quality online automatic analyzer
DB43/T 744-2012 Manganese water quality online automatic analyzer

Professional Standard - Water Conservancy

SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement

Professional Standard - Electron

SJ 20494-1995 General specification for RF network analyzer(system)
SJ 20250-1993 Verification reguation of model HP8590A RF spectrum analyzers
SJ 20495-1995 Test methods for RF network analyzer(system)

Association Francaise de Normalisation

NF EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
NF A09-285:1999 Non destructive testing - Test methods for residual stress analysis by X-ray diffraction
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.

Ente Nazionale Italiano di Unificazione

EC 1-2009 UNI EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
UNI EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
UNI EN ISO 20785-2:2017 Dosimetry for exposures to cosmic radiation in civilian aircraft - Part 2: Characterization of instrument response

German Institute for Standardization

DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN IEC 62495:2011-12 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN 51418-1:1996-09 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
DIN 51418-1:2025-05 X-ray spectrometry – X-ray emission and X-ray fluorescence analysis (XRF) – Part 1: General vocabulary
DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
DIN 51418-1 E:2007-07 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN IEC 62495 E:2010-06 Draft Document - Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 45/702/CDV:2010)
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN IEC 62495 E:2010 Draft Document - Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 45/702/CDV:2010)
DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN 51418-2:1996-09 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results

Danish Standards Foundation

DANSK DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DANSK DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

Standards Norway

NS-EN 15305:2008 Non-destructive Testing — Test Method for Residual Stress analysis by X-ray Diffraction

Spanish Association for Standardization (UNE)

AENOR UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

British Standards Institution (BSI)

BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
05/30137047 DC EN 15305. Non-destructive testing. Test method for residual stress analysis by X-ray diffraction
BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
BS ISO 20289:2025 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS 5650:1978 Specification for apparatus for gamma radiography
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale

American National Standards Institute （ANSI)

ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ANSI/AWWA C670-2009 Online Chlorine Analyzer Operation & Maintenance
ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

European Committee for Standardization (CEN)

EN 15305:2008(2009) Non-destructive testing X-ray diffraction analysis Residual stress test method
EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

Lithuanian Standards Office

LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

GCC Standardization Organization

GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering

Swedish Institute for Standards

SS-EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction

Japanese Industrial Standards Committee (JISC)

JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS K 0151:1983 Non-dispersive infrared gas analyzer
JSA JIS K 0131 General rules for X-ray diffractometric analysis
JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water

American Society for Testing and Materials (ASTM)

ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM B975-18e1 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM B975-18 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM B975-15 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM B975-22 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM RR-B08-1007 2015 B0975-Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposist Stress Analyzer Method)

International Electrotechnical Commission (IEC)

IEC 61335:1997 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
IEC 61452:1995 Nuclear instrumentation - Measurement of gamma-ray emission rates of radionuclides - Calibration and use of germanium spectrometers
IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube

Korean Agency for Technology and Standards (KATS)

KS D ISO 14706-2003(2018) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
KS D ISO 14706-2003(2023) Surface chemical analysis - Measurement of surface element impurities on silicon wafers by total reflection X-ray fluorescence spectrometer
KS M 0043-2009 General rules for X-ray diffractometric analysis
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS B 6728-1995 Stress and fatigue analyses for pressure vessels
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D ISO 15472-2025 Surface chemical analysis ― X-ray photoelectron spectrometers — Calibration of energy scales
KS M 0043-2019 General rules for X-ray diffractometric analysis

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
OS GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
BH GSO IEC 61335:2016 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Portuguese Institute of Quality

E E 14-1971 X-ray diffraction analysis

Bureau of Indian Standards

IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
IS 17182-2020 X-ray Diffraction Based Residual Stress Measurements

Society of Automotive Engineers (SAE)

SAE J784A_197108 Residual Stress Measurement by X-Ray Diffraction
SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction

Association for Electrical, Electronic & Information Technologies (VDE)

VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)

International Organization for Standardization (ISO)

ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
ISO 20289:2025 Surface chemical analysis — Total reflection X-ray fluorescence analysis of water
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Indonesia Standards

SNI IEC 62495:2011 Nuclear instrumentation – Portable X-ray fluorescence analysis equipment using miniature X-ray tubes (IEC 62495:2011, IDT)

American Petroleum Institute (API)

API REPORT 85-16-1986 Stress Analysis of API Type 16B and 16BX Hubs

Engineering Equipment and Materials Users Association （EEMUA)

PUB NO 209-2015 Guide to the development and implementation of on-line analyser applications (Edition 1)
EEMUA PUB NO 209-2015 Guide to the development and implementation of on-line analyser applications (Edition 1)

National Aeronautics and Space Administration (NASA)

NASA NACA-TN-3288-1954 On the analysis of linear and nonlinear dynamical systems from transient-response data